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Topic: Coupling
Results
2012 / IEEE
By: Jorgenson, R.E.; Warne, L.K.; Merewether, K.O.; Coats, R.S.; Jojola, J.M.; Martinez, L.E.;
By: Jorgenson, R.E.; Warne, L.K.; Merewether, K.O.; Coats, R.S.; Jojola, J.M.; Martinez, L.E.;
2012 / IEEE
By: Uthman, M.; Grattan, K.T.V.; Abana, H.; Agrawal, A.; Kejalakshmy, N.; Rahman, B.M.A.;
By: Uthman, M.; Grattan, K.T.V.; Abana, H.; Agrawal, A.; Kejalakshmy, N.; Rahman, B.M.A.;
2012 / IEEE
By: Camacho-Penalosa, C.; Esteban, J.; Martin-Guerrero, T.M.; Page, J.E.; Abdo-Sanchez, E.;
By: Camacho-Penalosa, C.; Esteban, J.; Martin-Guerrero, T.M.; Page, J.E.; Abdo-Sanchez, E.;
2011 / IEEE / 978-1-4244-8810-0
By: Shaocheng Zhang; Peng Li; Xiaofeng Yang; Haoyu Li; Ji Ma; Li Ma;
By: Shaocheng Zhang; Peng Li; Xiaofeng Yang; Haoyu Li; Ji Ma; Li Ma;
2011 / IEEE / 978-1-61284-878-5
By: Rochard, P.; Combrie, S.; Nguyen, T.N.; Lengle, K.; Akrout, A.; De Rossi, A.; Bramerie, L.; Trillo, S.; Bellanca, G.; Armaroli, A.; Malaguti, S.; Thual, M.; Gay, M.;
By: Rochard, P.; Combrie, S.; Nguyen, T.N.; Lengle, K.; Akrout, A.; De Rossi, A.; Bramerie, L.; Trillo, S.; Bellanca, G.; Armaroli, A.; Malaguti, S.; Thual, M.; Gay, M.;
2011 / IEEE / 978-1-61284-181-6
By: Junhui Liu; Yun Liao; Qing Duan; Hua Zhou; Yin Zhang; Zhenli He;
By: Junhui Liu; Yun Liao; Qing Duan; Hua Zhou; Yin Zhang; Zhenli He;
2011 / IEEE / 978-1-4577-0336-2
By: Gurlu, O.; Tamer, M.S.; Gokay, U.S.; Yilmaz, H.; Serpenguzel, A.;
By: Gurlu, O.; Tamer, M.S.; Gokay, U.S.; Yilmaz, H.; Serpenguzel, A.;
2011 / IEEE / 978-2-87487-022-4
By: Chabane, J.; Monediere, T.; Thevenot, M.; Menudier, C.; Fezai, F.;
By: Chabane, J.; Monediere, T.; Thevenot, M.; Menudier, C.; Fezai, F.;
2012 / IEEE / 978-1-4577-1155-8
By: Sangchul Bae; Huan-Yang Chen; van der Weide, D.W.; Yue Weng Mak; Bhadkamkar, A.;
By: Sangchul Bae; Huan-Yang Chen; van der Weide, D.W.; Yue Weng Mak; Bhadkamkar, A.;
2011 / IEEE / 978-1-4577-1041-4
By: Subramanyam, G.; Patterson, M.; Chenhao Zhang; Brown, D.; Cerny, C.; Leedy, K.;
By: Subramanyam, G.; Patterson, M.; Chenhao Zhang; Brown, D.; Cerny, C.; Leedy, K.;
2012 / IEEE / 978-0-7695-4666-7
By: Concas, G.; Marchesi, M.; Tonelli, R.; Murgia, A.; Swift, S.; McFall, J.; Counsell, S.;
By: Concas, G.; Marchesi, M.; Tonelli, R.; Murgia, A.; Swift, S.; McFall, J.; Counsell, S.;
2011 / IEEE / 978-1-4577-1631-7
By: Dewan, R.; Aziz, M.Z.A.A.; Iddi, H.U.; Ausordin, S.F.; Rahim, S.K.A.;
By: Dewan, R.; Aziz, M.Z.A.A.; Iddi, H.U.; Ausordin, S.F.; Rahim, S.K.A.;
2012 / IEEE / 978-1-4673-1310-0
By: Khare, Kapil; Gupta, Shruti; Maheshwari, Vikas; Bhattacharjee, Anup Kr.; Mandal, Durbadal; Kar, Rajib; Yadav, Vimal;
By: Khare, Kapil; Gupta, Shruti; Maheshwari, Vikas; Bhattacharjee, Anup Kr.; Mandal, Durbadal; Kar, Rajib; Yadav, Vimal;
2012 / IEEE
By: Parada-Alfonso, R.; Luis-Ramos, A.; Marti-Panameno, E.; Gomez-Pavon, L.C.; Ortega-Mendoza, J.G.;
By: Parada-Alfonso, R.; Luis-Ramos, A.; Marti-Panameno, E.; Gomez-Pavon, L.C.; Ortega-Mendoza, J.G.;
2013 / IEEE
By: Bandinelli, M.; Pandolfo, L.; Mori, A.; De Vita, P.; Bercigli, M.; Guida, G.; Galgani, G.;
By: Bandinelli, M.; Pandolfo, L.; Mori, A.; De Vita, P.; Bercigli, M.; Guida, G.; Galgani, G.;
2014 / IEEE
By: Tseng, Fan-Gang; Nguyen, Hai-Binh; Nguyen, Tuan-Hung; Nguyen, Minh-Hang; Ku, Kai-Ning; Lee, Ming-Chang; Lai, Jain-Ren;
By: Tseng, Fan-Gang; Nguyen, Hai-Binh; Nguyen, Tuan-Hung; Nguyen, Minh-Hang; Ku, Kai-Ning; Lee, Ming-Chang; Lai, Jain-Ren;
2014 / IEEE
By: Ben Salah, Miled; Levebfre, Jean-Luc; Descamps, Philippe; Voiron, Frederic; Pasquet, Daniel;
By: Ben Salah, Miled; Levebfre, Jean-Luc; Descamps, Philippe; Voiron, Frederic; Pasquet, Daniel;