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Topic: Current Measurement

Results

An experimental study of 1/f noise in transistors

1964 / IEEE
By: Wiggins, M. J.;

A step-up method for calibrating inductive voltage dividers up to 1 MHz

1976 / IEEE
By: Grohmann, Klaus;

A current comparator bridge for power measurement

1976 / IEEE
By: Ayukawa, Karl; Moore, William J. M.;

Thermal current converters for accurate AC current measurement

1976 / IEEE
By: Williams, Earl S.;

Thermal measurement of AC power in comparison with the electrodynamic method

1976 / IEEE
By: Schuster, Gerhard;

A fast microcomputer-controlled admittance bridge

1976 / IEEE
By: Kabele, William C.;

A differential electrometer with dynamic gain for pulsed amperometric measurement

1976 / IEEE
By: Zick, G.L.;

Sign and magnitude successive approximation A/D for speech data systems

1976 / IEEE
By: Kibe, S.V.; Sangwan, K.S.;

A new method for the measurement of contact current

1976 / IEEE
By: Abdul Kader Pramanik, M.; Mano, K.; Takagi, T.;

Single resistance controlled variable frequency RC notch filter

1976 / IEEE
By: Dutta Roy, S.C.;

A possibility of simultaneous logarithmic-linear direct-current measurement

1976 / IEEE
By: Sobajic, M.V.;

A high-speed logarithmic amplifier

1976 / IEEE
By: Tai, I.; Hasegawa, K.-I.;

A four-point probe method with increased accuracy for the local determination of the thickness of thin, electrically conducting layers

1982 / IEEE
By: Hesse, E.;

An improved automatic test system for VLSI parametric testing

1982 / IEEE
By: Rung, R.D.; Fang, R.C.Y.; Cham, K.M.;

Measurement of the state of battery charge using an improved loaded voltmeter test method

1982 / IEEE
By: Ofry, E.; Singer, S.;

A simple parameter measurement system for solar cells

1982 / IEEE
By: Nedungadi, A.; Sharan, R.;

Instruments get smarter: Innovative digital design techniques lead to more intelligent, versatile, and communicative instruments

1980 / IEEE
By: Shackil, Albert F.;

A new system for measuring low DC currents

1981 / IEEE
By: Damljanovic, D.D.;

Microprocessor-controlled drill analyzer

1981 / IEEE
By: Ber, A.; Forgacs, R.L.;

Use of vacuum tubes in test instrumentation for measuring characteristics of fast high-voltage semiconductor devices

1981 / IEEE
By: Berning, D.;

Microprocessor-controlled acquisition system for the determination of MOS transistor parameters

1981 / IEEE
By: Fontaine, A.; Lambot, J.-P.; White, M.H.; Jespers, P.G.A.;

Topological conditions for single-branch-fault

1983 / IEEE
By: Lin, C. S.; Liu, R.; Huang, Z. F.;

An analysis of node linking in overlapped pyramids

1984 / IEEE
By: Cibulskis, J.M.; Dyer, C.R.;

Measured flatness of microwave-induced steps at Josephson tunnel junctions with near-zero-current bias

1982 / IEEE
By: Hinken, J.H.; Brunk, G.E.W.; Guang-Ying Cui; Niemeyer, J.;

The calibration of a DAC using differential linearity measurements

1982 / IEEE
By: Williams, T.B.;

Quantized Hall resistance measurement at the NML

1987 / IEEE
By: Cage, Marvin E.; Ricketts, Brian W.;

Digital sampling laboratory wattmeter

1987 / IEEE
By: Corney, A.C.; Pullman, R.T.;

Systematic error of time-division wattmeters when voltage and/or current are distorted

1987 / IEEE
By: Stojanovic, Borislav; Miljanic, Petar N.; Bergeest, Rainer;

Improvement in the use of the thermal wattmeter principle: Application to a broad-band device for nonsinusoidal waveform

1987 / IEEE
By: Knosp, Robert; Erard, Luc; Soucek, Radomir;

Automated measurement of current dependency of contact resistance in low current level switches

1987 / IEEE
By: Ishida, Kimitaka; Ikeda, Hiroaki; Shirako, Kiyoshi;

Quantum Hall measurements from 4 K to 20 mK

1987 / IEEE
By: D'Iorio, M.; Wood, Barry M.;

Application of MOSFET's in the temperature compensation of DC amplifiers

1987 / IEEE
By: Rizkalla, M.E.; Hanna, N.N.;

New comparator-type calibrator for instrument transformers

1987 / IEEE
By: Zhao, X.;

Improved determination of the coil constant in the �2p experiment at the PTB

1987 / IEEE
By: Willenberg, Gerd-Dietmar; Weyand, Kurt;

AC power calibrator with a precision digital wattmeter in the feedback loop

1987 / IEEE
By: Miljanic, Petar N.; Zupunski, Ivan;

A compact and movable king-type probe for surface field measurements

1987 / IEEE
By: Giarola, Attilio Jose; Conforti, Evandro;

Assessment of the performance of zener references of the highest quality

1987 / IEEE
By: Spreadbury, Peter J.; Roberts, Derek E.;

The measurement column

1988 / IEEE
By: Hess, D.;

Electromagnetic methods in adplied geophysics: Vol, i. theory, edited by Misac N. Nabighi [Book review]

1988 / IEEE
By: Glisson, A.;

Solution-Processed Memristive Junctions Used in a Threshold Indicator

2011 / IEEE
By: Tse Nga Ng; Arias, A.C.; Russo, B.;

Multilayer n-Type Organic Metal-Base Transistor

2011 / IEEE
By: Song, Y.; Yusoff, A.R.B.M.; Shuib, S.A.; Holz, E.; Schulz, D.;

Fabrication and Characterization of Nanoscale NiO Resistance Change Memory (RRAM) Cells With Confined Conduction Paths

2011 / IEEE
By: Wong, H.-S.P.; Byoungil Lee;

Effect of Solvent Annealing in the Presence of Electric Field on P3HT:PCBM Films Used in Organic Solar Cells

2011 / IEEE
By: Iyer, S.S.K.; Bagui, A.;

Understanding the Charge Transport Mechanism in VRS and BRS States of Transition Metal Oxide Nanoelectronic Memristor Devices

2011 / IEEE
By: Ordosgoitti, J.; Long, B.; Melkonian, C.; Jha, R.;

A Current Equalization Method for Serially Connected Battery Cells Using a Single Power Converter for Each Cell

2011 / IEEE
By: Permann, R.; Kumpusch, R.; Blochberger, T.; Guertlschmid, W.; Conte, F.V.; Fleig, J.; Einhorn, M.; Kral, C.;

The Internet Topology Zoo

2011 / IEEE
By: Bowden, R.; Falkner, N.; Nguyen, H.X.; Knight, S.; Roughan, M.;

Rail-to-Rail, Linear Hot-Electron Injection Programming of Floating-Gate Voltage Bias Generators at 13-Bit Resolution

2011 / IEEE
By: Chenling Huang; Chakrabartty, S.; Sarkar, P.;

Correlation of Measured Soft X-Ray Pulses With Modeled Dynamics of the Plasma Focus

2011 / IEEE
By: Singh, A.; Roy, F.A.; Perk Lin Chong; Abdou, A.E.; Talebitaher, A.; Wong, D.; Rawat, R.S.; Saw, S.H.; Sing Lee; Lee, P.; Devi, K.;

Corona Discharges in Atmospheric Air Between a Wire and Two Plates

2011 / IEEE
By: Lacoste, D.A.; Berard, P.; Laux, C.O.;

Plasma Expansion in a Negative-Polarity Rod-Pinch Diode

2011 / IEEE
By: Oliver, B.V.; Johnston, M.D.; Leckbee, J.J.;

On-load tap changer diagnosis-an off-line method for detecting degradation and defects: part 2

2011 / IEEE
By: Malewski, R.A.; Quak, B.; Leich, R.; Smit, J.J.; Gulski, E.; Erbrink, J.J.;

Temperature Dependence on Current Gain, On-to-Off Current Ratio, and Organic Magnetocurrent of Nonmagnetic Organic Transistors

2011 / IEEE
By: Schulz, D.; Yusoff, A.R.B.M.; Shuib, S.A.; Song, Y.; Holz, E.;

AC Bipolar Pulsed Power Supply for Reactive Magnetron Sputtering

2011 / IEEE
By: Garcia-Garcia, J.; Nieto-Perez, M.; Gonzalez, J.J.; Pacheco-Pacheco, M.; Rivera-Rodriguez, C.; Valdivia-Barrientos, R.; Pacheco-Sotelo, J.;

Model With Anomalous Diffusion and Friction for a Vacuum-Arc Plasma Jet in a Straight Magnetic Filter

2011 / IEEE
By: Kelly, H.; Della Torre, H.; Grondona, D.; Giuliani, L.; Minotti, F.;

Open-Loop Control of Modular Multilevel Converters Using Estimation of Stored Energy

2011 / IEEE
By: Angquist, L.; Nee, H.-P.; Vasiladiotis, M.; Ilves, K.; Siemaszko, D.; Antonopoulos, A.;

A Current-Feedback Instrumentation Amplifier With a Gain Error Reduction Loop and 0.06% Untrimmed Gain Error

2011 / IEEE
By: Makinwa, K.A.A.; Huijsing, J.H.; Rong Wu;

Large-Scale Available Bandwidth Measurements: Interference in Current Techniques

2011 / IEEE
By: Mellia, M.; Leonardi, E.; Croce, D.;

Development and Validation of Model for 95%-Efficiency 220-W Wireless Power Transfer Over a 30-cm Air Gap

2011 / IEEE
By: Seung-Hwan Lee; Lorenz, R.D.;

Novel a-Si:H AMOLED Pixel Circuit to Ameliorate OLED Luminance Degradation by External Detection

2011 / IEEE
By: Chia-Che Hung; Chih-Lung Lin; Cheng-Yan Chuang; Kuan-Wen Chou; Wen-Yen Chang;

Comparison of Wafer-Level With Package-Level CDM Stress Facilitated by Real-Time Probing

2011 / IEEE
By: Shukla, V.; Jack, N.; Rosenbaum, E.;

Examination of a Popular Out-of-Sequence Measurement Update Algorithm

2011 / IEEE
By: Guern, J.A.;

Near Infrared InAs/GaAsSb Quantum Dot Light Emitting Diodes

2011 / IEEE
By: del Moral, M.; Ulloa, J.M.; Bajo, M.M.; Hierro, A.; Guzman, A.;

State-of-Charge Estimation and State-of-Health Prediction of a Li-Ion Degraded Battery Based on an EKF Combined With a Per-Unit System

2011 / IEEE
By: Jonghoon Kim; Cho, B.H.;

An Accelerator-Based Wireless Sensor Network Processor in 130 nm CMOS

2011 / IEEE
By: Hempstead, M.; Wei, G.; Brooks, D.;

Modular Eddy Current Micro Sensor

2011 / IEEE
By: Wurz, M.C.; Griesbach, T.; Rissing, L.;

Correlation of Human Metal Model and Transmission Line Pulsing Testing

2011 / IEEE
By: Hajjar, J.; Righter, A.W.; Salcedo, J.A.; Malobabic, S.; Liou, J.J.;

Enhancement in Light Extraction of GaN-Based Light-Emitting Diodes With High Reflectivity Electrodes

2011 / IEEE
By: Yan-Kuin Su; Hsiao-Chiu Hsu; Chun-Liang Lin; Kuan Chun Chen;

Novel Position Detection Method for Permanent Magnet Stepper Motors Using Only Current Feedback

2011 / IEEE
By: Wonhee Kim; Chung Choo Chung;

Nondestructive Evaluation of Austenitic Stainless Steel Using CIC-MFL and LIHaS

2011 / IEEE
By: Myungki Choi; Jongwoo Jun; Jinyi Lee;

Evaluation of an Isosceles-Triangle-Coil Phantom for Magnetoencephalography

2011 / IEEE
By: Adachi, Y.; Oyama, D.; Uehara, G.; Hashimoto, I.; Yumoto, M.; Kasahara, T.; Hatsusaka, N.;

A New MSL Based Model for the Analysis of the Source Bus Line in LCD Panel

2011 / IEEE
By: Dhungana, S.; Yamaguchi, M.;

Efficiency Enhancement of InGaN LEDs With an n-Type AlGaN/GaN/InGaN Current Spreading Layer

2011 / IEEE
By: Hsueh-Hsing Liu; Jen-Inn Chyi; Geng-Yen Lee; Peng-Ren Chen;

High Resolution System for Nanoparticles Hyperthermia Efficiency Evaluation

2011 / IEEE
By: Aroca, C.; Sanz, M.; Maicas, M.; Cobos, P.;

Conditions of Exciting Coils Used in Evaluation of Shielding Factor of Magnetically Shielded Rooms for Uniform Magnetic Field

2011 / IEEE
By: Yamaguchi, T.; Shinnoh, T.; Yamazaki, K.; Komori, S.; Sakakibara, M.; Muramatsu, K.; Odawara, S.; Gao, Y.; Shimokawa, M.;

High retention of polarization in polycrystalline M/PZT/M capacitors in the presence of depolarization field near grain boundaries

2011 / IEEE
By: Yuferev, V.S.; Delimova, L.A.; Grekhov, I.V.;

High-Voltage 4H-SiC Thyristors With a Graded Etched Junction Termination Extension

2011 / IEEE
By: De Doncker, R.W.; Planson, D.; Dheilly, N.; Scharnholz, S.; Paques, G.;

Investigation of the Efficiency-Droop Mechanism in Vertical Red Light-Emitting Diodes Using a Dynamic Measurement Technique

2011 / IEEE
By: Che-Wei Lin; Kuo, F.-M.; Shi, J.-W.; Sheu, J.-K.; Yan, L.-J.; Wei Chen;

Development of a WLAN based monitoring system for group activity measurement in real-time

2011 / IEEE
By: Ohta, K.; Nakayama, H.; Tsunoda, H.; Nemoto, Y.; Keeni, G.M.; Suzuki, A.; Waizumi, Y.; Hashimoto, K.; Nagatomi, R.; Nishiyama, H.;

Enabling performance intelligence for application adaptation in the Future Internet

2011 / IEEE
By: Berryman, A.; Kunpeng Zhu; Yingxiao Xu; Sridharan, M.; Calyam, P.; Venkataraman, A.; Patali, R.;

Isolated Photosystem I Reaction Centers on a Functionalized Gated High Electron Mobility Transistor

2011 / IEEE
By: Mostafa, S.; Tulip, F.S.; Lee, I.; Eliza, S.A.; Islam, S.K.; Ericson, M.N.; Greenbaum, E.;

Using the FEM Meshes Adaption and Genetic Algorithms for Identification of Permeability in Normal Direction of Anisotropic Sheets

2012 / IEEE
By: Juszczak, E.N.; Komeza, K.; Hihat, N.; Lecointe, J.P.; Napieralski, P.; Di Barba, P.;

Experimental and Numerical Investigation of Flux Density Distribution in the Individual Packets of a 100 kVA Transformer Core

2012 / IEEE
By: Marnay, D.; Marketos, F.; Ngnegueu, T.;

Analytical Study of Impulse Current Measuring Shunts With Cage Configuration

2012 / IEEE
By: Ferrero, R.; Tellini, B.; Marracci, M.;

Analysis of Metrological Requirements for Electrical Measurement of HVDC Station Losses

2012 / IEEE
By: Bergman, A.;

Effect of Artificial Burrs on Local Power Loss in a Three-Phase Transformer Core

2012 / IEEE
By: Moses, A.J.; Hamzehbahmani, H.; Mazurek, R.; Belgrand, T.; Anayi, F.J.; Anderson, P.I.;

A Metrological Comparison Between Different Methods for Harmonic Pollution Metering

2012 / IEEE
By: Prioli, M.; Ferrero, A.; Salicone, S.;

Characteristics Analysis of the Square Laminated Core under dc-biased Magnetization by the Fixed-point Harmonic-balanced FEM

2012 / IEEE
By: Junwei Lu; Lin Li; Xiaojun Zhao; Tiebing Lu; Zhiguang Cheng;

Numerical Computation of Ohmic and Eddy-Current Winding Losses of Converter Transformers Including Higher Harmonics of Load Current

2012 / IEEE
By: Monig, W.; Pusch, D.; Steinmetz, T.; Hughes, J.; Smajic, J.; Carlen, M.;

Multiphysical Lithium-Based Battery Model for Use in State-of-Charge Determination

2012 / IEEE
By: Ostermann, H.; Roche, R.; Watrin, N.; Miraoui, A.; Blunier, B.;

A Novel Method of Magnetizing Inductance Investigation of Self-Excited Induction Generators

2012 / IEEE
By: Rafajdus, P.; Kalamen, L.; Hrabovcova, V.; Sekerak, P.;

Controlling Rotor Vibrations of a Two-Pole Induction Machine With Unipolar Actuator

2012 / IEEE
By: Arkkio, A.; Jokela, T.; Sinervo, A.;

Quantitative Non-Destructive Testing of Metallic Foam Based on Direct Current Potential Drop Method

2012 / IEEE
By: Yong Li; Xiaojuan Wang; Shejuan Xie; Jing Zhang; Zhenmao Chen;

Low Current Transformer Utilizing Co-Based Amorphous Alloys

2012 / IEEE
By: Bienkowski, A.; Smulko, J.; Szewczyk, R.; Hasse, L.; Salach, J.; Kolano-Burian, A.; Frydrych, P.;

Using Equivalent Emission Sources to Evaluate the Coupling Between Components

2012 / IEEE
By: Clavel, E.; Perrussel, R.; Vincent, B.; Ferber, M.; Sartori, C.A.F.; Zangui, S.; Berger, K.; Vollaire, C.;

A Multiscale Approach to Predict Classical Losses in Soft Magnetic Composites

2012 / IEEE
By: de la Barriere, O.; Bordianu, A.; Manzin, A.; Chiampi, M.; Bottauscio, O.;

Evaluation of Iron Core Quality for Resistance Spot Welding Transformers Using Current Controlled Supply

2012 / IEEE
By: Dolinar, D.; Polajzer, B.; Klopcic, B.; Petrun, M.;

Interface States Beyond Band Gap and Their Impact on Charge Carrier Mobility in MOSFETs

2012 / IEEE
By: Wei Dong Zhang; Jian Fu Zhang; Zhigang Ji; Groeseneken, G.; De Gendt, S.; Kaczer, B.;

Multilead Measurement System for the Time-Domain Analysis of Bioimpedance Magnitude

2012 / IEEE
By: Seppa, V.P.; Gracia, J.; Hyttinen, J.; Viik, J.;

Characterization and Modeling of Graphene Transistor Low-Frequency Noise

2012 / IEEE
By: Zimmer, T.; Happy, H.; Meng, N.; Maneux, C.; Grandchamp, B.; Majek, C.; Fregonese, S.; Hainaut, C.;

Stable Operation of MEMS Oscillators Far Above the Critical Vibration Amplitude in the Nonlinear Regime

2011 / IEEE
By: Melamud, R.; Hyung Kyu Lee; Kenny, T.W.; Yoneoka, S.; Salvia, J.; Chandorkar, S.;

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