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Topic: Electron Guns
Results
2011 / IEEE
By: Nusinovich, G.S.; Petillo, J.J.; Kesar, A.S.; Granatstein, V.L.; Herrmannsfeldt, W.B.;
By: Nusinovich, G.S.; Petillo, J.J.; Kesar, A.S.; Granatstein, V.L.; Herrmannsfeldt, W.B.;
2012 / IEEE
By: Fengping Li; Pagonakis, I.G.; Darbos, C.; Henderson, M.; Kem, S.; Hogge, J.-P.; Alberti, S.; Piosczyk, B.; Illy, S.;
By: Fengping Li; Pagonakis, I.G.; Darbos, C.; Henderson, M.; Kem, S.; Hogge, J.-P.; Alberti, S.; Piosczyk, B.; Illy, S.;
2012 / IEEE
By: Bing Han; Shichang Zhang; Pu-Kun Liu; Shou-Xi Xu; Yinong Su; Qianzhong Xue; Wei Gu; Zhi-Hui Geng;
By: Bing Han; Shichang Zhang; Pu-Kun Liu; Shou-Xi Xu; Yinong Su; Qianzhong Xue; Wei Gu; Zhi-Hui Geng;
2012 / IEEE
By: Gamzina, D.; Jinfeng Zhao; Risbud, S.; Luhmann, N.C.; Na Li; Banducci, M.; Barnett, L.; Spear, A.G.; Ji Li;
By: Gamzina, D.; Jinfeng Zhao; Risbud, S.; Luhmann, N.C.; Na Li; Banducci, M.; Barnett, L.; Spear, A.G.; Ji Li;
2012 / IEEE
By: Yuan, C.P.; Liu, P.K.; Chang, T.H.; Du, C.H.; Yu, S.J.; Kalynov, Y.K.; Glyavin, M.Y.; Bratman, V.L.; Liu, G.F.;
By: Yuan, C.P.; Liu, P.K.; Chang, T.H.; Du, C.H.; Yu, S.J.; Kalynov, Y.K.; Glyavin, M.Y.; Bratman, V.L.; Liu, G.F.;
2012 / IEEE
By: Sarrail, D.; Sarrailh, P.; Inguimbert, V.; Siguier, J.-M.; Murat, G.; Balcon, N.; Payan, D.; Mateo-Velez, J.;
By: Sarrail, D.; Sarrailh, P.; Inguimbert, V.; Siguier, J.-M.; Murat, G.; Balcon, N.; Payan, D.; Mateo-Velez, J.;
1992 / IEEE / 000-0-0000-0000-0
By: Jensen, D.; Koontz, R.; Pearson, C.; Fant, K.; Vlieks, A.; Wright, E.L.; Miram, G.;
By: Jensen, D.; Koontz, R.; Pearson, C.; Fant, K.; Vlieks, A.; Wright, E.L.; Miram, G.;
1992 / IEEE / 000-0-0000-0000-0
By: Khryapov, P.A.; Deichuli, M.P.; Slepkov, A.I.; Chernyavsky, I.A.; Bugaev, S.P.; Bastrikov, A.N.; Koshelev, V.I.; Pikunov, V.M.; Kanavets, V.I.; Zakharov, A.N.; Sukhushin, K.N.; Sochugov, N.S.; Lopatin, V.V.;
By: Khryapov, P.A.; Deichuli, M.P.; Slepkov, A.I.; Chernyavsky, I.A.; Bugaev, S.P.; Bastrikov, A.N.; Koshelev, V.I.; Pikunov, V.M.; Kanavets, V.I.; Zakharov, A.N.; Sukhushin, K.N.; Sochugov, N.S.; Lopatin, V.V.;
1992 / IEEE / 000-0-0000-0000-0
By: Zheng Baohong; Wang Zhigin; Xia Nenggiao; Tang Hongfang; Li Tixing; Zhang Qi;
By: Zheng Baohong; Wang Zhigin; Xia Nenggiao; Tang Hongfang; Li Tixing; Zhang Qi;
2004 / IEEE / 978-5-87911-088-3
By: Lazutkin, M.N.; Karlik, K.V.; Popov, S.A.; Proskurovsky, D.I.; Ozur, G.E.;
By: Lazutkin, M.N.; Karlik, K.V.; Popov, S.A.; Proskurovsky, D.I.; Ozur, G.E.;
2004 / IEEE / 978-5-87911-088-3
By: Zaitsev, N.I.; Manuilov, V.N.; Lygin, V.K.; Kulagin, I.S.; Ilyakov, E.V.;
By: Zaitsev, N.I.; Manuilov, V.N.; Lygin, V.K.; Kulagin, I.S.; Ilyakov, E.V.;
2011 / IEEE / 978-3-00-035081-8
By: Mimura, H.; Koike, A.; Neo, Y.; Fujino, T.; Yoshida, T.; Murata, H.; Nagao, M.; Nishi, T.;
By: Mimura, H.; Koike, A.; Neo, Y.; Fujino, T.; Yoshida, T.; Murata, H.; Nagao, M.; Nishi, T.;
2011 / IEEE / 978-1-61284-329-2
By: Gall, B.B.; Kwon, J.W.; Kim, B.H.; Baxter, E.A.; Kovaleski, S.D.; VanGordon, J.A.;
By: Gall, B.B.; Kwon, J.W.; Kim, B.H.; Baxter, E.A.; Kovaleski, S.D.; VanGordon, J.A.;
2011 / IEEE / 978-1-61284-329-2
By: Read, M.; Ives, R.L.; Eisen, E.; Kimura, T.; Marsden, D.; Bui, T.; Jackson, R.H.; Collins, G.;
By: Read, M.; Ives, R.L.; Eisen, E.; Kimura, T.; Marsden, D.; Bui, T.; Jackson, R.H.; Collins, G.;
2011 / IEEE / 978-1-61284-329-2
By: Wright, E.; Burke, A.; Petillo, J.; Ovtchinnikov, S.; Panagos, D.; Kostas, C.; Khanh Nguyen; Levush, B.; Jensen, K.; DeFord, J.; Held, B.; Nelson, E.; Antonsen, T.;
By: Wright, E.; Burke, A.; Petillo, J.; Ovtchinnikov, S.; Panagos, D.; Kostas, C.; Khanh Nguyen; Levush, B.; Jensen, K.; DeFord, J.; Held, B.; Nelson, E.; Antonsen, T.;
2011 / IEEE / 978-1-61284-329-2
By: Srivastava, V.; Lamba, V.; Kumar, N.; Pal, U.N.; Verma, D.K.; Tyagi, M.S.; Meena, B.L.; Kumar, M.;
By: Srivastava, V.; Lamba, V.; Kumar, N.; Pal, U.N.; Verma, D.K.; Tyagi, M.S.; Meena, B.L.; Kumar, M.;
2011 / IEEE / 978-3-00-035081-8
By: Tsujino, S.; Braun, H.-H.; Ivkovic, S.; Gough, C.; Paraliev, M.; Kirk, E.;
By: Tsujino, S.; Braun, H.-H.; Ivkovic, S.; Gough, C.; Paraliev, M.; Kirk, E.;
2011 / IEEE / 978-1-4577-0509-0
By: Schlaich, A.; Samartsev, A.; Pagonakis, I.; Kern, S.; Thumm, M.; Jin, J.; Illy, S.; Piosczyk, B.; Rzesnicki, T.;
By: Schlaich, A.; Samartsev, A.; Pagonakis, I.; Kern, S.; Thumm, M.; Jin, J.; Illy, S.; Piosczyk, B.; Rzesnicki, T.;
2011 / IEEE / 978-1-4577-0509-0
By: Woo-sang Lee; Sirigiri, J.R.; Sung Gug Kim; Eunmi Choi; Joon-ho So;
By: Woo-sang Lee; Sirigiri, J.R.; Sung Gug Kim; Eunmi Choi; Joon-ho So;
2011 / IEEE / 978-1-4577-0509-0
By: Tatematsu, Y.; Ikeda, R.; Saito, T.; Ogawa, I.; Idehara, T.; Ozeki, T.; Mudiganti, J.C.; Yamaguchi, Y.;
By: Tatematsu, Y.; Ikeda, R.; Saito, T.; Ogawa, I.; Idehara, T.; Ozeki, T.; Mudiganti, J.C.; Yamaguchi, Y.;
2011 / IEEE / 978-1-4577-0509-0
By: Kajiwara, K.; Sakamoto, K.; Kobayashi, N.; Hayashi, K.; Takahashi, K.; Oda, Y.;
By: Kajiwara, K.; Sakamoto, K.; Kobayashi, N.; Hayashi, K.; Takahashi, K.; Oda, Y.;
2012 / IEEE / 978-1-4673-1783-2
By: Getty, S.A.; Southard, A.E.; Glavin, D.P.; Hidrobo, G.B.; Costen, N.P.;
By: Getty, S.A.; Southard, A.E.; Glavin, D.P.; Hidrobo, G.B.; Costen, N.P.;
2012 / IEEE / 978-1-4673-1538-8
By: Kant, D.; Kaushik, M.; Lamba, O.S.; Joshi, L.M.; Baloda, S.; Pradeep, P.; Bansal, P.; Richa, R.;
By: Kant, D.; Kaushik, M.; Lamba, O.S.; Joshi, L.M.; Baloda, S.; Pradeep, P.; Bansal, P.; Richa, R.;
2012 / IEEE / 978-1-4673-1895-2
By: Zhanliang Wang; Jinjun Feng; Jin Xu; Hairong Yin; Yanyu Wei; Yubin Gong; Zhigang Lu; Huarong Gong; Zhaoyun Duan; Lingna Yue;
By: Zhanliang Wang; Jinjun Feng; Jin Xu; Hairong Yin; Yanyu Wei; Yubin Gong; Zhigang Lu; Huarong Gong; Zhaoyun Duan; Lingna Yue;
2012 / IEEE / 978-1-4673-0189-3
By: Marsden, David; Ives, Lawrence; Avramides, Kostas; Thumm, Manfred; Weggen, Joerg; Kern, Stefan; Piosczyk, Bernhard; Pagonakis, Ioannis; Illy, Stefan; Malygin, Anton;
By: Marsden, David; Ives, Lawrence; Avramides, Kostas; Thumm, Manfred; Weggen, Joerg; Kern, Stefan; Piosczyk, Bernhard; Pagonakis, Ioannis; Illy, Stefan; Malygin, Anton;
2007 / American Institute of Physics
By: Tsuyoshi Ishikawa; Tomohiro Urata; Boklae Cho; Eiji Rokuta; Chuhei Oshima; Yoshinori Terui; Hidekazu Saito; Akira Yonezawa; Tien T. Tsong;
By: Tsuyoshi Ishikawa; Tomohiro Urata; Boklae Cho; Eiji Rokuta; Chuhei Oshima; Yoshinori Terui; Hidekazu Saito; Akira Yonezawa; Tien T. Tsong;
2008 / American Institute of Physics
By: Chih-Tsung Tsai; Ting-Chang Chang; Po-Tsun Liu; Yi-Li Cheng; Fon-Shan Huang;
By: Chih-Tsung Tsai; Ting-Chang Chang; Po-Tsun Liu; Yi-Li Cheng; Fon-Shan Huang;
2010 / American Institute of Physics
By: C. R. Donaldson; W. He; A. W. Cross; F. Li; A. D. R. Phelps; L. Zhang; K. Ronald; C. W. Robertson; C. G. Whyte; A. R. Young;
By: C. R. Donaldson; W. He; A. W. Cross; F. Li; A. D. R. Phelps; L. Zhang; K. Ronald; C. W. Robertson; C. G. Whyte; A. R. Young;
2007 / American Institute of Physics
By: O. Doyen; J. M. De Conto; J. P. Garnier; M. Lefort; N. Richard;
By: O. Doyen; J. M. De Conto; J. P. Garnier; M. Lefort; N. Richard;
2008 / American Institute of Physics
By: G. S. Nusinovich; A. N. Vlasov; T. M. Antonsen; J. Lohr; B. G. Danly; J.-P. Hogge;
By: G. S. Nusinovich; A. N. Vlasov; T. M. Antonsen; J. Lohr; B. G. Danly; J.-P. Hogge;
2010 / American Institute of Physics
By: Jian-Xun Wang; Larry R. Barnett; Neville C. Luhmann; Young-Min Shin; Stanley Humphries;
By: Jian-Xun Wang; Larry R. Barnett; Neville C. Luhmann; Young-Min Shin; Stanley Humphries;
2007 / American Institute of Physics
By: A. Janzen; B. Krenzer; O. Heinz; P. Zhou; D. Thien; A. Hanisch; M. Horn von Hoegen; F.-J. Meyer zu Heringdorf; D. von der Linde;
By: A. Janzen; B. Krenzer; O. Heinz; P. Zhou; D. Thien; A. Hanisch; M. Horn von Hoegen; F.-J. Meyer zu Heringdorf; D. von der Linde;
2013 / American Institute of Physics
By: Jeremy M. D. Kowalczyk; Michael R. Hadmack; John M. J. Madey;
By: Jeremy M. D. Kowalczyk; Michael R. Hadmack; John M. J. Madey;
1988 / IEEE
By: Calame, J.; Lawson, W.; Granatstein, V.L.; Reiser, M.; Striffler, C.D.; Skopec, M.; Read, M.E.; Renbaum, J.; Naimann, M.; Hogan, B.; Welsh, D.;
By: Calame, J.; Lawson, W.; Granatstein, V.L.; Reiser, M.; Striffler, C.D.; Skopec, M.; Read, M.E.; Renbaum, J.; Naimann, M.; Hogan, B.; Welsh, D.;
1989 / IEEE
By: Bialowons, W.; Weiland, T.; Wanzenberg, R.; Scutt, P.; Lewin, H.C.; Decker, F.J.; Bremer, H.D.; Bieler, M.;
By: Bialowons, W.; Weiland, T.; Wanzenberg, R.; Scutt, P.; Lewin, H.C.; Decker, F.J.; Bremer, H.D.; Bieler, M.;
1990 / IEEE
By: Boggasch, E.; Wang, J.G.; Wang, D.X.; Shea, T.; Reiser, M.; Kehne, D.; Haldemann, P.;
By: Boggasch, E.; Wang, J.G.; Wang, D.X.; Shea, T.; Reiser, M.; Kehne, D.; Haldemann, P.;
1989 / IEEE
By: Kurnit, N.; McDonald, K.T.; Gallardo, J.; Fischer, J.; Kirk, H.G.; Fernow, R.C.; Chou, T.S.; Biglio, I.; Ben-Zvi, I.; Batchelor, K.; Woodle, M.; van Steenbergen, A.; Ulc, S.; Srinivasan-Rao, T.; Sheehan, J.; Pellegrini, C.; Parsa, Z.; Palmer, R.B.;
By: Kurnit, N.; McDonald, K.T.; Gallardo, J.; Fischer, J.; Kirk, H.G.; Fernow, R.C.; Chou, T.S.; Biglio, I.; Ben-Zvi, I.; Batchelor, K.; Woodle, M.; van Steenbergen, A.; Ulc, S.; Srinivasan-Rao, T.; Sheehan, J.; Pellegrini, C.; Parsa, Z.; Palmer, R.B.;
1989 / IEEE / 0-7803-0817-4
By: Liu, D.; Chin, K.; Gmitter, T.; Ravi, T.S.; Orvis, W.J.; Trujillo, J.; Marcus, R.B.; Hunt, C.E.; Ciarlo, D.R.;
By: Liu, D.; Chin, K.; Gmitter, T.; Ravi, T.S.; Orvis, W.J.; Trujillo, J.; Marcus, R.B.; Hunt, C.E.; Ciarlo, D.R.;