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Topic: Crystalline Materials
Results
2012 / IEEE
By: Fukuda, K.; Totsuka, D.; Yanagida, T.; Kurosawa, S.; Kawaguchi, N.; Watanabe, K.; Kamada, K.; Fujimoto, Y.; Yoshikawa, A.; Yokota, Y.; Yamazaki, A.;
By: Fukuda, K.; Totsuka, D.; Yanagida, T.; Kurosawa, S.; Kawaguchi, N.; Watanabe, K.; Kamada, K.; Fujimoto, Y.; Yoshikawa, A.; Yokota, Y.; Yamazaki, A.;
2012 / IEEE
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
2011 / IEEE / 978-1-61284-172-4
By: Stavarache, I.; Iordache, G.; Lazanu, I.; Lazanu, S.; Slav, A.; Lepadatu, A.;
By: Stavarache, I.; Iordache, G.; Lazanu, I.; Lazanu, S.; Slav, A.; Lepadatu, A.;
2012 / IEEE
By: Fujimoto, Y.; Yanagida, T.; Sugiyama, M.; Yoshikawa, A.; Totsuka, D.; Futami, Y.; Kurosawa, S.; Yokota, Y.;
By: Fujimoto, Y.; Yanagida, T.; Sugiyama, M.; Yoshikawa, A.; Totsuka, D.; Futami, Y.; Kurosawa, S.; Yokota, Y.;
2014 / IEEE
By: Suzuki, A.; Kurosawa, S.; Kochurikhin, V. V.; Yamaji, A.; Yoshikawa, A.; Yokota, Y.; Fujimoto, Y.;
By: Suzuki, A.; Kurosawa, S.; Kochurikhin, V. V.; Yamaji, A.; Yoshikawa, A.; Yokota, Y.; Fujimoto, Y.;
2013 / IEEE
By: Mosleh, Aboozar; Ghetmiri, Seyed Amir; Conley, Benjamin R.; Abu-Safe, Husam; Waqar, Zafar; Benamara, Mourad; Yu, Shui-Qing; Naseem, Hameed A.;
By: Mosleh, Aboozar; Ghetmiri, Seyed Amir; Conley, Benjamin R.; Abu-Safe, Husam; Waqar, Zafar; Benamara, Mourad; Yu, Shui-Qing; Naseem, Hameed A.;
2013 / IEEE
By: Huang, Jialiang; Yun, Jae Sung; Green, Martin; Evans, Rhett; Varlamov, Sergey; Kim, Kyung Hun;
By: Huang, Jialiang; Yun, Jae Sung; Green, Martin; Evans, Rhett; Varlamov, Sergey; Kim, Kyung Hun;
2014 / IEEE
By: Powell, Douglas M.; Hofstetter, Jasmin; Fenning, David P.; Hao, Ruiying; Jensen, Mallory Ann; Ravi, T.S.; Buonassisi, Tonio;
By: Powell, Douglas M.; Hofstetter, Jasmin; Fenning, David P.; Hao, Ruiying; Jensen, Mallory Ann; Ravi, T.S.; Buonassisi, Tonio;
1988 / IEEE
By: Moncorge, R.; Gagnard, R.; Djevahirdjian, K.; Djevahirdjian, V.; Collongues, R.; Lejus, A.M.; Vivien, D.; Boulon, G.;
By: Moncorge, R.; Gagnard, R.; Djevahirdjian, K.; Djevahirdjian, V.; Collongues, R.; Lejus, A.M.; Vivien, D.; Boulon, G.;
1988 / IEEE
By: Watanabe, E.; Ohkawa, S.; Miyachi, T.; Husimi, K.; Ikeda, T.; Kuwata, M.; Taira, M.;
By: Watanabe, E.; Ohkawa, S.; Miyachi, T.; Husimi, K.; Ikeda, T.; Kuwata, M.; Taira, M.;
1988 / IEEE
By: Visser, C.C.G.; Guckel, H.; Tilmans, H.A.C.; Burns, D.W.; DeRoo, D.W.; Jones, D.H.; Sniegowski, J.J.; Klomberg, P.J.; Christenson, T.R.;
By: Visser, C.C.G.; Guckel, H.; Tilmans, H.A.C.; Burns, D.W.; DeRoo, D.W.; Jones, D.H.; Sniegowski, J.J.; Klomberg, P.J.; Christenson, T.R.;
1988 / IEEE
By: Elling, B.; Danz, R.; Geiss, D.; Wedel, A.; Schmolke, R.; Pinnow, M.; Kuenstler, W.;
By: Elling, B.; Danz, R.; Geiss, D.; Wedel, A.; Schmolke, R.; Pinnow, M.; Kuenstler, W.;
1989 / IEEE
By: Sankararaman, M.; McKinstry, K.D.; Wittenauer, M.A.; Patton, C.E.; Nyenhuis, J.; Schindler, A.; Sato, H.; Friedlaender, F.J.;
By: Sankararaman, M.; McKinstry, K.D.; Wittenauer, M.A.; Patton, C.E.; Nyenhuis, J.; Schindler, A.; Sato, H.; Friedlaender, F.J.;
1990 / IEEE
By: Wojtczuk, S.; Emery, K.A.; Bajgar, C.; Vernon, S.M.; Tobin, S.P.; Melloch, M.R.; Lundstrom, M.; Venkatensan, S.; Stellwag, T.B.; Keshavarzi, A.;
By: Wojtczuk, S.; Emery, K.A.; Bajgar, C.; Vernon, S.M.; Tobin, S.P.; Melloch, M.R.; Lundstrom, M.; Venkatensan, S.; Stellwag, T.B.; Keshavarzi, A.;
Analysis of microstructure of superconductive materials with the use of scanning acoustic microscope
1988 / IEEEBy: Bukhny, M.A.; Senjushkina, T.A.; Levin, V.M.; Chernozatonskji, L.A.; Mayev, R.G.;