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Topic: Current Density
Results
2011 / IEEE
By: Peng Du; Gao, J.; Pullan, A.J.; Cheng, L.K.; Farrugia, G.; Gibbons, S.J.; OrGrady, G.; Archer, R.;
By: Peng Du; Gao, J.; Pullan, A.J.; Cheng, L.K.; Farrugia, G.; Gibbons, S.J.; OrGrady, G.; Archer, R.;
2011 / IEEE
By: Xiaoyan Wang; Payne, A.M.; Davis, H.H.; Chandrasekaran, V.; Meier, D.L.; Yelundur, V.; Zimbardi, F.; Rohatgi, A.; Young-Woo Ok; O'Neill, E.;
By: Xiaoyan Wang; Payne, A.M.; Davis, H.H.; Chandrasekaran, V.; Meier, D.L.; Yelundur, V.; Zimbardi, F.; Rohatgi, A.; Young-Woo Ok; O'Neill, E.;
2011 / IEEE
By: Tanaka, H.; Ohi, A.; Toyoda, Y.; Sumida, H.; Nishimura, T.; Ng, J.C.W.; Sin, J.K.O.; Ueno, K.;
By: Tanaka, H.; Ohi, A.; Toyoda, Y.; Sumida, H.; Nishimura, T.; Ng, J.C.W.; Sin, J.K.O.; Ueno, K.;
2011 / IEEE
By: Hyun-Jong Chung; Jinseong Heo; Sung Kwan Lim; Chunhum Cho; Hyeon Jun Hwang; Heejun Yang; Sang Kyung Lee; Chang Goo Kang; Byoung Hun Lee; Young Gon Lee; Sunae Seo;
By: Hyun-Jong Chung; Jinseong Heo; Sung Kwan Lim; Chunhum Cho; Hyeon Jun Hwang; Heejun Yang; Sang Kyung Lee; Chang Goo Kang; Byoung Hun Lee; Young Gon Lee; Sunae Seo;
2011 / IEEE
By: Suzuki, T.; Fukami, S.; Tanigawa, H.; Ueda, K.; Chiba, D.; Ohshima, N.; Ono, T.; Koyama, T.; Nakatani, Y.; Ishiwata, N.;
By: Suzuki, T.; Fukami, S.; Tanigawa, H.; Ueda, K.; Chiba, D.; Ohshima, N.; Ono, T.; Koyama, T.; Nakatani, Y.; Ishiwata, N.;
2011 / IEEE
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
2011 / IEEE
By: Shung, K.K.; Qifa Zhou; Sien-Ting Lau; Xi Yao; Xiaoqing Wu; Hongfen Ji; Peng Shi; Lingyan Wang; Wei Ren; Xiaofeng Chen;
By: Shung, K.K.; Qifa Zhou; Sien-Ting Lau; Xi Yao; Xiaoqing Wu; Hongfen Ji; Peng Shi; Lingyan Wang; Wei Ren; Xiaofeng Chen;
2012 / IEEE
By: Hsiao-Chin Tuan; Ruey-Hsin Liou; Fei-Yun Chen; Chih-Fang Huang; Chen-Liang Chu; Jeng Gong; Chung-Yu Hung; Chih-Min Hu;
By: Hsiao-Chin Tuan; Ruey-Hsin Liou; Fei-Yun Chen; Chih-Fang Huang; Chen-Liang Chu; Jeng Gong; Chung-Yu Hung; Chih-Min Hu;
2012 / IEEE
By: Xing Zhang; Lijun Wang; Cunzhu Tong; Yun Liu; Li Qin; Xihong Fu; Jinlong Zhang; Yugang Zeng; Yongqiang Ning;
By: Xing Zhang; Lijun Wang; Cunzhu Tong; Yun Liu; Li Qin; Xihong Fu; Jinlong Zhang; Yugang Zeng; Yongqiang Ning;
2012 / IEEE
By: Gunapala, S.D.; Ting, D.Z.; Hoglund, L.; Keo, S.A.; Mumolo, J.M.; Rafol, S.B.; Liu, J.K.; Nguyen, J.; Khoshakhlagh, A.; Soibel, A.;
By: Gunapala, S.D.; Ting, D.Z.; Hoglund, L.; Keo, S.A.; Mumolo, J.M.; Rafol, S.B.; Liu, J.K.; Nguyen, J.; Khoshakhlagh, A.; Soibel, A.;
2012 / IEEE
By: Gamzina, D.; Jinfeng Zhao; Risbud, S.; Luhmann, N.C.; Na Li; Banducci, M.; Barnett, L.; Spear, A.G.; Ji Li;
By: Gamzina, D.; Jinfeng Zhao; Risbud, S.; Luhmann, N.C.; Na Li; Banducci, M.; Barnett, L.; Spear, A.G.; Ji Li;
2012 / IEEE
By: Joo-Von Kim; Schrefl, T.; Saharan, L.; Hahn, D.; Hrkac, G.; Chappert, C.; Devolder, T.;
By: Joo-Von Kim; Schrefl, T.; Saharan, L.; Hahn, D.; Hrkac, G.; Chappert, C.; Devolder, T.;
2011 / IEEE
By: Fukuyama, H.; Lopez, H.S.; Poole, M.; Crozier, S.; Ozaki, O.; Sato, K.; Urayama, S.; Nakajima, I.; Kitaguchi, H.;
By: Fukuyama, H.; Lopez, H.S.; Poole, M.; Crozier, S.; Ozaki, O.; Sato, K.; Urayama, S.; Nakajima, I.; Kitaguchi, H.;
2012 / IEEE
By: Peloso, R.; Fiorini, C.; Beverina, L.; Giussani, M.; Sampietro, M.; Binda, M.; Natali, D.; Iacchetti, A.;
By: Peloso, R.; Fiorini, C.; Beverina, L.; Giussani, M.; Sampietro, M.; Binda, M.; Natali, D.; Iacchetti, A.;
2012 / IEEE
By: Laitinen, M.; Kicin, S.; Hamidi, A.; Fabian, J.-H.; Chunlei Liu; Grinberg, R.; Sikanen, J.; Haederli, C.;
By: Laitinen, M.; Kicin, S.; Hamidi, A.; Fabian, J.-H.; Chunlei Liu; Grinberg, R.; Sikanen, J.; Haederli, C.;
2012 / IEEE
By: Vandervorst, W.; Loo, R.; Berger, P.R.; Growden, T.A.; Ramesh, A.; Caymax, M.; Douhard, B.;
By: Vandervorst, W.; Loo, R.; Berger, P.R.; Growden, T.A.; Ramesh, A.; Caymax, M.; Douhard, B.;
2012 / IEEE
By: Herget, P.; Naigang Wang; O'Sullivan, E.J.; Webb, B.C.; Gallagher, W.J.; Fontana, R.; Xiaolin Hu; Decad, G.; Romankiw, L.T.;
By: Herget, P.; Naigang Wang; O'Sullivan, E.J.; Webb, B.C.; Gallagher, W.J.; Fontana, R.; Xiaolin Hu; Decad, G.; Romankiw, L.T.;
2012 / IEEE
By: Tieping Sun; Yixiang Hu; Juanjuan Han; Tianshi Lei; Liangping Wang; Ning Guo; Zhengzhong Zeng; Hanyu Wu; Xinjun Zhang;
By: Tieping Sun; Yixiang Hu; Juanjuan Han; Tianshi Lei; Liangping Wang; Ning Guo; Zhengzhong Zeng; Hanyu Wu; Xinjun Zhang;
2012 / IEEE
By: Dey, A.W.; Wernersson, L.; Nilsson, P.; Borgstrom, M.; Thelander, C.; Borg, B.M.; Dick, K.A.; Lind, E.;
By: Dey, A.W.; Wernersson, L.; Nilsson, P.; Borgstrom, M.; Thelander, C.; Borg, B.M.; Dick, K.A.; Lind, E.;
2012 / IEEE
By: Kritchman, E.; Dovrat, M.; Rounsaville, B.; Rohatgi, A.; Brusilovsky, D.; Cooper, I.B.; Ebong, A.; Benichou, A.;
By: Kritchman, E.; Dovrat, M.; Rounsaville, B.; Rohatgi, A.; Brusilovsky, D.; Cooper, I.B.; Ebong, A.; Benichou, A.;