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Topic: Electromagnetic Interference
Results
2011 / IEEE
By: Osaklang, S.; Siritaratiwat, A.; Kaewrawang, A.; Ungvichian, V.; Supnithi, P.; Sivaratana, R.; Kruesubthaworn, A.;
By: Osaklang, S.; Siritaratiwat, A.; Kaewrawang, A.; Ungvichian, V.; Supnithi, P.; Sivaratana, R.; Kruesubthaworn, A.;
2012 / IEEE
By: Clavel, E.; Perrussel, R.; Vincent, B.; Ferber, M.; Sartori, C.A.F.; Zangui, S.; Berger, K.; Vollaire, C.;
By: Clavel, E.; Perrussel, R.; Vincent, B.; Ferber, M.; Sartori, C.A.F.; Zangui, S.; Berger, K.; Vollaire, C.;
2012 / IEEE
By: Benfica, J.; Bolzani Poehls, L. M.; Vargas, F.; Lipovetzky, J.; Lutenberg, A.; Garcia, S. E.; Gatti, E.; Hernandez, F.;
By: Benfica, J.; Bolzani Poehls, L. M.; Vargas, F.; Lipovetzky, J.; Lutenberg, A.; Garcia, S. E.; Gatti, E.; Hernandez, F.;
2011 / IEEE
By: Bu-Yeol Lee; Pil-Sung Kang; Jong-Jin Lim; Hong-June Park; Jae-Yoon Sim; Jin-Cheol Hong; Young-Ho Choi; Hyung-Joon Chi; Soo-Min Lee; Hee-Sub Lee;
By: Bu-Yeol Lee; Pil-Sung Kang; Jong-Jin Lim; Hong-June Park; Jae-Yoon Sim; Jin-Cheol Hong; Young-Ho Choi; Hyung-Joon Chi; Soo-Min Lee; Hee-Sub Lee;
2012 / IEEE
By: Murali, K.P.; Mishra, D.; Sharma, H.; Raj, P.M.; Tummala, R.R.; Swaminathan, M.; Kyuhwan Han;
By: Murali, K.P.; Mishra, D.; Sharma, H.; Raj, P.M.; Tummala, R.R.; Swaminathan, M.; Kyuhwan Han;
2012 / IEEE
By: Dudoyer, S.; Berbineau, M.M.; Meyniel, B.; Rioult, J.J.; Slimen, M.N.B.; Adriano, R.R.; Deniau, V.;
By: Dudoyer, S.; Berbineau, M.M.; Meyniel, B.; Rioult, J.J.; Slimen, M.N.B.; Adriano, R.R.; Deniau, V.;
2012 / IEEE
By: Cheng-Rong Li; Guo-Ming Ma; Yang-Chun Cheng; Ying-Ting Luo; Jun-Yu Liang; Jian Jiang;
By: Cheng-Rong Li; Guo-Ming Ma; Yang-Chun Cheng; Ying-Ting Luo; Jun-Yu Liang; Jian Jiang;
2012 / IEEE
By: Mandic, D.P.; Rosenkranz, K.; Rank, M.L.; Ungstrup, M.; Cheolsoo Park; Kidmose, P.; Looney, D.;
By: Mandic, D.P.; Rosenkranz, K.; Rank, M.L.; Ungstrup, M.; Cheolsoo Park; Kidmose, P.; Looney, D.;
2012 / IEEE
By: Berbel, N.; Gil, I.; Perez, D.; Mon, J.; Gago, J.; Gonzalez, D.; Balcells, J.; Fernandez-Garcia, R.;
By: Berbel, N.; Gil, I.; Perez, D.; Mon, J.; Gago, J.; Gonzalez, D.; Balcells, J.; Fernandez-Garcia, R.;
2012 / IEEE
By: Slankamenac, M.P.; Manojlovic, L.M.; Bajic, J.S.; Stupar, D.Z.; Zivanov, M.B.; Joza, A.V.;
By: Slankamenac, M.P.; Manojlovic, L.M.; Bajic, J.S.; Stupar, D.Z.; Zivanov, M.B.; Joza, A.V.;