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Topic: Electric Noise Measurement
Results
2011 / IEEE / 978-1-4577-0192-4
By: Talmat, R.; Cretu, B.; Wu, S.; Guillet, B.; Achour, H.; Sassier, E.; Routoure, J.-M.; Pagano, S.; Barone, C.;
By: Talmat, R.; Cretu, B.; Wu, S.; Guillet, B.; Achour, H.; Sassier, E.; Routoure, J.-M.; Pagano, S.; Barone, C.;
2011 / IEEE / 978-1-4577-0192-4
By: Cichosz, J.; Konczakowska, A.; Stawarz-Graczyk, B.; Szewczyk, A.; Flisikowski, P.; Dokupil, D.;
By: Cichosz, J.; Konczakowska, A.; Stawarz-Graczyk, B.; Szewczyk, A.; Flisikowski, P.; Dokupil, D.;
2011 / IEEE / 978-1-58537-193-8
By: Cheolgu Jo; Jaedeok Lim; Jongsung Lee; Pommerenke, D.; Tianqi Li; Nandy, A.; Byongsu Seol;
By: Cheolgu Jo; Jaedeok Lim; Jongsung Lee; Pommerenke, D.; Tianqi Li; Nandy, A.; Byongsu Seol;
2011 / IEEE / 978-0-9541146-3-3
By: Christopoulos, C.; Thomas, D.W.P.; Anada, T.; Chen, C.P.; Kamiji, Y.; Takamori, H.; Noda, Y.;
By: Christopoulos, C.; Thomas, D.W.P.; Anada, T.; Chen, C.P.; Kamiji, Y.; Takamori, H.; Noda, Y.;
2011 / IEEE / 978-0-9541146-3-3
By: Carobbi, C.; Borsero, M.; Tomasin, P.; Zuccato, A.; Stellini, M.;
By: Carobbi, C.; Borsero, M.; Tomasin, P.; Zuccato, A.; Stellini, M.;
2011 / IEEE / 978-1-4577-1879-3
By: Hernandez, J.C.G.; Anguiano, A.T.; Lopez, M.L.; Gnecchi, J.A.G.; Ramirez-Reyes, J.L.;
By: Hernandez, J.C.G.; Anguiano, A.T.; Lopez, M.L.; Gnecchi, J.A.G.; Ramirez-Reyes, J.L.;
2011 / IEEE / 978-1-4577-1756-7
By: Bae, Y.H.; Allibert, F.; Cristoloveanua, S.; Ionica, I.; Diab, A.; Ghibaudo, G.; Chroboczek, J.A.;
By: Bae, Y.H.; Allibert, F.; Cristoloveanua, S.; Ionica, I.; Diab, A.; Ghibaudo, G.; Chroboczek, J.A.;
Shielding effectiveness of composite aircraft: A reverberation chamber and virtual measurement study
2012 / IEEE / 978-1-4577-1772-7By: Phillips, J.; Mamaril, B.; Ewing, M.S.; Seguin, S.A.; Cordill, B.D.; Aziz, M.A.; Pendse, V.;
2008 / American Institute of Physics
By: L. Hao; J. C. Macfarlane; J. C. Gallop; D. Cox; J. Beyer; D. Drung; T. Schurig;
By: L. Hao; J. C. Macfarlane; J. C. Gallop; D. Cox; J. Beyer; D. Drung; T. Schurig;
2008 / American Institute of Physics
By: N. Maire; F. Hohls; B. Kaestner; K. Pierz; H. W. Schumacher; R. J. Haug;
By: N. Maire; F. Hohls; B. Kaestner; K. Pierz; H. W. Schumacher; R. J. Haug;
2006 / American Institute of Physics
By: L. DiCarlo; Y. Zhang; D. T. McClure; C. M. Marcus; K. W. West; L. N. Pfeiffer;
By: L. DiCarlo; Y. Zhang; D. T. McClure; C. M. Marcus; K. W. West; L. N. Pfeiffer;
2009 / American Institute of Physics
By: Masayuki Hashisaka; Yoshiaki Yamauchi; Kensaku Chida; Shuji Nakamura; Teruo Ono; Kensuke Kobayashi;
By: Masayuki Hashisaka; Yoshiaki Yamauchi; Kensaku Chida; Shuji Nakamura; Teruo Ono; Kensuke Kobayashi;
1/f noise interpretation of the effect of gate oxide nitridation and reoxidation in dielectric traps
1990 / IEEEBy: Jayaraman, R.; Sodini, C.G.;