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Topic: Electromagnetic Wave Absorption
Results
2011 / IEEE
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
2012 / IEEE
By: Moglie, F.; Pastore, R.; Apollo, C.; Micheli, D.; Barbera, D.; Mariani Primiani, V.; Gradoni, G.; Marchetti, M.; Morles, R.B.;
By: Moglie, F.; Pastore, R.; Apollo, C.; Micheli, D.; Barbera, D.; Mariani Primiani, V.; Gradoni, G.; Marchetti, M.; Morles, R.B.;
2012 / IEEE
By: Nielsen, J.O.; Plets, D.; Vermeeren, G.; Tanghe, E.; Martens, L.; Joseph, W.; Andersen, J.B.; Bamba, A.;
By: Nielsen, J.O.; Plets, D.; Vermeeren, G.; Tanghe, E.; Martens, L.; Joseph, W.; Andersen, J.B.; Bamba, A.;
2012 / IEEE
By: Duvillaret, L.; Ticaud, N.; Jarrige, P.; Kohler, S.; Gaborit, G.; Leveque, P.; Arnaud-Cormos, D.; O'Connor, R.P.;
By: Duvillaret, L.; Ticaud, N.; Jarrige, P.; Kohler, S.; Gaborit, G.; Leveque, P.; Arnaud-Cormos, D.; O'Connor, R.P.;
2011 / IEEE / 978-1-4244-9563-4
By: Joseph, W.; Bamba, A.; Nielsen, J.O.; Andersen, J.B.; Martens, L.; Vermeeren, G.; Tanghe, E.; Plets, D.;
By: Joseph, W.; Bamba, A.; Nielsen, J.O.; Andersen, J.B.; Martens, L.; Vermeeren, G.; Tanghe, E.; Plets, D.;
2011 / IEEE / 978-1-4244-9563-4
By: Kaipa, C.S.R.; Yakovlev, A.B.; Padooru, Y.R.; Mesa, F.; Medina, F.;
By: Kaipa, C.S.R.; Yakovlev, A.B.; Padooru, Y.R.; Mesa, F.; Medina, F.;
2011 / IEEE / 978-1-4244-9793-5
By: Zhi-xiang Huang; Xin-gang Ren; Lei Wu; Hong-mei Du; Yi-cai Mei; Si-long Lu; Xian-liang Wu;
By: Zhi-xiang Huang; Xin-gang Ren; Lei Wu; Hong-mei Du; Yi-cai Mei; Si-long Lu; Xian-liang Wu;
2011 / IEEE / 978-1-61284-978-2
By: Takano, S.; Hashimoto, O.; Ozaki, T.; Sakata, T.; Moriuchi, K.; Yasuzumi, T.;
By: Takano, S.; Hashimoto, O.; Ozaki, T.; Sakata, T.; Moriuchi, K.; Yasuzumi, T.;
2011 / IEEE / 978-1-4244-6051-9
By: Nojima, M.; Tanaka, R.; Katsuda, K.; Yagitani, S.; Sugiura, H.; Yoshimura, Y.;
By: Nojima, M.; Tanaka, R.; Katsuda, K.; Yagitani, S.; Sugiura, H.; Yoshimura, Y.;
2011 / IEEE / 978-1-4244-6051-9
By: Ghanmi, A.; Wiart, J.; Picon, O.; Gati, A.; Conil, E.; Hadjem, A.; Pinto, Y.;
By: Ghanmi, A.; Wiart, J.; Picon, O.; Gati, A.; Conil, E.; Hadjem, A.; Pinto, Y.;
2011 / IEEE / 978-1-4577-0027-9
By: Bleda, A.L.; Gomez Skarmeta, A.; Maestre, R.; Jara, A.J.; Santa, G.;
By: Bleda, A.L.; Gomez Skarmeta, A.; Maestre, R.; Jara, A.J.; Santa, G.;
2011 / IEEE / 978-966-335-357-9
By: Zagorodniy, V.V.; Vovchenko, L.L.; Oliynyk, V.V.; Launets, V.L.; Matzui, L.Y.;
By: Zagorodniy, V.V.; Vovchenko, L.L.; Oliynyk, V.V.; Launets, V.L.; Matzui, L.Y.;
2011 / IEEE / 978-1-61284-978-2
By: Jaroszewicz, T.; Bleszynski, M.K.; Bleszynski, E.H.; Albanese, R.;
By: Jaroszewicz, T.; Bleszynski, M.K.; Bleszynski, E.H.; Albanese, R.;
2011 / IEEE / 978-1-4577-1497-9
By: Sian Meng Se; Husain, M.N.; Yaakob, N.M.; Ibrahim, I.M.; Shaaban, A.;
By: Sian Meng Se; Husain, M.N.; Yaakob, N.M.; Ibrahim, I.M.; Shaaban, A.;
Comparative analysis of the computed SAR and temperature rise to the em exposure child and adult man
2011 / IEEE / 978-966-02-5904-1By: Zaridze, R.; Prishvin, M.; Bibilashvili, L.;
2011 / IEEE / 978-1-4577-0978-4
By: Faruque, M.R.I.; Mohd Hanafi, N.H.; Abidin, H.Z.; Misran, N.; Islam, M.T.;
By: Faruque, M.R.I.; Mohd Hanafi, N.H.; Abidin, H.Z.; Misran, N.; Islam, M.T.;
2011 / IEEE / 978-1-4577-1631-7
By: Rahim, M.K.A.; Samsuri, N.A.; Anuar, M.Z.; Zubir, F.; Othman, N.;
By: Rahim, M.K.A.; Samsuri, N.A.; Anuar, M.Z.; Zubir, F.; Othman, N.;
2011 / IEEE / 978-1-4577-1631-7
By: Yahya, M.; Salleh, M.K.M.; Yaacob, N.; Mozi, A.M.; Muhamad, W.N.W.; Awang, Z.;
By: Yahya, M.; Salleh, M.K.M.; Yaacob, N.; Mozi, A.M.; Muhamad, W.N.W.; Awang, Z.;
2011 / IEEE / 978-1-4577-1631-7
By: Yaacob, N.; Mozi, A.M.; Muhamad, W.N.W.; Awang, Z.; Yahya, M.; Salleh, M.K.M.;
By: Yaacob, N.; Mozi, A.M.; Muhamad, W.N.W.; Awang, Z.; Yahya, M.; Salleh, M.K.M.;
2011 / IEEE / 978-1-4577-1664-5
By: Costa, L.C.; Monteiro, J.; Sousa, J.; Santos, T.; Valente, M.A.;
By: Costa, L.C.; Monteiro, J.; Sousa, J.; Santos, T.; Valente, M.A.;
2011 / IEEE / 978-0-9775657-8-8
By: Gredeskul, S.A.; Freilikher, V.D.; Botten, L.C.; Byrne, M.A.; Shadrivov, I.V.; Asatryan, A.A.; Kivshar, Y.A.; McPhedran, R.C.;
By: Gredeskul, S.A.; Freilikher, V.D.; Botten, L.C.; Byrne, M.A.; Shadrivov, I.V.; Asatryan, A.A.; Kivshar, Y.A.; McPhedran, R.C.;
2012 / IEEE / 978-1-4577-0920-3
By: Wisotzki, M.; Peter, M.; Kurner, T.; Priebe, S.; Jacob, M.; Felbecker, R.; Keusgen, W.; Raceala-Motoc, M.;
By: Wisotzki, M.; Peter, M.; Kurner, T.; Priebe, S.; Jacob, M.; Felbecker, R.; Keusgen, W.; Raceala-Motoc, M.;
2012 / IEEE / 978-1-4673-0961-5
By: Zanal, A.; Rosli, A.D.; Sharif, J.M.; Taib, M.N.; Idris, H.A.; Noordin, I.R.M.; Abdullah, A.T.;
By: Zanal, A.; Rosli, A.D.; Sharif, J.M.; Taib, M.N.; Idris, H.A.; Noordin, I.R.M.; Abdullah, A.T.;
2012 / IEEE / 978-1-4577-0920-3
By: Boulanger, X.; Jeannin, N.; Lacoste, F.; Feral, L.; Castanet, L.;
By: Boulanger, X.; Jeannin, N.; Lacoste, F.; Feral, L.; Castanet, L.;
2012 / IEEE / 978-1-4577-1557-0
By: Omar, A.; Malek, M.F.B.A.; Mat, M.H.; Ronald, S.H.; Zulkefli, M.S.;
By: Omar, A.; Malek, M.F.B.A.; Mat, M.H.; Ronald, S.H.; Zulkefli, M.S.;