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Topic: Counting Circuits

Results

A method of measuring the accumulated arc energy using a digital counter
1976 / IEEE
By: Uno, M.; Kubono, T.;
A Comprehensive Methodology to Rate SETs of Complex Analog and Mixed-Signal Circuits Demonstrated on 16-bit A-to-D Converters
2012 / IEEE
By: Zanchi, A.; Kerwin, D.B.; Hafer, C.; Wilson, A.; Hisano, S.; Buchner, S.;
Pulse Temporal Splitting in Photon Counting X-Ray Detectors
2012 / IEEE
By: Engel, K. J.; Herrmann, C.; Steadman, R.;
An Energy-Efficient 15-Bit Capacitive-Sensor Interface Based on Period Modulation
2012 / IEEE
By: Zhichao Tan; Pertijs, M.A.P.; Meijer, G.C.M.; Shalmany, S.H.;
A 30 GHz CMOS Frequency Synthesizer for V-Band Applications
2012 / IEEE
By: Po-Shuan Weng; Liang-Hung Lu;
Broad-Band Odd-Number CMOS Prescalers With Quadrature/Symmetrical Outputs
2012 / IEEE
By: Dekate, P.; Long, J.R.; Leenaerts, D.M.W.; Redman-White, W.;
A Time-to-Digital Converter Based on a Multiphase Reference Clock and a Binary Counter With a Novel Sampling Error Corrector
2012 / IEEE
By: Seung-Woo Lee; Kwang-Chun Choi; Woo-Young Choi; Bhum-Cheol Lee;
Fast statistical timing analysis for circuits with Post-Silicon Tunable clock buffers
2011 / IEEE / 978-1-4577-1400-9
By: Bing Li; Schlichtmann, U.; Ning Chen;
Evaluation of transimpedance amplifiers for readout of a position sensitive avalanche photodiode
2011 / IEEE / 978-1-4673-0120-6
By: Tashereau, R.; Prout, D.L.; Silverman, R.W.; Dooraghi, A.A.; Chatziioannou, A.F.; Vu, N.T.;
A low-power small-area open loop digital DLL for 2.2Gb/s/pin 2Gb DDR3 SDRAM
2011 / IEEE / 978-1-4577-1785-7
By: Hong-Gyeom Kim; Byung-Kwon Park; Chul Kim; Young-Jun Ku; Dae-Suk Kim; Seong-Jun Ahn; Jong-Chern Lee; Sung-Joo Hong; Sin-Hyun Jin; Jae-Jin Lee;
A zero-offset auto-correction circuit for piezoresistive micromachined accelerometer
2011 / IEEE / 978-1-4577-0796-4
By: Li Haoran; Zhen Chengcheng; Mu Tao; Tan Xiaoyun; Liu Xiaowei;
Design of resistant DPA three-valued counter based on SABL
2011 / IEEE / 978-1-61284-193-9
By: Pengjun Wang; Yuejun Zhang; Lipeng Hao;
Piezoelectric micro-scale mechanical computing system
2012 / IEEE / 978-1-4673-0325-5
By: Ivanov, T.; Polcawich, R.G.; Pulskamp, J.S.; Proie, R.M.;
The Variable-Increment Counting Bloom Filter
2012 / IEEE / 978-1-4673-0775-8
By: Keslassy, I.; Kanizo, Y.; Rottenstreich, O.;
Estimators also need shared values to grow together
2012 / IEEE / 978-1-4673-0775-8
By: Tsidon, E.; Keslassy, I.; Hanniel, I.;
A 100MHz S/s, 7 bit VCO-based ADC which is used in time interleaved ADC architectures
2012 / IEEE / 978-1-4577-1415-3
By: Fule Li; Ruihao Si; Chun Zhang;
A stable high-level energy estimation methodology for battery-powered embedded systems
2012 / IEEE / 978-1-4673-1356-8
By: Sanz, C.; Pescador, F.; Juarez, E.; Ren, R.;
On-chip delay measurement circuit
2012 / IEEE / 978-1-4673-0697-3
By: Rolandi, P.; Crippa, D.; Veggetti, A.; Jain, A.;
Process Variation Tolerant All-Digital 90$^{\circ}$ Phase Shift DLL for DDR3 Interface
2012 / IEEE
By: Heechai Kang; Kyungho Ryu; Dong Hoon Jung; Donghwan Lee; Won Lee; Suho Kim; Jongryun Choi; Seong-Ook Jung;
Note: Scalable multiphoton coincidence-counting electronics
2011 / American Institute of Physics
By: D. Branning; S. Khanal; Y. H. Shin; B. Clary; M. Beck;
Reducing the branch penalty in pipelined processors
1988 / IEEE
By: Lalja, D. J.;
Voltage limiters for DRAMs with substrate-plate-electrode memory cells
1988 / IEEE
By: Sakamoto, M.; Katoh, T.; Shimizu, T.; Takada, M.; Takeshima, T.;
Fast up/down counters using identical cascaded modules
1988 / IEEE
By: Jones, E.V.; Bi, G.;
Worldwide review of power disturbances
1988 / IEEE
By: Salzer, J.M.;
A BiCMOS thermal head intelligent driver with density controllers for full-tone rendition printers
1988 / IEEE
By: Shimizu, I.; Takeuchi, R.; Tsumura, M.;
A 1.5-GHz programmable divide-by-N GaAs counter
1988 / IEEE
By: Kane, M.G.; Fowlis, D.C.; Cherensky, S.S.; Chan, P.Y.;
Particle-size distribution of Iraqi sand and dust storms and their influence on microwave communication systems
1988 / IEEE
By: Al-Rizzo, H.M.; Abdulla, S.A.A.; Cyril, M.M.;
Comment on "Algorithm for construction of variable length code with limited maximum word length" by H. Murakami et al
1988 / IEEE
By: Lu, C.H.;
Unscrambling for fast DFT algorithms
1988 / IEEE
By: Burrus, C.S.;
Image analysis methods for solderball inspection in integrated circuit manufacturing
1988 / IEEE
By: Hinkle, E.B.; Sanz, J.L.C.; Blanz, W.E.;
Comparison of zero crossing counter to FFT spectrum of ultrasound Doppler
1988 / IEEE
By: Cote, G.L.; Fox, M.D.;
A fast algorithm for optimum syndrome space compression
1988 / IEEE
By: Tung, C.-H.; Robinson, J.P.;
Analysis and design of nonequivalent multistage interconnection networks
1988 / IEEE
By: Agrawal, D.P.; Swain, N.K.; Kim, S.-C.;
A single chip parallel multiplier by MOS technology
1988 / IEEE
By: Chu, K.-Y.; Nakamura, S.;
A versatile data transmission training module
1988 / IEEE
By: Kehinde, L.O.;
Simulation of toner depositing process in Xerographic image studies
1988 / IEEE
By: Tachibana, H.; Teshigawara, T.; Terao, K.;
Fast frequency synthesis by PLL using a continuous phase divider
1988 / IEEE
By: Wulich, D.;
Implementing precise interrupts in pipelined processors
1988 / IEEE
By: Smith, J.E.; Pleszkun, A.R.;
CMOS gate array implementation of the SPARC architecture
1988 / IEEE / 0-8186-0828-5
By: Namjoo, M.; Quach, L.; Jackson, D.C.; Agrawal, A.;
Priorities in process algebras
1988 / IEEE / 0-8186-0853-6
By: Cleaveland, R.; Hennessy, M.;
Ternary CMOS sequential circuits
1988 / IEEE / 0-8186-0859-5
By: Wu, X.; Prosser, F.;
Trading reversals for alternation
1988 / IEEE / 0-8186-0866-8
By: Jiang, T.; Ibarra, O.H.;
Nondeterministic space is closed under complementation
1988 / IEEE / 0-8186-0866-8
By: Immerman, N.;
An easily testable parallel multiplier
1988 / IEEE / 0-8186-0867-6
By: Hong, S.J.;
The design of fast totally self-checking Berger code checkers based on Berger code partitioning
1988 / IEEE / 0-8186-0867-6
By: Lo, J.-C.; Thanawastien, S.;
Approaches for the repair of VLSI/WSI RRAMs by row/column deletion
1988 / IEEE / 0-8186-0867-6
By: Huang, W.K.; Lombardi, F.;
A methodology and distributed tool for debugging dataflow programs
1988 / IEEE / 0-8186-0868-4
By: Wahl, N.J.; Schach, S.R.;
Technology transfer in the product verification/quality areas
1988 / IEEE / 0-8186-0868-4
By: Gensheimer, E.L.;
Multigigahertz CMOS dual-modulus prescaler IC
1988 / IEEE
By: Cong, H.-I.; Michejda, J.A.; Hillenius, S.J.; Fang, S.-C.; Boulin, D.M.; Andrews, J.M.;
A testable CMOS synchronous counter
1988 / IEEE
By: Katoozi, M.; Soma, M.;
A microprocessor-based switched-battery capacitance meter
1988 / IEEE
By: Mahmud, S.M.; Rusek, A.;
A programmable self-adaptive digital frequency multiplier
1988 / IEEE
By: Rusek, A.; Ganesan, S.; Mahmud, S.M.; Hillis, M.L.;
A novel approach to deriving closed form expressions for frequency stability variance measures
1988 / IEEE
By: Harison, R.G.; Kalivas, G.A.;
A novel approach for determining temperature in an appliance without using a sensor
1988 / IEEE
By: Payne, T.R.;
The effect of particle charge on penetration in an electret filter
1988 / IEEE
By: Owens, T.M.; Fjeld, R.A.;
Detection of extremely small particles in the nanometer and ionic size range
1988 / IEEE
By: Itagaki, T.; Masuda, S.; Kosakada, M.;
Compaction with general synchronous timing
1988 / IEEE
By: Mueller, R.A.; Allan, V.H.;
A two-way time transfer experiment via ECS-1 using the MITREX modem
1988 / IEEE
By: Riedler, W.; Ressler, H.; Kirchner, D.; Soring, A.;
Comments, with reply, on "Frequency determination of weak sinusoids buried in noise" by A.I. Abu-El-Haija
1988 / IEEE
By: Masoud, A.A.A.;
An improved sequential estimation scheme for PN acquisition
1988 / IEEE
By: Chiu, J.-H.; Lee, L.-S.;
SCOOP-switching centers operating observations processing
1988 / IEEE
By: Combot, J.-P.; Treps, D.; Desbois, J.-P.;
Behavioral-level fault simulation
1988 / IEEE
By: Ghosh, S.;
Hazard rates of nonequispaced discrete distributions
1988 / IEEE
By: Takahasi, K.;
Central clocked event-triggered local modulo-N-counting for bus arbitration
1988 / IEEE / 0-8186-0830-7
By: Weber, R.;
Enhanced NTSC system, free of chroma-crawl with improved resolution and cross chrominans
1988 / IEEE
By: Ilkovics, D.I.;
Digital schemes for low frequency measurement
1988 / IEEE
By: Narayanaswamy, P.R.;
A 560 megaword per second digital test generator
1988 / IEEE
By: Gille, L.; Lautier, P.;
Applications of a digital signal processor in test instruments
1988 / IEEE
By: Balakrishnan, S.K.; Kareem, A.;
InGaAs/AlInAs HEMT technology for millimeter wave applications
1988 / IEEE
By: Mishra, U.K.; Brown, A.S.;
Operational perspective of SDI
1988 / IEEE
By: Lionetti, D.M.; Dunlap, P.S.;
A superconducting magnetic separator with magnetically balanced matrix
1988 / IEEE
By: Male, S.E.; Lal, D.;
The DSI and below: The architelcture/hardware component of a computer science curriculum
1988 / IEEE / 0-8186-0841-2
By: Patt, Y.N.;
A new architecture for direct drive robots
1988 / IEEE / 0-8186-0852-8
By: Kazerooni, H.; Kim, S.;
Decentralized adaptive control experiments with the PUMA robot arm
1988 / IEEE / 0-8186-0852-8
By: Hsia, T.C.; Gavel, D.T.;
Supplying high availability with a standard network file system
1988 / IEEE / 0-8186-0865-X
By: Schmuck, F.; Marzullo, K.;
Shape transition of the discharge ion distribution around an anode wire of a gas counter
1988 / IEEE
By: Matoba, M.; Sakae, T.; Koori, N.; Fujiki, T.; Uehara, S.; Ijiri, H.; Ohgaki, H.; Urase, K.;
A RAM based CMOS histogrammer integrated circuit
1988 / IEEE
By: Alsford, J.R.; Slorach, F.;
Design and performance of TOPAZ TPC-trigger
1988 / IEEE
By: Enomoto, R.; Shirahashi, A.; Ujiie, N.; Tsukada, K.;
A RICH MWPC pad readout by using custom microplex IC
1988 / IEEE
By: Grudberg, P.; Dhawan, S.K.; Woods, C.; Venkateramania, H.;
Sum and buffer amplifier for lead-glass barrel calorimeter in the TOPAZ detector
1988 / IEEE
By: Ujiie, N.; Inaba, S.; Ikeda, M.;
The ring imaging Cherenkov detector for Fermilab experiment 665
1988 / IEEE
By: Coutrakon, G.B.; Schuler, P.; Dhawan, S.;
A portable measurement system for subcriticality measurements by the CF-source-driven neutron noise analysis method
1988 / IEEE
By: Ragan, G.E.; Mihalczo, J.T.; Blakeman, E.E.;
Throughput analysis of a timer-controlled token-passing protocol under heavy load
1988 / IEEE / 0-8186-0833-1
By: Tobagi, F.A.; Pang, J.W.M.;
A new approach to wideband architecture for shipboard communications systems
1988 / IEEE
By: Koontz, F.A.;
Architectural concepts for C/sup 3/ systems
1988 / IEEE
By: Mayk, I.; Rubin, I.;
Phase synchronizer with the method of least squares without overflow
1988 / IEEE
By: Hagiwara, M.; Nakagawa, M.;
Repair of redundant memories by reduced covering
1988 / IEEE
By: Lombardi, F.; Sciuto, D.;
Counter-based residue arithmetic circuit for VLSI digital signal processing systems
1988 / IEEE
By: Tomabechi, N.;
A new digital-to-analog conversion algorithm
1988 / IEEE
By: Watanabe, K.; Moriuchi, Y.; Temes, G.C.;
MPPM: a method for improving the band-utilization efficiency in optical PPM
1989 / IEEE
By: Nosu, K.; Sugiyama, H.;
Complexity comparison between FFT and DCT based real data Wigner processors
1988 / IEEE / 0-8186-0847-1
By: Wilbur, J.;
Bottom-up evaluation of attribute grammars with two queues
1988 / IEEE / 0-8186-0847-1
By: Naini, M.M.;
Fundamental limitations on repeater jamming of frequency-hopping communications
1989 / IEEE
By: Torrieri, D.J.;
New architectures for systolic hashing
1988 / IEEE / 0-8186-8860-2
By: Panneerselvam, G.; Miller, W.C.; Jullien, G.A.;
Further studies on efficient AFEC schemes for Ka-band satellite systems
1989 / IEEE
By: Khan, M.H.; Bhargava, V.K.; Le-Ngoc, T.;
Subquarter-micrometer gate-length p-channel and n-channel MOSFETs with extremely shallow source-drain junctions
1989 / IEEE
By: Miyake, M.; Okazaki, Y.; Kobayashi, T.;
A near-optimal heuristic algorithm for single-flow routing
1989 / IEEE
By: Du, H.C.; Liu, L.C.;
Narrow-width effects of shallow trench-isolated CMOS with n/sup +/-polysilicon gate
1989 / IEEE
By: Odanaka, S.; Ohe, K.; Fuse, G.; Hori, T.; Moriyama, K.;
Bayesian statistics, factor analysis, and PET images I. Mathematical background
1989 / IEEE
By: Phillips, P.R.;
Gentest: an automatic test-generation system for sequential circuits
1989 / IEEE
By: Cheng, W.-T.; Chakraborty, T.J.;

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