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Topic: Electric Resistance Measurement

Results

An alternating current bridge for comparing four-terminal-pair impedances at �= 10⁴ rad/s

1982 / IEEE
By: Hanke, R.;

Effect of surface contamination on electric contact performance

1987 / IEEE
By: Antler, M.;

State-of-Charge Estimation and State-of-Health Prediction of a Li-Ion Degraded Battery Based on an EKF Combined With a Per-Unit System

2011 / IEEE
By: Jonghoon Kim; Cho, B.H.;

Contactless Measurement of Sheet Resistance Using Impulse Voltage

2011 / IEEE
By: Oi, S.; Saotome, H.; Akimoto, S.;

An Electronic System to Heat MOX Sensors With Synchronized and Programmable Thermal Profiles

2012 / IEEE
By: Depari, A.; Ponzoni, A.; Comini, E.; Sisinni, E.; Marioli, D.; Flammini, A.;

Design, Fabrication, and Testing of a Modular Magnetic Field Microsensor on a Flexible Polymer Foil

2012 / IEEE
By: Griesbach, T.; Rissing, L.; Wurz, M.C.;

Bioimpedance Analysis for the Characterization of Breast Cancer Cells in Suspension

2012 / IEEE
By: Fan Zheng; Wei Duan; Wei Wang; Guofeng Qiao; Chatwin, C.R.; Sinclair, A.J.;

Error Propagation in Contact Resistivity Extraction Using Cross-Bridge Kelvin Resistors

2012 / IEEE
By: Hellstrom, P.; Gudmundsson, V.; Ostling, M.;

Surface-Charge-Layer Sheet-Resistance Measurements for Evaluating Interface RF Losses on High-Resistivity-Silicon Substrates

2012 / IEEE
By: Nanver, L.K.; Evseev, S.B.; Milosaviljevic, S.;

Noncontact Surface Resistivity Measurement Using a Cylindrical Surface Potential Detector With a Corona Charger

2012 / IEEE
By: Sugimoto, T.; Higashiyama, Y.; Abe, M.;

Effects of Metal Capping on Thermal Annealing of Copper Interconnects

2012 / IEEE
By: Yang, C.-C.; Rosenberg, R.; Edelstein, D.; Li, B.;

Measurement of Source Resistance in Top-Contact Organic Thin-Film Transistors

2012 / IEEE
By: Singh, V.K.; Mazhari, B.; Agrawal, A.K.;

Electric Resistance Measurement of the KSTAR Superconducting Coils With Small Resistive Joints

2012 / IEEE
By: Young-ok Kim; Yong Chu; Yonekawa, H.; Hoon-kyun Na; Kap-rai Park;

On-load tap changer's dynamic resistance measurement: Settings and interpretation

2011 / IEEE / 978-1-4577-0279-2
By: Aditya, J.; Erbrink, J.J.; Quak, B.; Leich, R.; Smit, J.J.; Chmura, L.A.;

Insulation resistance measurements for machine insulation

2011 / IEEE / 978-1-4577-0279-2
By: Essalihi, M.; David, E.; Brown, A.;

Compact USB measurement and analysis system for real-time fluctuation enhanced sensing

2011 / IEEE / 978-1-4577-0192-4
By: Kukovecz, A.; Gingl, Z.; Mingesz, R.; Moilanen, H.; Kordas, K.; Konya, Z.;

The effect of environment of different noise frequencies on human physiological responses

2011 / IEEE / 978-1-61284-774-0
By: Liu Chien Chih; Chiang Che Ming;

Testing electric resistivity with method of whirling currents

2011 / IEEE / 978-1-4244-9439-2
By: Qixiang Zhang; Xiaoying Zhang;

Development of multi-functional grounding resistance meter based on DSP

2011 / IEEE / 978-1-4577-0536-6
By: Xiutong Zhang; Xiucai Guo;

Batteryless MEMS flow sensor within prosthetic vascular graft

2011 / IEEE / 978-1-4244-9277-0
By: Singh, P.; Hamidullah, M.; Li-Shiah Lim; Cairan He; Han-Hua Feng; Woo-Tae Park;

Design of the battery resistance measurement system

2011 / IEEE / 978-1-4244-8161-3
By: Fu Yongjie; Yang Zhenji;

Simulation of laterolog tool for geosteering and formation evaluation

2011 / IEEE / 978-1-4244-8165-1
By: Zhigang Zhang; Zhongqing Zhang;

Simulation research on high temperature superconducting power cable

2011 / IEEE / 978-1-4244-8165-1
By: Rong-bao Zhang; Jian-wen Zhang; Xiao-dong Zhang;

Simple resistance-to-time converter with lead-wire-resistance compensation

2011 / IEEE / 978-4-907764-39-5
By: Julsereewong, A.; Julsereewong, P.; Pootharaporn, N.; Rerkratn, A.;

Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations

2011 / IEEE / 978-1-4577-0708-7
By: Clarysse, T.; Eyben, P.; Nazir, A.; Vandervorst, W.; Hellings, G.; De Meyer, K.; Mody, J.; Schulze, A.;

Design and implementation of highly efficient resistance measurement system for DSL splitter

2011 / IEEE / 978-1-4244-8161-3
By: Juan Zhou; Bingyan Chen; Huo Shuqin; Wang Shan; Xie Yanan; Zhu Changping;

Non-contact surface resistivity measurement using cylindrical surface potential detector with a corona charger

2011 / IEEE / 978-1-4244-9500-9
By: Sugimoto, T.; Higashiyama, Y.; Abe, M.;

Assessing electrical impedance alterations in spinal muscular atrophy via the finite element method

2011 / IEEE / 978-1-4577-1589-1
By: Darras, B.T.; Minhee Sung; Jia Li; Spieker, A.J.; Jafarpoor, M.; Rutkove, S.B.;

A vector triangle method for the measurement of inductance and capacitance

2011 / IEEE / 978-1-4577-0603-5
By: Qiang Liao; Xiao-yang Wang; Wei Huang; Xiao-ming Ding;

Optimum location of measurement electrode when testing the grounding resistance of an L-shape building base

2011 / IEEE / 978-1-4577-1466-5
By: Yingqiang Wang; Jiaqing Chen; Wenchun Liao; Xiangyu Liu;

Finite-difference analysis of the potential distribution around an L-shape building base under the measurement of grounding resistance

2011 / IEEE / 978-1-4577-1466-5
By: Jiaqing Chen; Xiangyu Liu; Yingqiang Wang; Wenchun Liao;

Pd-decorated ZnO and WO3 nanowires for sensing applications

2011 / IEEE / 978-1-4244-9289-3
By: Chavez, F.; Goiz, O.; Garcia-Serrano, O.; Pena-Sierra, R.; Romero-Paredes, G.;

Simultaneously measurement of frequency shift and series resistance changes of a quartz resonator using a miller QCM oscillator

2011 / IEEE / 978-1-4244-9289-3
By: Cao-Paz, A.; Rodriguez-Pardo, L.; Farina, J.;

Shore power grounding resistance calculation

2011 / IEEE / 978-1-4244-9690-7
By: Luo Ning-zhao; Xiao-feng Zhang;

A micro gas sensor based on a WO3 thin film for aromatic hydrocarbon detection

2011 / IEEE / 978-1-4577-0167-2
By: Joe-Air Jiang; Yu-Hou Su; Lung-Ming Fu; Chia-Yen Lee;

Measurement and simulation of grounding resistance with two and four mesh grids

2011 / IEEE / 978-1-4577-0001-9
By: Khan, M.A.; Koh Ming Jen; Salam, M.A.;

Semiconductor gas sensor using nano-sized oxide for high-sensitive detection of environment-related gases

2011 / IEEE / 978-1-4577-2141-0
By: Shimanoe, K.; Yamazoe, N.; Kida, T.; Yuasa, M.;

Low temperature processing of copper conductive ink for printed electronics applications

2011 / IEEE / 978-1-4577-1982-0
By: Salam, B.; Lok Boon Keng; Albert, L.C.W.; Wai Lai Lai;

Evaluation of electro conductive film and strain gage as displacement sensor for pneumatic artificial muscle

2011 / IEEE / 978-1-4577-2138-0
By: Yamamoto, Y.; Suzumori, K.; Wakimoto, S.;

Development of Via in Mold (ViM) for embedded wafer level package (EWMLP)

2011 / IEEE / 978-1-4577-1982-0
By: Daniel, F.M.; Myo Ei Pa Pa; Soon Wee Ho; Gao Shan; Wen Sheng Lee; Damaruganath, P.; Hyoung Joon Kim; Ser Choong Chong;

Pyramidal nanowire tip for atomic force microscopy and thermal imaging

2012 / IEEE / 978-1-4673-1124-3
By: Abelmann, L.; Siekman, M.; Sarajlic, E.; Burouni, N.; Tas, N.;

SLX series of deep-cold container temperature testing and the temperature uniformity study

2011 / IEEE / 978-1-4673-1690-3
By: Zhiqi Liu; Yu Tian; Xianguo Yan;

Microprobe metrology for direct sheet resistance and mobility characterization

2012 / IEEE / 978-1-4673-1257-8
By: Gammelgaard, L.; Henrichsen, H.H.; Rong Lin; Jensen, A.; Kjaer, D.; Petersen, D.H.; Nielsen, P.F.; Hansen, O.;

Sheet resistance and conductivity measurements of rough surfaces of metals on printed circuit boards and metalized ceramic substrates

2012 / IEEE / 978-1-4577-1438-2
By: Usydus, L.; Krupka, J.; Koltuniak, H.;

Multielectrode measurement of conductive liquid layer thickness

2012 / IEEE / 978-1-4577-1772-7
By: Dzapo, H.; Vurin, D.;

High accuracy-wide range resistance measurement for thermistor sensors monitoring

2012 / IEEE / 978-1-4577-1772-7
By: Nieddu, S.;

Unconventional methods for PM Synchronous Motor parameters investigation

2012 / IEEE / 978-1-4673-1179-3
By: Musak, M.; Stulrajter, M.;

Feasibility analysis of transformer winding DC resistance measuring on-line

2012 / IEEE / 978-1-4673-0199-2
By: Baoshu Li; Shutao Zhao; Yu Guo;

Evaluation of low-ohmic resistance measurement capabilities between VSL and NIST

2012 / IEEE / 978-1-4673-0442-9
By: Kraft, M.; van der Beek, J.; Rietveld, G.;

Thermal characterization of a coaxial calculable resistor

2012 / IEEE / 978-1-4673-0442-9
By: Silveira, F.A.; Vasconcellos, R.T.B.;

Improvements in high resistance measurements at CENAM

2012 / IEEE / 978-1-4673-0442-9
By: Medina, B.R.; Marquez, F.H.; Estrada, A.P.;

High resistance measurements with a two-terminal cryogenic current comparator

2012 / IEEE / 978-1-4673-0442-9
By: Bierzychudek, M.; Tonina, A.;

Binary compensation unit for cryogenic current comparators

2012 / IEEE / 978-1-4673-0442-9
By: Drung, D.; Hinnrichs, C.; Barthelmess, H.-J.; Pesel, E.; Gotz, M.;

Numerical simulation of the influence of shield ring on the unit step response of a 300kV standard impulse resistive divider

2012 / IEEE / 978-1-4673-0442-9
By: Li Ren Zhou; Haiming Shao; Lei Lai; Yang Pan; Guo Zhong Zhan;

SIM.EM-S5 voltage, current and resistance comparison

2012 / IEEE / 978-1-4673-0442-9
By: Sanchez, H.; Izquierdo, D.; Zhang, N.; Elmquist, R.; Hamilton, F.; Kyriazis, G.; Cioffi, J.; Gonzalez, J.; Montaluisa, J.; Martinez, A.; Ramos, R.; Postigo, H.;

Characterization of 100-& metal-foil resistor for AC measurements

2012 / IEEE / 978-1-4673-0442-9
By: Kaneko, N.; Oe, T.; Zama, M.; Kumagai, M.; Domae, A.;

Characterization of a digitizer for a low value resistor calibration system in the audio-frequency band

2012 / IEEE / 978-1-4673-0442-9
By: Kaczmarek, J.; Rybski, R.; Koziol, M.;

Bridges balanced by variable voltages from multichannel generators

2012 / IEEE / 978-1-4673-0442-9
By: Bohacek, J.; Sedlacek, R.;

Impedance simulator for automatic calibration of LCR meters over the entire complex plan

2012 / IEEE / 978-1-4673-0442-9
By: Jeanneret, B.; Overney, F.;

Breakdown of the quantum Hall effect in graphene

2012 / IEEE / 978-1-4673-0442-9
By: Baker, A.M.R.; Tzalenchuk, A.; Janssen, T.J.B.M.; Fal'ko, V.I.; Kopylov, S.; Alexander-Webber, J.A.; Kubatkin, S.; Lara-Avila, S.; Yakimova, R.; Nicholas, R.J.;

Characteristics of graphene for quantized hall effect measurements

2012 / IEEE / 978-1-4673-0442-9
By: Hight-Walker, A.R.; Newell, D.B.; Klimov, N.; Yanfei Yang; Guowei He; Feenstra, R.M.; Bush, B.G.; Calizo, I.G.; Real, M.; Shen, T.; Elmquist, R.E.;

Role of the substrate and the temperature of deposition on the properties of the TaxN thin films

2012 / IEEE / 978-953-233-068-7
By: Ocko, M.; Ivanda, M.; Aonja, S.;

Prognostication of accrued damage in board assemblies under thermal and mechanical stresses

2012 / IEEE / 978-1-4673-1965-2
By: Goebel, K.; Lowe, R.; Lall, P.;

Voltage injection type high ohm resistance bridge

2012 / IEEE / 978-1-4673-0442-9
By: Oe, T.; Kaneko, N.; Kinoshita, J.;

10�0 GO guarded Hamon network designed for the Wheatstone bridge for high resistors calibration

2012 / IEEE / 978-1-4673-0442-9
By: Galliana, F.; Capra, P.P.;

High precision measurement of the load effect of the resistor

2012 / IEEE / 978-1-4673-0442-9
By: Li, Z.; Zhang, Z.; Lan, J.; Wang, G.; Li, S.; Han, B.; He, Q.;

System for resistance unit transfer from 10 k� to 100 T� with new Hamon transfers

2012 / IEEE / 978-1-4673-0442-9
By: Lisowski, M.; Krawczyk, K.;

Determination and comparison of temperature coefficients of standard inductors using different methods

2012 / IEEE / 978-1-4673-0442-9
By: Saxena, A.K.; Ansari, M.A.; Satish, S.;

Precision measurements of the quantum Hall effect in exfoliated graphene

2012 / IEEE / 978-1-4673-0442-9
By: Pesel, E.; Gotz, M.; Friedemann, M.; Woszczyna, M.; Ahlers, F.; Weimann, T.; Pierz, K.;

Noise and cross-correlation spectra of quantum hall devices

2012 / IEEE / 978-1-4673-0442-9
By: Schurr, J.; Ortolano, M.; Callegaro, L.; Pierz, K.;

Long-term calibration results of 10 mH and 100 mH standard inductors using a reactance compensation method

2012 / IEEE / 978-1-4673-0442-9
By: Sakamoto, N.;

Active-arm resistance bridge with voltage null-detection for precision measurement of resistances above 1 M&

2012 / IEEE / 978-1-4673-0442-9
By: Rietveld, G.; van der Beek, J.;

Measurements of the sheet resistance and conductivity of thin epitaxial graphene and SiC films

2010 / American Institute of Physics
By: J. Krupka; W. Strupinski;

Finite element analysis of the effect of electrodes placement on accurate resistivity measurement in a diamond anvil cell with van der Pauw technique

2010 / American Institute of Physics
By: Baojia Wu; Xiaowei Huang; Yonghao Han; Chunxiao Gao; Gang Peng; Cailong Liu; Yue Wang; Xiaoyan Cui; Guangtian Zou;

Technique for anisotropic extension of organic crystals: Application to temperature dependence of electrical resistance

2007 / American Institute of Physics
By: Takashi Yamamoto; Reizo Kato; Hiroshi M. Yamamoto; Atsuko Fukaya; Kenji Yamasawa; Ichiro Takahashi; Peter Day; Hiroki Akutsu; Akane Akutsu-Sato;

Resistivity and thermopower measurement setups in the temperature range of 5325 K

2008 / American Institute of Physics
By: Ajay Soni; G. S. Okram;

Accurate microfour-point probe sheet resistance measurements on small samples

2009 / American Institute of Physics
By: Sune Thorsteinsson; Fei Wang; Dirch H. Petersen; Torben Mikael Hansen; Daniel Kjær; Rong Lin; Ole Hansen; Jang-Yong Kim; Peter F. Nielsen;

A method to investigate the electron scattering characteristics of ultrathin metallic films by in situ electrical resistance measurements

2009 / American Institute of Physics
By: I. G. Trindade; R. Fermento; D. Leitão; J. B. Sousa;

Design of a vector magnet for the measurements of anisotropic magnetoresistance and rotational magneto-optic Kerr effect

2012 / American Institute of Physics
By: J. Li; E. Jin; H. Son; A. Tan; W. N. Cao; Chanyong Hwang; Z. Q. Qiu;

Apparatus for measuring the Seebeck coefficients of highly resistive organic semiconducting materials

2012 / American Institute of Physics
By: H. Y. Cai; D. F. Cui; Y. T. Li; X. Chen; L. L. Zhang; J. H. Sun;

Artificial neural network methodology for the estimation of ground enhancing compounds resistance

2014 / IEEE
By: Androvitsaneas, V.P.; Stathopulos, I.A.; Gonos, I.F.;

Measurement of low-resistance points on the skin by dry roller electrodes

1988 / IEEE
By: Yamamoto, T.; Yoshida, A.; Yasumo, W.; Yamaguchi, Y.; Yasuhara, K.; Yamamoto, Y.;

Determination of negative-sequence resistance of turbo-generators from rated-frequency standstill tests

1988 / IEEE
By: Neidhoefer, G.J.; Subbarao, V.S.;

Mine power-system ground research

1988 / IEEE
By: Hill, H.W., Jr.; Cooley, W.L.;

Monitoring of a water-cooled coil of a hybrid magnet by means of precise measurements of field and resistance

1988 / IEEE
By: Kudo, M.; Hoshi, A.; Noto, K.; Miura, S.; Sai, K.; Nakagawa, Y.; Kido, G.; Ishikawa, Y.;

A technique for electrical measurement of ball bond location

1988 / IEEE
By: Gupta, S.; Shirley, C.G.;

Measurement and the effect of different solvents on thin polymeric film surface resistance

1989 / IEEE
By: Leonidopoulos, G.;

A resistance ratio bridge based on a cryogenic current comparator for measuring the quantized Hall resistance

1989 / IEEE
By: Harris, J.J.; Foxon, C.T.; Ploog, K.; Weimann, G.; Van der Wel, W.; Harmans, C.J.P.M.; Mooij, J.E.; Andre, J.-P.;

Parameter extraction for bipolar transistors

1989 / IEEE
By: Neugroschel, A.; Park, J.S.;

Direct measurement of rail resistance

1989 / IEEE
By: Barber, J.P.; Bauer, D.P.;

A resistance change methodology for the study of electromigration in Al-Si interconnects

1988 / IEEE
By: Segura, I.; Maiz, J.A.;

Characterization of alloyed AuGe/Ni/Au ohmic contacts to n-doped GaAs by measurement of transfer length and under the contact sheet resistance

1989 / IEEE
By: Henry, H.G.;

Determination of source and drain series resistances of ultra-short gate-length MODFETs

1989 / IEEE
By: Liu, S.-M.J.; Das, M.B.; Thurairaj, M.; Fu, S.-T.;

A novel method to determine the source and drain resistances of individual MOSFETs

1988 / IEEE
By: Ricco, B.; Sangiorgi, E.; Selmi, L.;

A tester for the contact resistivity of self-aligned silicides

1988 / IEEE
By: Ng, K.K.; Lynch, W.T.;

Charge correlation measurements from a double-sided solid state ministripe detector

1989 / IEEE
By: Lambrecht, M.A.; Skubic, P.L.; Kalbfleisch, G.R.; Wilburn, C.D.;

New internationally adopted reference standards of voltage and resistance based on the Josephson and quantum Hall effects

1989 / IEEE
By: Taylor, B.N.;

Investigation of a low frequency measurement anomaly encountered with measurement systems utilizing a common shield

1989 / IEEE
By: Bernotski, D.R.; Dosch, M.C.; Uhrich, S.T.;

Microwave surface resistance measurement technique for cylindrical high-Tc superconductor

1989 / IEEE
By: Aida, K.; Ono, T.;

An improved straddling method with triaxial guards for the calibration of inductive voltage dividers at 1592 Hz

1989 / IEEE
By: Hanke, R.;

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