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Topic: Diamond
Results
2012 / IEEE
By: Khaderbad, M.A.; Pandharipande, R.; Ramgopal Rao, V.; Madhu, S.; Ravikanth, M.; Singh, V.;
By: Khaderbad, M.A.; Pandharipande, R.; Ramgopal Rao, V.; Madhu, S.; Ravikanth, M.; Singh, V.;
2012 / IEEE
By: Pillon, M.; Milani, E.; Marinelli, M.; Magrin, G.; Prestopino, G.; Rollet, S.; Verona-Rinati, G.; Angelone, M.; Verona, C.;
By: Pillon, M.; Milani, E.; Marinelli, M.; Magrin, G.; Prestopino, G.; Rollet, S.; Verona-Rinati, G.; Angelone, M.; Verona, C.;
2012 / IEEE
By: Prawer, S.; Jamieson, D.; Reinhard, M.I.; Prokopovich, D.A.; Lerch, M.L.F.; Siegele, R.N.; Livingstone, J.; Petasecca, M.; Guatelli, S.; Alves, A.D.C.; Ganesan, K.; Davis, J.A.; Rosenfeld, A.B.; Zaider, M.; Ziegler, J.; Dicello, J.F.; Pisacane, V.L.; Kuncic, Z.;
By: Prawer, S.; Jamieson, D.; Reinhard, M.I.; Prokopovich, D.A.; Lerch, M.L.F.; Siegele, R.N.; Livingstone, J.; Petasecca, M.; Guatelli, S.; Alves, A.D.C.; Ganesan, K.; Davis, J.A.; Rosenfeld, A.B.; Zaider, M.; Ziegler, J.; Dicello, J.F.; Pisacane, V.L.; Kuncic, Z.;
2012 / IEEE
By: Anderson, T.J.; Tadjer, M.J.; Melngailis, J.; Pate, B.; Feygelson, T.I.; Hobart, K.D.; Kub, F.J.; Eddy, C.R.; Caldwell, J.D.; Butler, J.E.;
By: Anderson, T.J.; Tadjer, M.J.; Melngailis, J.; Pate, B.; Feygelson, T.I.; Hobart, K.D.; Kub, F.J.; Eddy, C.R.; Caldwell, J.D.; Butler, J.E.;
2012 / IEEE
By: Trucchi, D.M.; Conte, G.; Allegrini, P.; Girolami, M.; Salvatori, S.; Ralchenko, V.G.;
By: Trucchi, D.M.; Conte, G.; Allegrini, P.; Girolami, M.; Salvatori, S.; Ralchenko, V.G.;
2012 / IEEE
By: Carpick, R.W.; Turner, K.T.; Jingjing Liu; Grierson, D.S.; Vahdat, V.; Moldovan, N.; Jacobs, T.D.B.; Carlisle, J.A.; Hongjun Zeng; Zhenting Dai;
By: Carpick, R.W.; Turner, K.T.; Jingjing Liu; Grierson, D.S.; Vahdat, V.; Moldovan, N.; Jacobs, T.D.B.; Carlisle, J.A.; Hongjun Zeng; Zhenting Dai;
2009 / IEEE / 978-1-4577-0493-2
By: Kang, W.P.; Davidson, J.L.; Galloway, K.F.; Holmes-Siedle, A.G.; Basu, P.K.;
By: Kang, W.P.; Davidson, J.L.; Galloway, K.F.; Holmes-Siedle, A.G.; Basu, P.K.;
2011 / IEEE / 978-1-4577-1226-5
By: Bergmann, R.B.; Falldorf, C.; Dankwart, C.; Glabe, R.; Meier, A.;
By: Bergmann, R.B.; Falldorf, C.; Dankwart, C.; Glabe, R.; Meier, A.;
2011 / IEEE / 978-1-61284-244-8
By: McLelland, H.; Fox, O.J.L.; Moran, D.A.J.; May, P.W.; Russell, S.;
By: McLelland, H.; Fox, O.J.L.; Moran, D.A.J.; May, P.W.; Russell, S.;
2011 / IEEE / 978-3-00-035081-8
By: Kudo, Y.; Saito, I.; Okano, K.; Takahashi, I.; Yamada, T.; Onishi, M.; Kato, R.; Masuzawa, T.; Miyazaki, W.;
By: Kudo, Y.; Saito, I.; Okano, K.; Takahashi, I.; Yamada, T.; Onishi, M.; Kato, R.; Masuzawa, T.; Miyazaki, W.;
2011 / IEEE / 978-3-00-035081-8
By: Pate, B.B.; Jensen, K.L.; Yater, J.E.; Wood, F.N.; Hanna, J.M.; Butler, J.E.; Shaw, J.L.; Feygelson, T.I.;
By: Pate, B.B.; Jensen, K.L.; Yater, J.E.; Wood, F.N.; Hanna, J.M.; Butler, J.E.; Shaw, J.L.; Feygelson, T.I.;
2011 / IEEE / 978-3-00-035081-8
By: Hasegawa, M.; Yamada, T.; Nebel, C.E.; Okano, K.; Masuzawa, T.; Kudo, Y.;
By: Hasegawa, M.; Yamada, T.; Nebel, C.E.; Okano, K.; Masuzawa, T.; Kudo, Y.;
2011 / IEEE / 978-1-4577-0509-0
By: Oda, Y.; Kajiwara, K.; Takahashi, K.; Schreck, S.; Sakamoto, K.; Meier, A.; Scherer, T.A.; Strauss, D.; Saibene, G.;
By: Oda, Y.; Kajiwara, K.; Takahashi, K.; Schreck, S.; Sakamoto, K.; Meier, A.; Scherer, T.A.; Strauss, D.; Saibene, G.;
2011 / IEEE / 978-2-35500-015-7
By: Bergonzo, P.; Scorsone, E.; Yvert, B.; Rousseau, L.; Picaud, S.; Bendali, A.; Bongrain, A.; Lissorgues, G.;
By: Bergonzo, P.; Scorsone, E.; Yvert, B.; Rousseau, L.; Picaud, S.; Bendali, A.; Bongrain, A.; Lissorgues, G.;
2011 / IEEE / 978-1-4577-1516-7
By: Jiang, G.; Yueh-Chieh Chu; Yonhua Tzeng; Hsin-Le Lee; Jyh-Ming Ting; Chi Chang;
By: Jiang, G.; Yueh-Chieh Chu; Yonhua Tzeng; Hsin-Le Lee; Jyh-Ming Ting; Chi Chang;
2011 / IEEE / 978-0-9775657-8-8
By: Johnston, B.F.; Sabella, A.; Kitzler, O.; Mildren, R.P.; McKay, A.;
By: Johnston, B.F.; Sabella, A.; Kitzler, O.; Mildren, R.P.; McKay, A.;
2012 / IEEE / 978-1-4673-0325-5
By: Lin, L.; Najar, H.; Xie, J.; Reyes, C.; Yamazaki, K.; Chan, M.L.; Fonda, P.; Horsley, D.A.;
By: Lin, L.; Najar, H.; Xie, J.; Reyes, C.; Yamazaki, K.; Chan, M.L.; Fonda, P.; Horsley, D.A.;
2011 / IEEE / 978-0-9775657-8-8
By: Gaebel, T.; Inam, F.A.; Rabeau, J.R.; Steel, M.J.; Bradac, C.; Dawes, J.M.; Withford, M.J.; Stewart, L.;
By: Gaebel, T.; Inam, F.A.; Rabeau, J.R.; Steel, M.J.; Bradac, C.; Dawes, J.M.; Withford, M.J.; Stewart, L.;
2011 / IEEE / 978-0-9775657-8-8
By: Connor, M.; Goodchild, A.; Stremovskiy, O.A.; Keif, T.A.; Deyev, S.M.; Sreenivasan, V.K.A.; Ivukina, E.A.; Zvyagin, A.V.;
By: Connor, M.; Goodchild, A.; Stremovskiy, O.A.; Keif, T.A.; Deyev, S.M.; Sreenivasan, V.K.A.; Ivukina, E.A.; Zvyagin, A.V.;
2011 / IEEE / 978-0-9775657-8-8
By: Orwa, J.O.; Afshar, V.S.; Henderson, M.R.; Kuan, K.; Ebendorff-Heidepriem, H.; Aharonovich, I.; Gibson, B.C.; Greentree, A.D.; Monro, T.M.; Prawer, S.; Tomljenovic-Hanic, S.;
By: Orwa, J.O.; Afshar, V.S.; Henderson, M.R.; Kuan, K.; Ebendorff-Heidepriem, H.; Aharonovich, I.; Gibson, B.C.; Greentree, A.D.; Monro, T.M.; Prawer, S.; Tomljenovic-Hanic, S.;
2012 / IEEE / 978-3-8007-3414-6
By: Matsumoto, K.; Goicochea, J.; Zuercher, J.; Michel, B.; Brunschwiler, T.;
By: Matsumoto, K.; Goicochea, J.; Zuercher, J.; Michel, B.; Brunschwiler, T.;
2011 / IEEE / 978-1-4577-1982-0
By: Khosravian, N.; Beng Kang Tay; Baillargeat, D.; Shakerzadeh, M.; Guan Chee Loh; Samani, M.K.;
By: Khosravian, N.; Beng Kang Tay; Baillargeat, D.; Shakerzadeh, M.; Guan Chee Loh; Samani, M.K.;
2011 / IEEE / 978-1-4577-0631-8
By: Fowler, W.E.; Stygar, W.A.; LeChien, K.R.; Stoltzfus, B.S.; Madrid, E.A.; Mazarakis, M.G.; Savage, M.E.; Rose, D.V.; Miller, C.L.;
By: Fowler, W.E.; Stygar, W.A.; LeChien, K.R.; Stoltzfus, B.S.; Madrid, E.A.; Mazarakis, M.G.; Savage, M.E.; Rose, D.V.; Miller, C.L.;
2011 / IEEE / 978-0-9775657-8-8
By: Nemec, M.; Sulc, J.; Jelinkova, H.; Kitzler, O.; Jelinek, M.; Kubecek, V.;
By: Nemec, M.; Sulc, J.; Jelinkova, H.; Kitzler, O.; Jelinek, M.; Kubecek, V.;
2011 / IEEE / 978-0-9775657-8-8
By: Hollenberg, L.C.L.; Scholten, R.E.; Caruso, F.; Wrachtrup, J.; Mulvaney, P.; Prawer, S.; Maclaurin, D.; Hall, L.T.; Simpson, D.A.; Stacey, A.; Yan, Y.; McGuinness, L.P.;
By: Hollenberg, L.C.L.; Scholten, R.E.; Caruso, F.; Wrachtrup, J.; Mulvaney, P.; Prawer, S.; Maclaurin, D.; Hall, L.T.; Simpson, D.A.; Stacey, A.; Yan, Y.; McGuinness, L.P.;
2012 / IEEE / 978-1-4244-9532-0
By: Goodson, K.E.; Asheghi, M.; Faili, F.; Ejeckam, F.; Jungwan Cho; Francis, D.; Kodama, T.; Bozorg-Grayeli, E.; Zijian Li;
By: Goodson, K.E.; Asheghi, M.; Faili, F.; Ejeckam, F.; Jungwan Cho; Francis, D.; Kodama, T.; Bozorg-Grayeli, E.; Zijian Li;
2012 / IEEE / 978-1-4244-9532-0
By: Bozorg-Grayeli, E.; Goodson, K.E.; Asheghi, M.; Gambin, V.; Zijian Li;
By: Bozorg-Grayeli, E.; Goodson, K.E.; Asheghi, M.; Gambin, V.; Zijian Li;
2012 / IEEE / 978-1-4673-2229-4
By: Santoro, C.; Beausoleil, R.G.; Acosta, V.; Hoffman, A.; Ganesan, K.; Stacey, A.; Simpson, D.; Lau, D.; Greentree, A.D.; Gibson, B.C.; Tomljenovic-Hanic, S.; Karle, T.J.; Zhihong Huang; Prawer, S.;
By: Santoro, C.; Beausoleil, R.G.; Acosta, V.; Hoffman, A.; Ganesan, K.; Stacey, A.; Simpson, D.; Lau, D.; Greentree, A.D.; Gibson, B.C.; Tomljenovic-Hanic, S.; Karle, T.J.; Zhihong Huang; Prawer, S.;
2012 / IEEE / 978-1-4673-0369-9
By: Yater, Joan E.; Shaw, Jonathan L.; Jensen, Kevin L.; Wood, Frank; Hanna, Jeremy; Feygelson, Tatyana; Pate, Bradford B.;
By: Yater, Joan E.; Shaw, Jonathan L.; Jensen, Kevin L.; Wood, Frank; Hanna, Jeremy; Feygelson, Tatyana; Pate, Bradford B.;
2012 / IEEE / 978-1-4673-0369-9
By: Shaw, Jonathan L.; Feigelson, Tatyana; Myers, Robert E.; Hanna, Jeremy M.; Pate, Bradford B.; Jensen, Kevin L.; Yater, Joan E.; Wood, Franklin N.;
By: Shaw, Jonathan L.; Feigelson, Tatyana; Myers, Robert E.; Hanna, Jeremy M.; Pate, Bradford B.; Jensen, Kevin L.; Yater, Joan E.; Wood, Franklin N.;
2012 / IEEE
By: Harmand, J.-C.; Galopin, E.; Sirbu, A.; Kapon, E.; Mereuta, A.; Decobert, J.; Ferlazzo, L.; Bouchoule, S.; Zhuang Zhao; Oudar, J.-L.;
By: Harmand, J.-C.; Galopin, E.; Sirbu, A.; Kapon, E.; Mereuta, A.; Decobert, J.; Ferlazzo, L.; Bouchoule, S.; Zhuang Zhao; Oudar, J.-L.;
2013 / IEEE
By: Orlanducci, Silvia; Cianchetta, Ilaria; Terranova, Maria Letizia; Guglielmotti, Valeria; Tamburri, Emanuela;
By: Orlanducci, Silvia; Cianchetta, Ilaria; Terranova, Maria Letizia; Guglielmotti, Valeria; Tamburri, Emanuela;
The potential application of ultra-nanocrystalline diamond films for heavy ion irradiation detection
2012 / American Institute of PhysicsBy: Huang-Chin Chen; Shih-Show Chen; Wei-Cheng Wang; Chi-Young Lee; Jinghua Guo; I-Nan Lin; Ching-Lin Chang;
The potential application of ultra-nanocrystalline diamond films for heavy ion irradiation detection
2012 / American Institute of PhysicsBy: Huang-Chin Chen; Shih-Show Chen; Wei-Cheng Wang; Chi-Young Lee; Jinghua Guo; I-Nan Lin; Ching-Lin Chang;
2012 / American Institute of Physics
By: S. Antipov; C. Jing; A. Kanareykin; J. E. Butler; V. Yakimenko; M. Fedurin; K. Kusche; W. Gai;
By: S. Antipov; C. Jing; A. Kanareykin; J. E. Butler; V. Yakimenko; M. Fedurin; K. Kusche; W. Gai;
2012 / American Institute of Physics
By: M.-A. Pinault-Thaury; B. Berini; I. Stenger; E. Chikoidze; A. Lusson; F. Jomard; J. Chevallier; J. Barjon;
By: M.-A. Pinault-Thaury; B. Berini; I. Stenger; E. Chikoidze; A. Lusson; F. Jomard; J. Chevallier; J. Barjon;
2012 / American Institute of Physics
By: P. Ovartchaiyapong; L. M. A. Pascal; B. A. Myers; P. Lauria; A. C. Bleszynski Jayich;
By: P. Ovartchaiyapong; L. M. A. Pascal; B. A. Myers; P. Lauria; A. C. Bleszynski Jayich;
2012 / American Institute of Physics
By: X. Checoury; D. Néel; P. Boucaud; C. Gesset; H. Girard; S. Saada; P. Bergonzo;
By: X. Checoury; D. Néel; P. Boucaud; C. Gesset; H. Girard; S. Saada; P. Bergonzo;
2012 / American Institute of Physics
By: Kenichi Ohno; F. Joseph Heremans; Lee C. Bassett; Bryan A. Myers; David M. Toyli; Ania C. Bleszynski Jayich; Christopher J. Palmstrøm; David D. Awschalom;
By: Kenichi Ohno; F. Joseph Heremans; Lee C. Bassett; Bryan A. Myers; David M. Toyli; Ania C. Bleszynski Jayich; Christopher J. Palmstrøm; David D. Awschalom;
2013 / American Institute of Physics
By: Xiang-Dong Chen; Chang-Ling Zou; Fang-Wen Sun; Guang-Can Guo;
By: Xiang-Dong Chen; Chang-Ling Zou; Fang-Wen Sun; Guang-Can Guo;
2006 / American Institute of Physics
By: Nobuteru Tsubouchi; Masahiko Ogura; Yuji Horino; Hideyo Okushi;
By: Nobuteru Tsubouchi; Masahiko Ogura; Yuji Horino; Hideyo Okushi;
2008 / American Institute of Physics
By: Kunie Ishioka; Muneaki Hase; Masahiro Kitajima; Hrvoje Petek;
By: Kunie Ishioka; Muneaki Hase; Masahiro Kitajima; Hrvoje Petek;
2006 / American Institute of Physics
By: Kunie Ishioka; Muneaki Hase; Masahiro Kitajima; Hrvoje Petek;
By: Kunie Ishioka; Muneaki Hase; Masahiro Kitajima; Hrvoje Petek;
2006 / American Institute of Physics
By: J. Barjon; J. Chevallier; F. Jomard; C. Baron; A. Deneuville;
By: J. Barjon; J. Chevallier; F. Jomard; C. Baron; A. Deneuville;
2007 / American Institute of Physics
By: A. Lohstroh; P. J. Sellin; S. G. Wang; A. W. Davies; J. Parkin; R. W. Martin; P. R. Edwards;
By: A. Lohstroh; P. J. Sellin; S. G. Wang; A. W. Davies; J. Parkin; R. W. Martin; P. R. Edwards;
2007 / American Institute of Physics
By: Z. L. Wang; J. J. Li; Z. H. Sun; Y. L. Li; Q. Luo; C. Z. Gu; Z. Cui;
By: Z. L. Wang; J. J. Li; Z. H. Sun; Y. L. Li; Q. Luo; C. Z. Gu; Z. Cui;