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Topic: Electron Energy
Results
2012 / IEEE
By: Jeong-Ho Kim; Sumida, T.; Toyoda, K.; Masui, H.; Hatta, S.; Mengu Cho; Bao Hoang; Wong, F.K.;
By: Jeong-Ho Kim; Sumida, T.; Toyoda, K.; Masui, H.; Hatta, S.; Mengu Cho; Bao Hoang; Wong, F.K.;
2009 / IEEE / 978-1-4577-0493-2
By: Messenger, S.R.; Warner, J.H.; Brenner, M.R.; Ringel, S.A.; Walters, R.J.;
By: Messenger, S.R.; Warner, J.H.; Brenner, M.R.; Ringel, S.A.; Walters, R.J.;
2011 / IEEE / 978-1-61284-329-2
By: Sharypov, K.A.; Yalandin, M.I.; Ulmaskulov, M.R.; Reutova, A.G.; Shunailov, S.A.; Zotova, I.V.; Sergeev, A.S.; Ginzburg, N.S.;
By: Sharypov, K.A.; Yalandin, M.I.; Ulmaskulov, M.R.; Reutova, A.G.; Shunailov, S.A.; Zotova, I.V.; Sergeev, A.S.; Ginzburg, N.S.;
2011 / IEEE / 978-1-4577-0586-1
By: Di Capua, F.; Menichelli, M.; Alpat, B.; Pilicer, E.; Servoli, L.; Caraffini, D.; Italiani, M.; Tucceri, P.;
By: Di Capua, F.; Menichelli, M.; Alpat, B.; Pilicer, E.; Servoli, L.; Caraffini, D.; Italiani, M.; Tucceri, P.;
1992 / IEEE
By: Saveljev, Y.M.; Petukhov, A.A.; Pechersky, O.P.; Komarov, O.L.; Kovalev, V.G.; Smirnov, L.V.; Ershov, V.V.; Beruchev, N.G.; Engelko, V.I.; Kachenko, K.I.T.;
By: Saveljev, Y.M.; Petukhov, A.A.; Pechersky, O.P.; Komarov, O.L.; Kovalev, V.G.; Smirnov, L.V.; Ershov, V.V.; Beruchev, N.G.; Engelko, V.I.; Kachenko, K.I.T.;
Theoretical structural optimization of a GaAs pn or pin structured avalanche electron emitting diode
1989 / IEEE / 0-7803-0817-4By: van Zutphen, T.;
1989 / IEEE
By: Ensor, D.S.; Lawless, P.A.; Ramanathan, K.; Yamamoto, T.; Plaks, N.; Hammel, L.; Vogel, C.A.; Ramsey, G.H.; Newsome, J.R.;
By: Ensor, D.S.; Lawless, P.A.; Ramanathan, K.; Yamamoto, T.; Plaks, N.; Hammel, L.; Vogel, C.A.; Ramsey, G.H.; Newsome, J.R.;
1991 / IEEE / 0-7803-0513-2
By: Hirschberg, M.; Wick, K.; Bruckmann, H.; Brandenburg, U.; Beckmann, R.;
By: Hirschberg, M.; Wick, K.; Bruckmann, H.; Brandenburg, U.; Beckmann, R.;
1994 / IEEE / 0-7803-2544-3
By: Marroncle, J.; Morgenstern, J.; Lugol, J.C.; Lombard, R.; Le Meur, J.; Grenier, P.; Borel, H.; Gearhart, R.; Savinel, G.; Roblin, Y.; Fonvieille, H.; Crouau, M.; Comptour, C.; Breton, V.; Terrien, Y.; Staley, F.; Paul, B.; Mouly, J.P.;
By: Marroncle, J.; Morgenstern, J.; Lugol, J.C.; Lombard, R.; Le Meur, J.; Grenier, P.; Borel, H.; Gearhart, R.; Savinel, G.; Roblin, Y.; Fonvieille, H.; Crouau, M.; Comptour, C.; Breton, V.; Terrien, Y.; Staley, F.; Paul, B.; Mouly, J.P.;
1995 / IEEE / 0-7803-2934-1
By: Gwo-Huei Luo; Liu, Y.C.; Tseng, P.K.; Wang, C.; Lau, W.C.; Kuo, C.C.; Hsu, K.T.; Cheng, Y.; Chang, L.H.;
By: Gwo-Huei Luo; Liu, Y.C.; Tseng, P.K.; Wang, C.; Lau, W.C.; Kuo, C.C.; Hsu, K.T.; Cheng, Y.; Chang, L.H.;
1994 / IEEE / 0-7803-1460-3
By: Burke, E.A.; Xapsos, M.A.; Walters, R.J.; Summers, G.P.; Statler, R.L.; Shapiro, P.; Messenger, S.R.;
By: Burke, E.A.; Xapsos, M.A.; Walters, R.J.; Summers, G.P.; Statler, R.L.; Shapiro, P.; Messenger, S.R.;
1995 / IEEE / 0-7803-2791-8
By: Maslennikov, D.D.; Belenki, G.S.; Kovalev, Yu.I.; Dolgachev, G.I.; Nitishinski, M.S.; Barinov, N.U.; Zakatov, L.P.; Ushakov, A.G.;
By: Maslennikov, D.D.; Belenki, G.S.; Kovalev, Yu.I.; Dolgachev, G.I.; Nitishinski, M.S.; Barinov, N.U.; Zakatov, L.P.; Ushakov, A.G.;
1997 / IEEE / 0-7803-3990-8
By: Maron, Y.; Weingarten, A.; Tsigutkin, K.; Shpitalnik, R.; Arad, R.; Krasik, Ya.E.; Gomberoff, K.; Fruchtman, A.;
By: Maron, Y.; Weingarten, A.; Tsigutkin, K.; Shpitalnik, R.; Arad, R.; Krasik, Ya.E.; Gomberoff, K.; Fruchtman, A.;
1998 / IEEE / 0-7803-4792-7
By: Myers, M.C.; Commisso, R.J.; Boller, J.R.; Black, D.C.; Rose, D.V.; Young, F.C.; Weidenheimer, D.M.; Weber, B.V.; Stephanakis, S.J.;
By: Myers, M.C.; Commisso, R.J.; Boller, J.R.; Black, D.C.; Rose, D.V.; Young, F.C.; Weidenheimer, D.M.; Weber, B.V.; Stephanakis, S.J.;
1999 / IEEE / 0-7803-5224-6
By: Armstrong, C.M.; Gallagher, D.A.; McDermott, D.B.; Stutzman, R.C.; Luhmann, N.C., Jr.; Spencer, T.A.;
By: Armstrong, C.M.; Gallagher, D.A.; McDermott, D.B.; Stutzman, R.C.; Luhmann, N.C., Jr.; Spencer, T.A.;
2000 / IEEE / 0-7803-5982-8
By: McDermott, D.B.; Stutzman, R.C.; Luhmann, N.C., Jr.; Spencer, T.A.; Gallagher, D.A.; Hirata, Y.;
By: McDermott, D.B.; Stutzman, R.C.; Luhmann, N.C., Jr.; Spencer, T.A.; Gallagher, D.A.; Hirata, Y.;
2000 / IEEE / 0-7803-5791-4
By: Koval' chuk, B.M.; Gorbachev, S.I.; Bazhenov, G.P.; Abdullin, E.N.; Shchanin, P.M.; Loginov, S.V.;
By: Koval' chuk, B.M.; Gorbachev, S.I.; Bazhenov, G.P.; Abdullin, E.N.; Shchanin, P.M.; Loginov, S.V.;
2001 / IEEE / 0-7803-7141-0
By: Dunaevsky, A.; Krasik, Y.; Ushakov, A.; Zabaidullin, O.; Felsteiner, J.; Kingsep, A.; Dolgachev, G.; Dolinskii, Y.;
By: Dunaevsky, A.; Krasik, Y.; Ushakov, A.; Zabaidullin, O.; Felsteiner, J.; Kingsep, A.; Dolgachev, G.; Dolinskii, Y.;
2001 / IEEE / 0-7803-7141-0
By: Hinshelwood, D.D.; Cooperstein, G.; Weber, B.V.; Young, F.C.; Mosher, D.; Swanekamp, S.B.; Stephanakis, S.J.; Schumer, J.W.;
By: Hinshelwood, D.D.; Cooperstein, G.; Weber, B.V.; Young, F.C.; Mosher, D.; Swanekamp, S.B.; Stephanakis, S.J.; Schumer, J.W.;
High-frequency electron beam modulation, transportation and its interaction with slow-wave structure
2001 / IEEE / 0-7803-7141-0By: Dunaevsky, A.; Krasik, Y.E.; Chirko, K.; Felsteiner, J.;
2001 / IEEE / 0-7803-7191-7
By: Tatanov, V.I.; Stepin, D.L.; Savchenko, A.N.; Reprintsev, L.V.; Shendrik, V.A.; Dovbnya, A.N.; Gurin, V.A.; Boriskin, V.N.; Popenko, V.A.;
By: Tatanov, V.I.; Stepin, D.L.; Savchenko, A.N.; Reprintsev, L.V.; Shendrik, V.A.; Dovbnya, A.N.; Gurin, V.A.; Boriskin, V.N.; Popenko, V.A.;
2001 / IEEE / 0-7803-7191-7
By: Jia Qi-ka; Duohui, H.E.; Xu Hong-liang; Diao Chao-zheng; Wang Yong; Liu Jin-ying; Li Ge;
By: Jia Qi-ka; Duohui, H.E.; Xu Hong-liang; Diao Chao-zheng; Wang Yong; Liu Jin-ying; Li Ge;
2001 / IEEE / 0-7803-7191-7
By: Razuvakin, V.N.; Mazhulin, A.V.; Ivanov, I.N.; Dolbilova, G.I.; Dolbilov, G.V.;
By: Razuvakin, V.N.; Mazhulin, A.V.; Ivanov, I.N.; Dolbilova, G.I.; Dolbilov, G.V.;
2002 / IEEE / 0-7803-7540-8
By: Chirko, K.; Krasik, Ya.E.; Felsteiner, J.; Sayapin, A.; Krokhmal, A.; Gleizer, J.Z.; Dunaevsky, A.;
By: Chirko, K.; Krasik, Ya.E.; Felsteiner, J.; Sayapin, A.; Krokhmal, A.; Gleizer, J.Z.; Dunaevsky, A.;
2003 / IEEE / 0-7803-7738-9
By: Dovbnya, A.N.; Kushnir, V.A.; Demidov, N.V.; Beloglasov, V.I.; Boriskin, V.N.; Biller, E.Z.; Ayzatsky, M.I.; Uvarov, V.L.; Tur, Yu.D.; Tarasov, G.E.; Stepin, D.L.; Shendrik, V.A.; Repikhov, G.D.; Reprintzev, L.V.; Pugachev, G.D.; Popenko, V.A.; Nikitina, T.F.; Myakushko, L.K.; Mitrochenko, V.V.;
By: Dovbnya, A.N.; Kushnir, V.A.; Demidov, N.V.; Beloglasov, V.I.; Boriskin, V.N.; Biller, E.Z.; Ayzatsky, M.I.; Uvarov, V.L.; Tur, Yu.D.; Tarasov, G.E.; Stepin, D.L.; Shendrik, V.A.; Repikhov, G.D.; Reprintzev, L.V.; Pugachev, G.D.; Popenko, V.A.; Nikitina, T.F.; Myakushko, L.K.; Mitrochenko, V.V.;
2004 / IEEE / 0-7803-8261-7
By: McGrane, P.; Ronald, K.; Phelps, A.D.R.; Cross, A.W.; Konoplev, I.V.;
By: McGrane, P.; Ronald, K.; Phelps, A.D.R.; Cross, A.W.; Konoplev, I.V.;
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