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Topic: Electric Variables Measurement
Results
2011 / IEEE / 978-1-61284-486-2
By: Shayanfar, H.A.; Fazli, M.; Jahani, R.; Nejad, H.C.; Shafighi, A.;
By: Shayanfar, H.A.; Fazli, M.; Jahani, R.; Nejad, H.C.; Shafighi, A.;
2011 / IEEE / 978-986-02-8974-9
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
2011 / IEEE / 978-1-4244-7355-7
By: Okubo, H.; Saito, H.; Koide, H.; Kawanishi, K.; Kato, K.; Hayakawa, N.; Kojima, H.;
By: Okubo, H.; Saito, H.; Koide, H.; Kawanishi, K.; Kato, K.; Hayakawa, N.; Kojima, H.;
2011 / IEEE / 978-1-61284-978-2
By: Apollonio, F.; Paffi, A.; Liberti, M.; Lovisolo, G.A.; Mancini, S.; Aratari, G.; Colotti, R.;
By: Apollonio, F.; Paffi, A.; Liberti, M.; Lovisolo, G.A.; Mancini, S.; Aratari, G.; Colotti, R.;
2011 / IEEE / 978-1-4577-0509-0
By: Gacemi, D.; Lampin, J.F.; Crozat, P.; Blary, K.; Mangeney, J.; Meng, F.; Laurent, T.; Akalin, T.;
By: Gacemi, D.; Lampin, J.F.; Crozat, P.; Blary, K.; Mangeney, J.; Meng, F.; Laurent, T.; Akalin, T.;
2011 / IEEE / 978-1-4577-0653-0
By: Yamakawa, T.; Yamakawa, T.; Suzuki, M.; Fujii, M.; Tokiwa, T.; Aou, S.; Inoue, T.;
By: Yamakawa, T.; Yamakawa, T.; Suzuki, M.; Fujii, M.; Tokiwa, T.; Aou, S.; Inoue, T.;
2011 / IEEE / 978-0-9568086-0-8
By: Moscicki, A.; Piasecki, T.; Platek, B.; Felba, J.; Falat, T.; Smolarek, A.;
By: Moscicki, A.; Piasecki, T.; Platek, B.; Felba, J.; Falat, T.; Smolarek, A.;
2011 / IEEE / 978-1-4673-0120-6
By: Johns, W.; Gabella, B.; Delannoy, A.; Yang, Z.; Spanier, S.; Robacker, T.; Hollingsworth, M.; Bugg, W.; Stickland, D.; Marlow, D.; Hunt, A.; Harrop, B.; Halyo, V.; Thomassen, P.; Stone, R.; Schnetzer, S.; Patel, R.; Hits, D.; Hidas, D.; Doroshenko, J.; Contreras-Campana, C.; Bartz, E.; Barker, A.; Andeen, K.; Steininger, H.; Pernicka, M.; Ryjov, V.; Loos, R.; Gastal, M.; Hall-Wilton, R.; Farrow, C.;
By: Johns, W.; Gabella, B.; Delannoy, A.; Yang, Z.; Spanier, S.; Robacker, T.; Hollingsworth, M.; Bugg, W.; Stickland, D.; Marlow, D.; Hunt, A.; Harrop, B.; Halyo, V.; Thomassen, P.; Stone, R.; Schnetzer, S.; Patel, R.; Hits, D.; Hidas, D.; Doroshenko, J.; Contreras-Campana, C.; Bartz, E.; Barker, A.; Andeen, K.; Steininger, H.; Pernicka, M.; Ryjov, V.; Loos, R.; Gastal, M.; Hall-Wilton, R.; Farrow, C.;
2011 / IEEE / 978-1-61284-193-9
By: Bin-Da Liu; I-Jen Chao; Shih-Chang Chang; Hung-Yin Lin; Mei-Hwa Lee; Chun-Yueh Huang;
By: Bin-Da Liu; I-Jen Chao; Shih-Chang Chang; Hung-Yin Lin; Mei-Hwa Lee; Chun-Yueh Huang;
2012 / IEEE / 978-1-4673-1780-1
By: Harauchi, K.; Shioiri, T.; Iwasaki, Y.; Ohno, Y.; Jin-Ping Ao; Hayashino, K.; Fukui, K.;
By: Harauchi, K.; Shioiri, T.; Iwasaki, Y.; Ohno, Y.; Jin-Ping Ao; Hayashino, K.; Fukui, K.;
2012 / IEEE / 978-1-4673-0784-0
By: Mazon, A.J.; Fernandez, E.; Albizu, I.; Bedialauneta, M.T.; de Arriba, S.;
By: Mazon, A.J.; Fernandez, E.; Albizu, I.; Bedialauneta, M.T.; de Arriba, S.;
2012 / IEEE / 978-1-4577-0920-3
By: Rodrigues, J.C.; Monteiro, J.; Cavalcante, G.P.S.; Frances, C.R.L.; Fraiha, S.C.; Ferreira, A.; Gomes, H.S.; Araujo, J.;
By: Rodrigues, J.C.; Monteiro, J.; Cavalcante, G.P.S.; Frances, C.R.L.; Fraiha, S.C.; Ferreira, A.; Gomes, H.S.; Araujo, J.;
2012 / IEEE / 978-1-4577-0920-3
By: Magno, F.N.B.; de Souza, J.F.; Protasio dos Santos Cavalcante, G.; Costa, J.C.; Cozzolino, K.;
By: Magno, F.N.B.; de Souza, J.F.; Protasio dos Santos Cavalcante, G.; Costa, J.C.; Cozzolino, K.;
2012 / IEEE / 978-1-4673-1965-2
By: Ga Won Kim; ChoonHeung Lee; Rinne, G.; Jin Young Kim; Seoung Joon Hong; Chul Woo Park; Ji Heon Yu;
By: Ga Won Kim; ChoonHeung Lee; Rinne, G.; Jin Young Kim; Seoung Joon Hong; Chul Woo Park; Ji Heon Yu;
2012 / IEEE / 978-1-4673-0442-9
By: Hale, P.D.; Bieler, M.; Fuser, H.; Harper, M.; Humphreys, D.; Jargon, J.; Wang, J.; Dienstfrey, A.; Williams, D.F.;
By: Hale, P.D.; Bieler, M.; Fuser, H.; Harper, M.; Humphreys, D.; Jargon, J.; Wang, J.; Dienstfrey, A.; Williams, D.F.;