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Topic: Dynamic Voltage Frequency Scaling
Results
2011 / IEEE / 978-1-61284-660-6
By: Gonzalez, J.; Qiong Cai; Gonzalez, A.; Chaparro, P.; Magklis, G.;
By: Gonzalez, J.; Qiong Cai; Gonzalez, A.; Chaparro, P.; Magklis, G.;
2011 / IEEE / 978-1-4577-0223-5
By: Amirkhany, A.; Zerbe, J.; Wilson, J.; Palmer, R.; Nhat Nguyen; Lei Luo; Leibowitz, B.; Best, S.; Eble, J.C.;
By: Amirkhany, A.; Zerbe, J.; Wilson, J.; Palmer, R.; Nhat Nguyen; Lei Luo; Leibowitz, B.; Best, S.; Eble, J.C.;
2011 / IEEE / 978-1-4577-0476-5
By: Apodaca, J.; Young, D.; Briceno, L.; Smith, J.; Pasricha, S.; Young Zou; Siegel, H.J.; Bahirat, S.; Khemka, B.; Ramirez, A.; Maciejewski, A.A.;
By: Apodaca, J.; Young, D.; Briceno, L.; Smith, J.; Pasricha, S.; Young Zou; Siegel, H.J.; Bahirat, S.; Khemka, B.; Ramirez, A.; Maciejewski, A.A.;
2006 / IEEE / 0-7803-9759-2
By: Spiga, M.; Acquaviva, A.; Aymerich, F.; Carta, S.; Alimonda, A.; Spiga, M.;
By: Spiga, M.; Acquaviva, A.; Aymerich, F.; Carta, S.; Alimonda, A.; Spiga, M.;
2008 / IEEE / 978-1-4244-3748-1
By: Sassatelli, G.; Benoit, P.; Clermidy, F.; Puschini, D.; Torres, L.;
By: Sassatelli, G.; Benoit, P.; Clermidy, F.; Puschini, D.; Torres, L.;
2009 / IEEE / 978-1-4244-3751-1
By: Labarta, J.; Corbalan, J.; Etinski, M.; Veidenbaum, A.; Valero, M.;
By: Labarta, J.; Corbalan, J.; Etinski, M.; Veidenbaum, A.; Valero, M.;
2010 / IEEE / 978-1-4244-7918-4
By: Shiau, S.; Yao-Tsung Wang; Wei-Hua Teng; Wen-Chieh Kuo; Che-Yuan Tu;
By: Shiau, S.; Yao-Tsung Wang; Wei-Hua Teng; Wen-Chieh Kuo; Che-Yuan Tu;
2011 / IEEE
By: Aseron, P.; Vangal, S.R.; Dighe, S.; Borkar, S.; De, V.K.; Borkar, N.; Kumar, S.; Erraguntla, V.; Tschanz, J.; Howard, J.; Bowman, K.A.; Jacob, T.;
By: Aseron, P.; Vangal, S.R.; Dighe, S.; Borkar, S.; De, V.K.; Borkar, N.; Kumar, S.; Erraguntla, V.; Tschanz, J.; Howard, J.; Bowman, K.A.; Jacob, T.;
2011 / IEEE
By: Borkar, N.; Jain, S.; Vangal, S.R.; Dighe, S.; Howard, J.; Van Der Wijngaart, R.; De, V.K.; Borkar, S.; Steibl, S.; Lund-Larsen, T.; Ruhl, G.; Droege, G.; Gries, M.; Riepen, M.; Konow, M.; Erraguntla, V.;
By: Borkar, N.; Jain, S.; Vangal, S.R.; Dighe, S.; Howard, J.; Van Der Wijngaart, R.; De, V.K.; Borkar, S.; Steibl, S.; Lund-Larsen, T.; Ruhl, G.; Droege, G.; Gries, M.; Riepen, M.; Konow, M.; Erraguntla, V.;
2011 / IEEE / 978-1-4244-8499-7
By: Koppanalil, J.; Hawkins, C.; Householder, S.; O'Driscoll, D.; Yeung, G.;
By: Koppanalil, J.; Hawkins, C.; Householder, S.; O'Driscoll, D.; Yeung, G.;