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Topic: Electric Field Measurement
Results
2012 / IEEE
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
Surface-Charging Analysis of the Radiation Belt Storm Probe and Magnetospheric MultiScale Spacecraft
2012 / IEEEBy: Davis, V.A.; Herrmann, C.; Maurer, R.H.; Davis, G.T.; Brown-Hayes, M.; Baker, N.R.; Mandell, M.J.;
2012 / IEEE
By: Ruscassie, R.; Pecastaing, L.; Smith, I.R.; Banakhr, F.A.; Novac, B.M.; Pignolet, P.; De Ferron, A.S.;
By: Ruscassie, R.; Pecastaing, L.; Smith, I.R.; Banakhr, F.A.; Novac, B.M.; Pignolet, P.; De Ferron, A.S.;
2012 / IEEE
By: Diendorfer, G.; Rubinstein, M.; Rachidi, F.; Shoory, A.; Mosaddeghi, A.; Pavanello, D.; Pichler, H.;
By: Diendorfer, G.; Rubinstein, M.; Rachidi, F.; Shoory, A.; Mosaddeghi, A.; Pavanello, D.; Pichler, H.;
2012 / IEEE
By: Arnaud-Cormos, D.; Jarrige, P.; Kohler, S.; Leveque, P.; Ticaud, N.; Gaborit, G.; Duvillaret, L.; O'Connor, R.P.;
By: Arnaud-Cormos, D.; Jarrige, P.; Kohler, S.; Leveque, P.; Ticaud, N.; Gaborit, G.; Duvillaret, L.; O'Connor, R.P.;
2012 / IEEE
By: Duvillaret, L.; Ticaud, N.; Jarrige, P.; Kohler, S.; Gaborit, G.; Leveque, P.; Arnaud-Cormos, D.; O'Connor, R.P.;
By: Duvillaret, L.; Ticaud, N.; Jarrige, P.; Kohler, S.; Gaborit, G.; Leveque, P.; Arnaud-Cormos, D.; O'Connor, R.P.;
2012 / IEEE
By: Nelson, J.K.; Zepu Wang; Su Zhao; Hillborg, H.; Schadler, L.S.; Linhardt, R.J.; Jianjun Miao;
By: Nelson, J.K.; Zepu Wang; Su Zhao; Hillborg, H.; Schadler, L.S.; Linhardt, R.J.; Jianjun Miao;
2011 / IEEE / 978-1-4244-7355-7
By: Takemura, M.; Ihori, H.; Fujii, M.; Yoshihara, H.; Masuichi, N.;
By: Takemura, M.; Ihori, H.; Fujii, M.; Yoshihara, H.; Masuichi, N.;
2011 / IEEE / 978-1-4577-0811-4
By: Camacho, R.; Sajuyigbe, S.; Yaojiang Zhang; Zhenwei Yu; Mix, J.A.; Jun Fan; Halligan, M.S.; Slattery, K.;
By: Camacho, R.; Sajuyigbe, S.; Yaojiang Zhang; Zhenwei Yu; Mix, J.A.; Jun Fan; Halligan, M.S.; Slattery, K.;
2011 / IEEE / 978-1-4244-7355-7
By: Okubo, H.; Saito, H.; Koide, H.; Kawanishi, K.; Kato, K.; Hayakawa, N.; Kojima, H.;
By: Okubo, H.; Saito, H.; Koide, H.; Kawanishi, K.; Kato, K.; Hayakawa, N.; Kojima, H.;
2011 / IEEE / 978-1-61284-777-1
By: Chunrong Peng; Shanhong Xia; Haiyan Zhang; Xin Guo; Pengfei Yang;
By: Chunrong Peng; Shanhong Xia; Haiyan Zhang; Xin Guo; Pengfei Yang;
2011 / IEEE / 978-1-4244-6051-9
By: Lautru, D.; Aiouaz, O.; Hanna, V.F.; Wiart, J.; Gati, A.; Man-Fai Wong;
By: Lautru, D.; Aiouaz, O.; Hanna, V.F.; Wiart, J.; Gati, A.; Man-Fai Wong;
2011 / IEEE / 978-1-4244-6051-9
By: Koepke, G.; Coder, J.; Gordon, J.A.; Ladbury, J.M.; Holloway, C.L.; Dunlap, C.R.;
By: Koepke, G.; Coder, J.; Gordon, J.A.; Ladbury, J.M.; Holloway, C.L.; Dunlap, C.R.;
2011 / IEEE / 978-1-61284-978-2
By: Stefanelli, R.; Sammali, F.; Liberti, M.; Paffi, A.; Apollonio, F.; Trinchero, D.;
By: Stefanelli, R.; Sammali, F.; Liberti, M.; Paffi, A.; Apollonio, F.; Trinchero, D.;
2011 / IEEE / 978-1-4577-0509-0
By: Ravaro, M.; Barbieri, S.; Sirtori, C.; Santarelli, G.; Gellie, P.;
By: Ravaro, M.; Barbieri, S.; Sirtori, C.; Santarelli, G.; Gellie, P.;
2011 / IEEE / 978-1-4577-1466-5
By: Zhou, H.; Mair, M.; Pichler, H.; Thottappillil, R.; Diendorfer, G.;
By: Zhou, H.; Mair, M.; Pichler, H.; Thottappillil, R.; Diendorfer, G.;
2011 / IEEE / 978-1-4577-0631-8
By: Pecastaing, L.; Smith, I.R.; Novac, B.M.; Banakhr, F.; Pignolet, P.; De Ferron, A.; Ruscassie, R.;
By: Pecastaing, L.; Smith, I.R.; Novac, B.M.; Banakhr, F.; Pignolet, P.; De Ferron, A.; Ruscassie, R.;
2012 / IEEE / 978-1-4577-0920-3
By: Rodrigues, J.C.; Monteiro, J.; Cavalcante, G.P.S.; Frances, C.R.L.; Fraiha, S.C.; Ferreira, A.; Gomes, H.S.; Araujo, J.;
By: Rodrigues, J.C.; Monteiro, J.; Cavalcante, G.P.S.; Frances, C.R.L.; Fraiha, S.C.; Ferreira, A.; Gomes, H.S.; Araujo, J.;
2012 / IEEE / 978-1-4577-1557-0
By: Min Li; Lei Liu; Xiangshi Liu; Rong Zeng; Zhihong Liu; Zhanqing Yu; Ruihai Li;
By: Min Li; Lei Liu; Xiangshi Liu; Rong Zeng; Zhihong Liu; Zhanqing Yu; Ruihai Li;
2012 / IEEE / 978-1-4577-1557-0
By: Yan You-jie; Liu Ying; Li Peng-hui; Chen Jin; Jiang Ting-yong; Liu Xiao-long;
By: Yan You-jie; Liu Ying; Li Peng-hui; Chen Jin; Jiang Ting-yong; Liu Xiao-long;
2012 / IEEE / 978-1-4673-1405-3
By: Lebastard, V.; Gossiaux, P.B.; Boyer, F.; Girin, A.; Chevallereau, C.;
By: Lebastard, V.; Gossiaux, P.B.; Boyer, F.; Girin, A.; Chevallereau, C.;
2012 / IEEE / 978-1-4577-1557-0
By: He Wang-ling; Wan Bao-quan; Pei Chun-ming; Zhang Jian-gong; He Jun-jia;
By: He Wang-ling; Wan Bao-quan; Pei Chun-ming; Zhang Jian-gong; He Jun-jia;
2012 / IEEE / 978-1-4673-0487-0
By: Hayakawa, N.; Kojima, H.; Koide, H.; Kawanishi, K.; Kato, K.; Okubo, H.;
By: Hayakawa, N.; Kojima, H.; Koide, H.; Kawanishi, K.; Kato, K.; Okubo, H.;
2012 / IEEE / 978-1-4673-0442-9
By: Zilberti, L.; Wang, W.; Giordano, D.; Crotti, G.; Chiampi, M.; Bottauscio, O.;
By: Zilberti, L.; Wang, W.; Giordano, D.; Crotti, G.; Chiampi, M.; Bottauscio, O.;
2012 / American Institute of Physics
By: C.-S. Park; D. Avirovik; M. I. Bichurin; V. M. Petrov; S. Priya;
By: C.-S. Park; D. Avirovik; M. I. Bichurin; V. M. Petrov; S. Priya;
2012 / American Institute of Physics
By: Walid A. Hadi; Shamsul Chowdhury; Michael S. Shur; Stephen K. O'Leary;
By: Walid A. Hadi; Shamsul Chowdhury; Michael S. Shur; Stephen K. O'Leary;
2009 / American Institute of Physics
By: J. H. Sun; J. G. Gallacher; G. J. H. Brussaard; N. Lemos; R. Issac; D. A. Jaroszynski; Z. X. Huang; J. M. Dias;
By: J. H. Sun; J. G. Gallacher; G. J. H. Brussaard; N. Lemos; R. Issac; D. A. Jaroszynski; Z. X. Huang; J. M. Dias;
2013 / IEEE
1988 / IEEE
By: Picard, D.; Mostafavi, M.; Jofre, L.; Fine, G.; Estrada, J.P.; Bolomey, J.-C.; Cain, F.L.; Cown, B.J.; Friederich, P.G.;
By: Picard, D.; Mostafavi, M.; Jofre, L.; Fine, G.; Estrada, J.P.; Bolomey, J.-C.; Cain, F.L.; Cown, B.J.; Friederich, P.G.;