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Topic: Double-balanced Mixer
Results
1988 / IEEE
By: Nambu, S.; Yamashita, Y.; Kanno, I.; Tambo, T.; Sakashita, S.; Ozeki, H.; Nakatsuka, T.;
By: Nambu, S.; Yamashita, Y.; Kanno, I.; Tambo, T.; Sakashita, S.; Ozeki, H.; Nakatsuka, T.;
1993 / IEEE / 0-7803-1393-3
By: Kobayashi, K.W.; Rosen, M.; Streit, D.C.; Velebir, J.R.; Oki, A.K.; Bui, S.; Tran, L.T.;
By: Kobayashi, K.W.; Rosen, M.; Streit, D.C.; Velebir, J.R.; Oki, A.K.; Bui, S.; Tran, L.T.;
2004 / IEEE / 0-7803-8333-8
By: Scholtz, A.L.; Simburger, W.; Bock, T.F.; Meister, T.F.; Perndl, W.; Aufinger, K.; Wurzer, M.; Knapp, H.;
By: Scholtz, A.L.; Simburger, W.; Bock, T.F.; Meister, T.F.; Perndl, W.; Aufinger, K.; Wurzer, M.; Knapp, H.;
2004 / IEEE / 0-7803-8511-X
By: Aufinger, K.; Bock, J.; Sandner, C.; Scholtz, Al.; Wurzer, M.; Wohlmuth, H.D.; Tiebout, M.; Thuringer, R.; Stengl, R.; Schreiter, R.; Simburger, W.; Schafer, H.; Rest, M.; Perndl, W.; Meister, T.F.; Knapp, H.; Kienmayer, C.; Kehrer, D.; Boguth, S.;
By: Aufinger, K.; Bock, J.; Sandner, C.; Scholtz, Al.; Wurzer, M.; Wohlmuth, H.D.; Tiebout, M.; Thuringer, R.; Stengl, R.; Schreiter, R.; Simburger, W.; Schafer, H.; Rest, M.; Perndl, W.; Meister, T.F.; Knapp, H.; Kienmayer, C.; Kehrer, D.; Boguth, S.;
2006 / IEEE / 0-7803-9572-7
By: Wohlmuth, H.-D.; Dehlink, B.; Scholtz, A.L.; Bock, J.; Meister, T.F.; Aufinger, K.; Trotta, S.; Knapp, H.; Forstner, H.-R.;
By: Wohlmuth, H.-D.; Dehlink, B.; Scholtz, A.L.; Bock, J.; Meister, T.F.; Aufinger, K.; Trotta, S.; Knapp, H.; Forstner, H.-R.;
2006 / IEEE / 0-7803-9389-9
By: Pens Gao; Xueqing Hu; Oimins Xu; Jaeser, R.C.; Dai, F.F.; Shi Yin; Jun Yan;
By: Pens Gao; Xueqing Hu; Oimins Xu; Jaeser, R.C.; Dai, F.F.; Shi Yin; Jun Yan;
2006 / IEEE / 0-7803-9541-7
By: Ohata, K.; Morimoto, T.; Kishimoto, S.; Ito, M.; Maruhashi, K.; Hamada, Y.;
By: Ohata, K.; Morimoto, T.; Kishimoto, S.; Ito, M.; Maruhashi, K.; Hamada, Y.;
2007 / IEEE / 1-4244-1448-2
By: Moldovan, E.; Boukari, B.; Tatu, S.O.; Bosisio, R.G.; Ke Wu; Affes, S.;
By: Moldovan, E.; Boukari, B.; Tatu, S.O.; Bosisio, R.G.; Ke Wu; Affes, S.;
2008 / IEEE
By: Bumman Kim; Sekyeong Lee; Hyejeong Song; Jinho Yang; Changjoon Park; Huijung Kim; Jehyung Yoon;
By: Bumman Kim; Sekyeong Lee; Hyejeong Song; Jinho Yang; Changjoon Park; Huijung Kim; Jehyung Yoon;
2008 / IEEE / 978-1-4244-1940-1
By: Skafidas, E.; Zhang, F.; Liu, Z.; Wicks, B.N.; Yang, B.; Shieh, W.;
By: Skafidas, E.; Zhang, F.; Liu, Z.; Wicks, B.N.; Yang, B.; Shieh, W.;
2010 / IEEE / 978-1-4244-7449-3
By: Essing, J.; Janssen, E.; Sakian, P.; van Roermund, A.; Mahmoudi, R.;
By: Essing, J.; Janssen, E.; Sakian, P.; van Roermund, A.; Mahmoudi, R.;
2011 / IEEE / 978-1-4244-8292-4
By: He Qian; Zhiping Yu; Yan Wang; Li Zhang; Lei Zhang; Chunyuan Zhou;
By: He Qian; Zhiping Yu; Yan Wang; Li Zhang; Lei Zhang; Chunyuan Zhou;