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Topic: Electric Noise Measurement

Results

An error analysis for absolute flux density measurements of Cassiopeia A

1976 / IEEE
By: Kanda, M.;

Measurement of 1/f noise using a contact-free current-driving scheme

1982 / IEEE
By: Suzuki, Y.; Hashiguchi, S.;

Noise equivalent circuit of linear passive two-ports with applications to transmission lines

1982 / IEEE
By: Agouridis, D.C.;

Two-phase frequency-conversion type spectrum analyzer for low-frequency noise measurement

1982 / IEEE
By: Adachi, F.; Hoshimiya, N.;

A 4-GHz band low-noise measurement system

1987 / IEEE
By: Yokoshima, I.; Kato, Y.;

A compact noise source employing triple-point of temperature

1987 / IEEE
By: Kato, Y.;

Thermal Phase Noise Measurements in Optical Fiber Interferometers

2012 / IEEE
By: Bartolo, R.E.; Dandridge, A.; Tveten, A.B.;

High-Performance Arcing-Fault Location in Distribution Networks

2012 / IEEE
By: Chiman Kwan; Ayhan, B.; Jin Zhou; Wei-Jen Lee; Shun Liang;

Ultrasensitive portable optoelectronic system dedicated to detection of bioluminescence

2011 / IEEE / 978-1-4577-0192-4
By: Orsal, B.; Kayaian, J.;

Measurement evaluation of electromagnetic radiation from the electrical wiring in EVs

2011 / IEEE / 978-988-15581-2-1
By: Chi-Fang Huang; Jhih-Yuan Wang;

Uncertainties in the estimation of low frequency noise level extracted from noise spectral density measurements

2011 / IEEE / 978-1-4577-0192-4
By: Talmat, R.; Cretu, B.; Wu, S.; Guillet, B.; Achour, H.; Sassier, E.; Routoure, J.-M.; Pagano, S.; Barone, C.;

The low frequency noise behaviour of SiC MESFETs

2011 / IEEE / 978-1-4577-0192-4
By: Cichosz, J.; Konczakowska, A.; Stawarz-Graczyk, B.; Szewczyk, A.; Flisikowski, P.; Dokupil, D.;

Long-term stability of an SiGe HBT-based active cold load

2011 / IEEE / 978-1-4577-1005-6
By: Goutoule, J.-M.; Gonneau, E.; Escotte, L.; de la Jarrige, E.L.;

A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals

2011 / IEEE / 978-1-58537-193-8
By: Cheolgu Jo; Jaedeok Lim; Jongsung Lee; Pommerenke, D.; Tianqi Li; Nandy, A.; Byongsu Seol;

Analyses of RF impedance analyzer and LCR meter readout noise

2011 / IEEE / 978-1-61284-961-4
By: Hui Huang; Xin Meng Liu; Hui Xu;

Contactless electromagnetic field mapping system on planar circuits in EMC/EMI investigations

2011 / IEEE / 978-0-9541146-3-3
By: Christopoulos, C.; Thomas, D.W.P.; Anada, T.; Chen, C.P.; Kamiji, Y.; Takamori, H.; Noda, Y.;

A proposal for EFT uncertainty evaluation using numerical spectral analysis

2011 / IEEE / 978-0-9541146-3-3
By: Carobbi, C.; Borsero, M.; Tomasin, P.; Zuccato, A.; Stellini, M.;

Study of a multivariable coordinate control for a supercritical power plant process

2011 / IEEE / 978-1-86218-098-7
By: Al-Duri, B.; Jihong Wang; Mohamed, O.;

Phase Noise measurement techniques

2011 / IEEE / 978-1-4577-1694-2
By: De Giovanni, G.;

Analog Actuator for Multimodal Environmental Corrosion Measurements

2011 / IEEE / 978-1-4577-1879-3
By: Hernandez, J.C.G.; Anguiano, A.T.; Lopez, M.L.; Gnecchi, J.A.G.; Ramirez-Reyes, J.L.;

Static and low-frequency noise characterization of ultrathin SOI with very thin BOX in pseudo-MOSFET configuration

2011 / IEEE / 978-1-4577-1756-7
By: Bae, Y.H.; Allibert, F.; Cristoloveanua, S.; Ionica, I.; Diab, A.; Ghibaudo, G.; Chroboczek, J.A.;

Measurements and reduction of microwave oven electromagnetic leakage

2011 / IEEE / 978-1-4577-1631-7
By: Zarar Mohamed Jenu, M.; Muhammad Zin, N.; Ahmad Po'ad, F.;

A circuit design in piezoelectric vibration measurement system

2011 / IEEE / 978-1-4673-1078-9
By: Hui-yu Li; Horn-sen Tzou; Hua Li;

Measurement of conducted emission on antenna terminals using adjustable attenuators

2011 / IEEE / 978-1-4244-8268-9
By: Zihua Zhao; Jingyang Cao; Fei Dai; Yang He;

Measurement and application of magnetic induction intensity under complicated EM environment in substation

2011 / IEEE / 978-1-4244-8268-9
By: Xiang Cui; Yang Liu;

Local investigation of monocrystalline silicon solar cells defects

2011 / IEEE / 978-1-4244-9965-6
By: Macku, R.; Grmela, L.; Skarvada, P.; Tomanek, P.; Smith, S.J.;

Shielding effectiveness of composite aircraft: A reverberation chamber and virtual measurement study

2012 / IEEE / 978-1-4577-1772-7
By: Phillips, J.; Mamaril, B.; Ewing, M.S.; Seguin, S.A.; Cordill, B.D.; Aziz, M.A.; Pendse, V.;

A verification method for noise-temperature measurements on cryogenic low-noise amplifiers

2012 / IEEE / 978-1-4673-0442-9
By: Walker, D.K.; Billinger, R.; Randa, J.; Dazhen Gu;

Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

2008 / American Institute of Physics
By: L. Hao; J. C. Macfarlane; J. C. Gallop; D. Cox; J. Beyer; D. Drung; T. Schurig;

Noise measurement of a quantized charge pump

2008 / American Institute of Physics
By: N. Maire; F. Hohls; B. Kaestner; K. Pierz; H. W. Schumacher; R. J. Haug;

Ultrasensitive method for current noise measurements

2006 / American Institute of Physics
By: G. Giusi; F. Crupi; C. Ciofi; C. Pace;

System for measuring auto- and cross correlation of current noise at low temperatures

2006 / American Institute of Physics
By: L. DiCarlo; Y. Zhang; D. T. McClure; C. M. Marcus; K. W. West; L. N. Pfeiffer;

Ultrasensitive low noise voltage amplifier for spectral analysis

2008 / American Institute of Physics
By: G. Giusi; F. Crupi; C. Pace;

Microwave phase detection at the level of 10-11-rad

2009 / American Institute of Physics
By: Eugene N. Ivanov; Michael E. Tobar;

Noise measurement system at electron temperature down to 20 mK with combinations of the low pass filters

2009 / American Institute of Physics
By: Masayuki Hashisaka; Yoshiaki Yamauchi; Kensaku Chida; Shuji Nakamura; Teruo Ono; Kensuke Kobayashi;

A simple and versatile phase comparison method can accurately measure long term instability

1988 / IEEE
By: Ambrosini, R.; Caporaloni, M.;

High frequency noise power spectrum, impedance and transmission loss of power line in Japan on intrabuilding power line communications

1988 / IEEE
By: Tanaka, M.;

Noise modeling and measurement techniques (HEMTs)

1988 / IEEE
By: Cappy, A.;

A method for evaluating the noise temperature of microwave thermal noise sources by introducing an auxiliary transmission line

1988 / IEEE
By: Kato, Y.; Yokoshima, I.; Komiyama, K.;

Comments on "A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters" [with reply]

1988 / IEEE
By: Martines, G.; Pospieszalski, M.W.; Sannino, M.;

A novel approach to deriving closed form expressions for frequency stability variance measures

1988 / IEEE
By: Harison, R.G.; Kalivas, G.A.;

Measurement of zeros and the characterization of noise

1988 / IEEE
By: Sacerdoti, G.;

1/f noise in the linear region of LDD MOSFETs

1988 / IEEE
By: Jeng Gong; Tsai, C.Y.H.;

Measuring harmonic distortion and noise floor of an A/D converter using spectral averaging

1988 / IEEE
By: Jenq, Y.-C.;

Measuring harmonic distortion and noise floor of an A/D convertor using spectral averaging

1988 / IEEE
By: Jenq, Y.C.;

Tunable microwave wafer probes

1988 / IEEE
By: Rabjohn, G.; Surridge, R.;

Writing a useful EMI test automation algorithm

1988 / IEEE
By: Sikora, P.A.;

Measuring harmonic distortion and noise floor of an A/D convertor using spectral averaging

1988 / IEEE
By: Jenq, Y.C.;

Design concept for a low-noise CCD image sensor based on subjective evaluation

1989 / IEEE
By: Ohtake, H.; Koike, J.; Nishida, Y.; Yoshikawa, S.; Abe, M.;

Noise and sensitivity analysis for miniature E-field probes

1989 / IEEE
By: Batchman, T.E.; Ng, K.T.; Veasey, D.L.; Pavlica, S.;

Radar applications of X-band fiber optic links

1988 / IEEE
By: Newberg, I.L.; Yen, H.W.; Thurmond, G.D.; Gee, C.M.;

A comparison between noise measurements and conventional electromigration reliability testing

1988 / IEEE
By: Rodbell, K.P.; Chen, T.M.; Cottle, J.G.;

RFI source-locating on power lines-an update

1989 / IEEE
By: Loftness, M.O.;

Electrical environment of the uprated Pacific NW/SW HVDC Intertie

1989 / IEEE
By: Stearns, R.D.; Chartier, V.L.; Burns, A.L.;

Noise correlations in magnetic field sensitive transistors

1988 / IEEE
By: Nathan, A.; Baltes, H.P.; Briglio, D.R.;

Burst noise and 1/f noise in quartz crystals and oscillators

1988 / IEEE
By: Moulton, G.E.;

Extending the range and accuracy of phase noise measurements

1988 / IEEE
By: Felton, C.M.; Clements, A.J.D.; Walls, F.L.; Vanek, M.D.; Lombardi, M.A.;

Radar measurement applications of fiber optic links

1988 / IEEE
By: Yen, H.W.; Thurmond, G.D.; Gee, C.M.; Newberg, I.L.;

Superconducting resonators and high T/sub c/ materials

1988 / IEEE
By: Steinbeck, J.; Anderson, A.C.; Oates, D.E.;

DC modulation noise and demagnetizing fields in thin metallic media

1989 / IEEE
By: Barany, A.M.; Tran, L.T.; Tarnopolsky, G.J.; Bloomquist, D.R.; Bertram, H.N.;

SNAP: VLF/LF statistical noise analyzer

1989 / IEEE
By: Neubert, J.A.;

When 12-dB SINAD is not 12-dB SINAD (land mobile FM receivers)

1989 / IEEE
By: Jones, L.T.;

Accuracy factors in microwave noise parameter measurements

1989 / IEEE
By: Strid, E.; Leake, B.; Davidson, A.;

Noise characterization uncertainty of microwave devices under low current operation

1989 / IEEE
By: Vaitkus, R.; Moyer, C.; Lucero, R.; Dydyk, M.;

An 8 mm FM and AM noise measuring equipment

1989 / IEEE
By: Xu Dezhong; Deng Minren;

Automated measurement of aircraft-level electromagnetic interference

1989 / IEEE
By: Medley, K.J.; Coffman, S.C.;

1/f noise interpretation of the effect of gate oxide nitridation and reoxidation in dielectric traps

1990 / IEEE
By: Jayaraman, R.; Sodini, C.G.;

Accuracy improvements in microwave noise parameter measurements

1989 / IEEE
By: Strid, E.; Leake, B.W.; Davidson, A.C.;

The noise bandwidth of sampled data systems

1989 / IEEE
By: White, D.R.;

Comments on "Determination of Si-SiO/sub 2/ interface trap density by 1/f noise measurements" [with reply]

1990 / IEEE
By: Hsiang, T.Y.; Celik-Butler, Z.; Vuillaume, D.;

Digital measurement of FM transmitter quality

1988 / IEEE / 0-87942-709-4
By: Nattrass, H.L.;

Electromagnetic interference and countermeasures on metallic lines for ISDN

1989 / IEEE
By: Ideguchi, T.; Hattori, M.;

Accurate measurement of low signal-to-noise ratios using a superheterodyne spectrum analyzer

1990 / IEEE
By: Hill, D.A.; Haworth, D.P.;

Modeling phase noise in frequency dividers

1990 / IEEE
By: Egan, W.F.;

Analysis of errors in transient disturbance measurements using high-pass probes

1990 / IEEE
By: Forti, M.M.; Millanta, L.M.;

Noise thermometers for hostile environments: a theoretical evaluation

1990 / IEEE
By: Agouridis, D.C.;

On the NEXT and impulse noise properties of subscriber loops

1989 / IEEE
By: Szechenyi, K.;

Testing basic access loops for service-affecting impulse noise

1989 / IEEE
By: Ungar, S.G.;

A facility for near end crosstalk measurements on ISDN subscriber loops

1989 / IEEE
By: Fung, A.; Falconer, D.D.; Lee, L.S.;

Comments, with reply, on "Accuracy improvements in microwave noise parameter measurements" by A.C. Davidson et al

1991 / IEEE
By: Uhlir, A., Jr.;

A simple method for the evaluation of microwave mixer diodes

1990 / IEEE
By: Buckmaster, H.A.; Hansen, C.H.; van Kalleveen, T.H.T.; Zaghloul, H.;

Microwave monolithic integrated circuit-related metrology at the National Institute of Standards and Technology

1990 / IEEE
By: Marks, R.; Reeve, G.; Blackburn, D.;

Digital spectra of nonuniformly sampled signals: theories and applications-measuring clock/aperture jitter of an A/D system

1990 / IEEE
By: Jenq, Y.C.;

A simple method for the evaluation of microwave mixer diodes

1990 / IEEE
By: Hansen, C.H.; van Kalleveen, T.H.T.; Zaghloul, H.; Buckmaster, H.A.;

Precision low frequency noise measurement

1990 / IEEE
By: Hamstra, R.H., Jr.;

Digital spectra of non-uniformly sampled signals: theories and applications. IV. Measuring clock/aperture jitter of an A/D system

1990 / IEEE
By: Jenq, Y.C.;

MMIC related metrology at the National Institute of Standards and Technology

1990 / IEEE
By: Marks, R.; Reeve, G.; Blackburn, D.;

Introduction to waveform recorder testing

1990 / IEEE
By: Linnenbrink, T.E.;

Broadband analog performance of laser diodes

1990 / IEEE
By: Trisno, Y.; Achor, H.;

Low-temperature characterization of CMOS devices

1989 / IEEE
By: Viswanathan, C.R.;

Statistical analysis of SSB phase noise test results

1989 / IEEE
By: Zeigler, R.R., Jr.;

Phase noise frequency distribution of SC and AT quartz crystal resonators

1989 / IEEE
By: Bates, N.K.; Weaver, G.L.;

Extended variances and autoregressive/moving average algorithm for the measurement and synthesis of oscillator phase noise

1989 / IEEE
By: Wan, K.-W.; Roberts, J.; Vilar, E.;

Residual phase noise measurements of VHF, UHF, and microwave components

1989 / IEEE
By: Loboda, M.J.; Parker, T.E.; Montress, G.K.;

Ultra low-noise preamplifier for low-frequency noise measurements in electron devices

1991 / IEEE
By: Neri, B.; Saletti, R.; Pellegrini, B.;

Very sensitive measurement method of electron devices current noise

1991 / IEEE
By: Macucci, M.; Pellegrini, B.;

High-resolution analog measurement on mixed signal LSI tester

1989 / IEEE
By: Kishida, A.; Anazawa, K.; Nishimura, H.; Akiyama, K.; Kasuga, N.;

A vector approach for noise parameter fitting and selection of source admittances

1991 / IEEE
By: O'Callaghan, J.M.; Mondal, J.P.;

More on jitter effects on sinewave measurements

1991 / IEEE
By: Wagdy, M.F.; Awad, S.S.;

Measurements of linearity in high density magnetic recording

1988 / IEEE
By: Regelsberger, M.; Varner, J.R.;

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