Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Dielectrics
Results
2011 / IEEE
By: Jung Hwan Yum; Bersuker, G.; Akyol, T.; Ferrer, D.A.; Lei, M.; Keun Woo Park; Banerjee, S.K.; Downer, M.C.; Bielawski, C.W.; Yu, E.T.; Price, J.; Lee, J.C.; Hudnall, T.W.;
By: Jung Hwan Yum; Bersuker, G.; Akyol, T.; Ferrer, D.A.; Lei, M.; Keun Woo Park; Banerjee, S.K.; Downer, M.C.; Bielawski, C.W.; Yu, E.T.; Price, J.; Lee, J.C.; Hudnall, T.W.;
2011 / IEEE
By: Kudo, H.; Nara, Y.; Kitada, H.; Owada, T.; Sakai, H.; Haneda, M.; Ochimizu, H.; Sunayama, M.; Tabira, T.; Ohtsuka, N.;
By: Kudo, H.; Nara, Y.; Kitada, H.; Owada, T.; Sakai, H.; Haneda, M.; Ochimizu, H.; Sunayama, M.; Tabira, T.; Ohtsuka, N.;
2011 / IEEE
By: Kapoor, A.; Upadhyaya, V.; Tate, K.; Das, A.; Chia-Wei Chen; Upadhyaya, A.; Jiun-Hong Lai; Ramanathan, S.; Rohatgi, A.;
By: Kapoor, A.; Upadhyaya, V.; Tate, K.; Das, A.; Chia-Wei Chen; Upadhyaya, A.; Jiun-Hong Lai; Ramanathan, S.; Rohatgi, A.;
2011 / IEEE
By: Lee, V.; Jaesik Lee; Hong Yu Li; Seetoh, J.; Yen Chen Yeo; Shan Gao; Keng Hwa Teo; Guan Kian Lau;
By: Lee, V.; Jaesik Lee; Hong Yu Li; Seetoh, J.; Yen Chen Yeo; Shan Gao; Keng Hwa Teo; Guan Kian Lau;
2011 / IEEE
By: Lang, K.-D.; Reichl, H.; Guttowski, S.; Lobbicke, K.; Curran, B.; Ndip, I.; Henke, H.;
By: Lang, K.-D.; Reichl, H.; Guttowski, S.; Lobbicke, K.; Curran, B.; Ndip, I.; Henke, H.;
2011 / IEEE
By: Osaklang, S.; Siritaratiwat, A.; Kaewrawang, A.; Ungvichian, V.; Supnithi, P.; Sivaratana, R.; Kruesubthaworn, A.;
By: Osaklang, S.; Siritaratiwat, A.; Kaewrawang, A.; Ungvichian, V.; Supnithi, P.; Sivaratana, R.; Kruesubthaworn, A.;
2011 / IEEE
By: Chun-zao Li; Xue-yong Zhang; Bo-rui Bian; Hai-feng Zhang; Xiang-kun Kong; Shao-bin Liu;
By: Chun-zao Li; Xue-yong Zhang; Bo-rui Bian; Hai-feng Zhang; Xiang-kun Kong; Shao-bin Liu;
2011 / IEEE
By: Black, E.; Chabalko, M.; Yunchuan Kong; Yi Luo; Schlesinger, T.E.; Bain, J.A.; Powell, S.;
By: Black, E.; Chabalko, M.; Yunchuan Kong; Yi Luo; Schlesinger, T.E.; Bain, J.A.; Powell, S.;
2011 / IEEE
By: Madan, H.; Ali, A.; Datta, S.; Lindemuth, J.; Agrawal, A.; Bennett, B.R.; Boos, J.B.; Misra, R.; Ramirez, I.;
By: Madan, H.; Ali, A.; Datta, S.; Lindemuth, J.; Agrawal, A.; Bennett, B.R.; Boos, J.B.; Misra, R.; Ramirez, I.;
2011 / IEEE
By: Kwang-Ting Cheng; Someya, T.; Yamamoto, T.; Kuwabara, H.; Ikeda, M.; Klauk, H.; Takimiya, K.; Zschieschang, U.; Sakurai, T.; Huang, T.; Kuribara, K.; Yokota, T.; Sekitani, T.; Fukuda, K.;
By: Kwang-Ting Cheng; Someya, T.; Yamamoto, T.; Kuwabara, H.; Ikeda, M.; Klauk, H.; Takimiya, K.; Zschieschang, U.; Sakurai, T.; Huang, T.; Kuribara, K.; Yokota, T.; Sekitani, T.; Fukuda, K.;
2011 / IEEE
By: Chi-Yen Huang; Chie-Tong Kuo; I-Min Jiang; Ru-Hsien Chiang; Cheng-Hsiung Chen; Chi-Huang Lin;
By: Chi-Yen Huang; Chie-Tong Kuo; I-Min Jiang; Ru-Hsien Chiang; Cheng-Hsiung Chen; Chi-Huang Lin;
2011 / IEEE
By: Taniguchi, T.; Watanabe, K.; Hsu, A.; Taychatanapat, T.; Han Wang; Palacios, T.; Jarillo-Herrero, P.;
By: Taniguchi, T.; Watanabe, K.; Hsu, A.; Taychatanapat, T.; Han Wang; Palacios, T.; Jarillo-Herrero, P.;
2011 / IEEE
By: Titov, V.V.; Malitskaya, M.A.; Zakharov, Y.N.; Raevskaya, S.I.; Kubrin, S.P.; Zakharchenko, I.N.; Lutokhin, A.G.; Raevski, I.P.; Sitalo, E.I.; Blazhevich, A.V.;
By: Titov, V.V.; Malitskaya, M.A.; Zakharov, Y.N.; Raevskaya, S.I.; Kubrin, S.P.; Zakharchenko, I.N.; Lutokhin, A.G.; Raevski, I.P.; Sitalo, E.I.; Blazhevich, A.V.;
2012 / IEEE
By: Liberti, M.; Apollonio, F.; d'Inzeo, G.; Casciola, M.; Paffi, A.; Denzi, A.; Merla, C.;
By: Liberti, M.; Apollonio, F.; d'Inzeo, G.; Casciola, M.; Paffi, A.; Denzi, A.; Merla, C.;
2011 / IEEE
By: Haixia Wang; Bhushan, B.; Papaioannou, G.J.; Zaghloul, U.; Plana, R.; Pons, P.; Coccetti, F.;
By: Haixia Wang; Bhushan, B.; Papaioannou, G.J.; Zaghloul, U.; Plana, R.; Pons, P.; Coccetti, F.;
2012 / IEEE
By: Franc, A.-L.; Xiao-Lan Tang; Fournier, J.; Ferrari, P.; Vincent, P.; Siligaris, A.; Pistono, E.;
By: Franc, A.-L.; Xiao-Lan Tang; Fournier, J.; Ferrari, P.; Vincent, P.; Siligaris, A.; Pistono, E.;
2012 / IEEE
By: Gvozdev, A.K.; Semenov, V.E.; Zaitsev, N.I.; Zharova, N.A.; Sorokin, A.A.; Puech, J.; Rasch, J.; Lisak, M.;
By: Gvozdev, A.K.; Semenov, V.E.; Zaitsev, N.I.; Zharova, N.A.; Sorokin, A.A.; Puech, J.; Rasch, J.; Lisak, M.;
Effects of Dielectric Barrier Discharge Treatment Conditions on the Uprightness of Carbon Nanofibers
2012 / IEEEBy: Takikawa, H.; Tanoue, H.; Suda, Y.; Sugioka, Y.; Umeda, Y.; Shimizu, K.; Ue, H.;
2011 / IEEE
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;
2012 / IEEE
By: Khaderbad, M.A.; Pandharipande, R.; Ramgopal Rao, V.; Madhu, S.; Ravikanth, M.; Singh, V.;
By: Khaderbad, M.A.; Pandharipande, R.; Ramgopal Rao, V.; Madhu, S.; Ravikanth, M.; Singh, V.;
2012 / IEEE
By: O'uchi, S.; Liu, Y.; Matsukawa, T.; Masahara, M.; Sakamoto, K.; Mizubayashi, W.; Endo, K.; Morita, Y.; Migita, S.; Ota, H.; Ishikawa, Y.; Yamauchi, H.; Tsukada, J.;
By: O'uchi, S.; Liu, Y.; Matsukawa, T.; Masahara, M.; Sakamoto, K.; Mizubayashi, W.; Endo, K.; Morita, Y.; Migita, S.; Ota, H.; Ishikawa, Y.; Yamauchi, H.; Tsukada, J.;