Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Dielectric Measurement
Results
2012 / IEEE
By: Weber, M.J.; Willis, K.J.; Katz, S.L.; Yang, B.B.; Booske, J.H.; Hagness, S.C.; Knezevic, I.;
By: Weber, M.J.; Willis, K.J.; Katz, S.L.; Yang, B.B.; Booske, J.H.; Hagness, S.C.; Knezevic, I.;
2011 / IEEE / 978-1-4577-0035-4
By: Ruwansiri, W.A.T.; Dayawansa, I.J.; Senarathna, D.M.M.J.; Kulasekere, E.C.;
By: Ruwansiri, W.A.T.; Dayawansa, I.J.; Senarathna, D.M.M.J.; Kulasekere, E.C.;
2011 / IEEE / 978-1-4577-1025-4
By: Panagopoulou, A.; Kyritsis, A.; Shinyashiki, N.; Gomez Ribelles, J.L.; i Serra, R.S.; Pissis, P.;
By: Panagopoulou, A.; Kyritsis, A.; Shinyashiki, N.; Gomez Ribelles, J.L.; i Serra, R.S.; Pissis, P.;
2011 / IEEE / 978-2-87487-022-4
By: Baldi, G.; Ravagli, C.; Chiellini, F.; Piras, A.M.; Semenov, S.; Lai, K.T.;
By: Baldi, G.; Ravagli, C.; Chiellini, F.; Piras, A.M.; Semenov, S.; Lai, K.T.;
2012 / IEEE / 978-1-4673-1653-8
By: Ursache, S.; Niagu, A.; Scarlatache, V.; Olariu, M.; Ciobanu, R.C.;
By: Ursache, S.; Niagu, A.; Scarlatache, V.; Olariu, M.; Ciobanu, R.C.;
2012 / IEEE
By: Ohashi, Yuji; Adachi, Masatoshi; Lv, Tao; Karakai, Tomoaki; Kushibiki, Jun-ichi; Arakawa, Mototaka; Yoshida, Hitoshi;
By: Ohashi, Yuji; Adachi, Masatoshi; Lv, Tao; Karakai, Tomoaki; Kushibiki, Jun-ichi; Arakawa, Mototaka; Yoshida, Hitoshi;
2007 / American Institute of Physics
By: S. Bauer-Gogonea; F. Camacho-Gonzalez; R. Schwödiauer; B. Ploss; S. Bauer;
By: S. Bauer-Gogonea; F. Camacho-Gonzalez; R. Schwödiauer; B. Ploss; S. Bauer;
2006 / American Institute of Physics
By: Emmanuel Defaÿ; Christophe Zinck; Christophe Malhaire; Nicolas Baboux; Daniel Barbier;
By: Emmanuel Defaÿ; Christophe Zinck; Christophe Malhaire; Nicolas Baboux; Daniel Barbier;
2014 / IEEE
By: Hanham, Stephen M.; Klein, Norbert; Lucyszyn, Stepan; Otter, William J.; Shatorost, Olena; Watts, Clare; Basey-Fisher, Toby H.;
By: Hanham, Stephen M.; Klein, Norbert; Lucyszyn, Stepan; Otter, William J.; Shatorost, Olena; Watts, Clare; Basey-Fisher, Toby H.;
Measurement of complex permittivity by rectangular waveguide method with simple specimen preparation
2014 / IEEEBy: Hoang, T. Q. V.; Phan, H. P.; Hoang, M. H.; Nguyen, V. H.; Vuong, T. P.;
2014 / IEEE
By: Gregory, A P; Blackburn, J F; Lees, K; Clarke, R N; Hodgetts, T E; Hanham, S M; Klein, N;
By: Gregory, A P; Blackburn, J F; Lees, K; Clarke, R N; Hodgetts, T E; Hanham, S M; Klein, N;
Material Characterization of Arbitrarily Shaped Dielectrics Based on Reflected Pulse Characteristics
2015 / IEEEBy: Tan, A. E.-C.; Chan, K. M. M.; Rambabu, K.; Li, L.;
2014 / IEEE
By: Gaborit, G.; Duvillaret, L.; Volat, C.; Duraz, E.; Dahdah, J.; Lecoche, F.; Jarrige, P.;
By: Gaborit, G.; Duvillaret, L.; Volat, C.; Duraz, E.; Dahdah, J.; Lecoche, F.; Jarrige, P.;
2013 / IEEE
By: Notzon, Gordon; Baer, Christoph; Musch, Thomas; Rolfes, Ilona; Will, Bianca; Schulz, Christian; Dahl, Christoph;
By: Notzon, Gordon; Baer, Christoph; Musch, Thomas; Rolfes, Ilona; Will, Bianca; Schulz, Christian; Dahl, Christoph;
2014 / IEEE
By: Yakimenko, Y.; Machulyansky, A.; Borisova, A.; Savinov, M.; Kempa, M.; Bovtun, V.; Bondar, B.;
By: Yakimenko, Y.; Machulyansky, A.; Borisova, A.; Savinov, M.; Kempa, M.; Bovtun, V.; Bondar, B.;