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Topic: Electromagnetic Waves
Results
2011 / IEEE
By: Kollberg, E.L.; Jian-Rong Gao; Khosropanah, P.; Wen Zhang; Yuan Ren; Yngvesson, K.S.;
By: Kollberg, E.L.; Jian-Rong Gao; Khosropanah, P.; Wen Zhang; Yuan Ren; Yngvesson, K.S.;
2011 / IEEE
By: Capineri, L.; Bechtel, T.D.; Zhuravlev, A.V.; Vasiliev, I.A.; Razevig, V.V.; Ivashov, S.I.;
By: Capineri, L.; Bechtel, T.D.; Zhuravlev, A.V.; Vasiliev, I.A.; Razevig, V.V.; Ivashov, S.I.;
2012 / IEEE
By: Basaev, A.S.; Komissarov, I.V.; Shulitski, B.G.; Prudnikava, A.L.; Tay, B.K.; Labunov, V.A.; Bogush, V.A.; Shakersadeh, M.;
By: Basaev, A.S.; Komissarov, I.V.; Shulitski, B.G.; Prudnikava, A.L.; Tay, B.K.; Labunov, V.A.; Bogush, V.A.; Shakersadeh, M.;
2012 / IEEE
By: Leveque, P.; Arnaud-Cormos, D.; Gaborit, G.; Duvillaret, L.; Jarrige, P.; O'Connor, R.P.; Kohler, S.; Ticaud, N.;
By: Leveque, P.; Arnaud-Cormos, D.; Gaborit, G.; Duvillaret, L.; Jarrige, P.; O'Connor, R.P.; Kohler, S.; Ticaud, N.;
2012 / IEEE
By: Changzhi Li; Zhiyu Wang; Tao Jiang; Lixin Ran; Dong Li; Salamin, Y.; Jiangtao Huangfu; Bin Zhang; Jingnan Pan;
By: Changzhi Li; Zhiyu Wang; Tao Jiang; Lixin Ran; Dong Li; Salamin, Y.; Jiangtao Huangfu; Bin Zhang; Jingnan Pan;
1992 / IEEE / 000-0-0000-0000-0
By: Shatkus, A.D.; Polovkov, A.I.; Kolosov, Y.A.; Ostrenskiy, Y.I.; Mitin, L.A.; Karbushev, N.I.; Sotnikov, G.V.; Balakirev, V.A.; Volokitenkova, I.L.;
By: Shatkus, A.D.; Polovkov, A.I.; Kolosov, Y.A.; Ostrenskiy, Y.I.; Mitin, L.A.; Karbushev, N.I.; Sotnikov, G.V.; Balakirev, V.A.; Volokitenkova, I.L.;
2004 / IEEE / 978-5-87911-088-3
By: Shpak, V.G.; Rostov, V.V.; Mesyats, G.A.; Korovin, S.D.; Yalandin, M.I.;
By: Shpak, V.G.; Rostov, V.V.; Mesyats, G.A.; Korovin, S.D.; Yalandin, M.I.;
2011 / IEEE / 978-1-4244-7355-7
By: Pecquois, R.; Vezinet, R.; Duband, J.-M.; Caramelle, L.; Rivaletto, M.; Martin, J.; Pignolet, P.; De Ferron, A.; Pecastaing, L.;
By: Pecquois, R.; Vezinet, R.; Duband, J.-M.; Caramelle, L.; Rivaletto, M.; Martin, J.; Pignolet, P.; De Ferron, A.; Pecastaing, L.;
2011 / IEEE / 978-1-58537-193-8
By: Ohtsu, T.; Fujikawa, H.; Takai, T.; Tanitsuji, K.; Okada, S.; Oka, R.; Imai, S.; Ito, S.;
By: Ohtsu, T.; Fujikawa, H.; Takai, T.; Tanitsuji, K.; Okada, S.; Oka, R.; Imai, S.; Ito, S.;
2011 / IEEE / 978-1-4577-0811-4
By: Ikematsu, T.; Sone, H.; Aoki, T.; Homma, N.; Mizuki, T.; Hayashi, Y.;
By: Ikematsu, T.; Sone, H.; Aoki, T.; Homma, N.; Mizuki, T.; Hayashi, Y.;
2011 / IEEE / 978-966-335-357-9
By: Leushin, V.Y.; Gudkov, A.G.; Silkin, A.T.; Porokhov, I.O.; Kolpakov, N.S.; Mikheev, V.A.;
By: Leushin, V.Y.; Gudkov, A.G.; Silkin, A.T.; Porokhov, I.O.; Kolpakov, N.S.; Mikheev, V.A.;
2011 / IEEE / 978-966-335-357-9
By: Zhurba, V.O.; Vorobiyov, G.S.; Sokolov, S.V.; Ruban, A.I.; Rybalko, A.A.;
By: Zhurba, V.O.; Vorobiyov, G.S.; Sokolov, S.V.; Ruban, A.I.; Rybalko, A.A.;
2011 / IEEE / 978-966-335-357-9
By: Vaganov, A.A.; Shevchenko, K.L.; Skripnik, Yu.A.; Aleksashin, A.B.;
By: Vaganov, A.A.; Shevchenko, K.L.; Skripnik, Yu.A.; Aleksashin, A.B.;