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Topic: Cmos
Results
2011 / IEEE
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
2011 / IEEE
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
2011 / IEEE
By: Tanaka, S.; Fujiwara, H.; Ishii, Y.; Yanagisawa, K.; Kihara, Y.; Nii, K.; Tsukamoto, Y.;
By: Tanaka, S.; Fujiwara, H.; Ishii, Y.; Yanagisawa, K.; Kihara, Y.; Nii, K.; Tsukamoto, Y.;
2011 / IEEE
By: Chien, G.; Chinq-Shiun Chiu; Tzung-Han Wu; Sheng-Jui Huang; Wen-Chang Lee; Hsiang-Hui Chang; Chi-Yao Yu; Sun, C.E.; Lan-Chou Cho; Yen-Horng Chen; Lu, I.S.; Chih-Chun Tang;
By: Chien, G.; Chinq-Shiun Chiu; Tzung-Han Wu; Sheng-Jui Huang; Wen-Chang Lee; Hsiang-Hui Chang; Chi-Yao Yu; Sun, C.E.; Lan-Chou Cho; Yen-Horng Chen; Lu, I.S.; Chih-Chun Tang;
2011 / IEEE
By: Vincent, P.; Siligaris, A.; Cathelin, A.; Busson, P.; Pilard, R.; Yamamoto, S.D.; Dussopt, L.; Lanteri, J.; Dehos, C.; Ferragut, R.; Chaix, F.; Mounet, C.; Martineau, B.; Richard, O.; Belot, D.;
By: Vincent, P.; Siligaris, A.; Cathelin, A.; Busson, P.; Pilard, R.; Yamamoto, S.D.; Dussopt, L.; Lanteri, J.; Dehos, C.; Ferragut, R.; Chaix, F.; Mounet, C.; Martineau, B.; Richard, O.; Belot, D.;
2011 / IEEE
By: Marcu, C.; Jiashu Chen; Tabesh, M.; Alon, E.; Niknejad, A.M.; Shinwon Kang; Lingkai Kong;
By: Marcu, C.; Jiashu Chen; Tabesh, M.; Alon, E.; Niknejad, A.M.; Shinwon Kang; Lingkai Kong;
2011 / IEEE
By: van der Goes, F.M.L.; Mulder, J.; Vecchi, D.; Bult, K.; Westra, J.R.; Jiansong Wan; Ward, C.M.; Ayranci, E.;
By: van der Goes, F.M.L.; Mulder, J.; Vecchi, D.; Bult, K.; Westra, J.R.; Jiansong Wan; Ward, C.M.; Ayranci, E.;
2011 / IEEE
By: Okada, K.; Matsuzawa, A.; Matsushita, K.; Bunsen, K.; Murakami, R.; Musa, A.; Sato, T.; Asada, H.; Takayama, N.; Ito, S.; Chaivipas, W.; Minami, R.; Yamaguchi, T.; Takeuchi, Y.; Yamagishi, H.; Noda, M.; Ning Li;
By: Okada, K.; Matsuzawa, A.; Matsushita, K.; Bunsen, K.; Murakami, R.; Musa, A.; Sato, T.; Asada, H.; Takayama, N.; Ito, S.; Chaivipas, W.; Minami, R.; Yamaguchi, T.; Takeuchi, Y.; Yamagishi, H.; Noda, M.; Ning Li;
2011 / IEEE
By: Yaming Zhang; Ruonan Han; O, K.K.; Brown, E.; Knap, W.; Videlier, H.; Coquillat, D.;
By: Yaming Zhang; Ruonan Han; O, K.K.; Brown, E.; Knap, W.; Videlier, H.; Coquillat, D.;
2011 / IEEE
By: Takeda, T.; Hajimiri, A.; Ohashi, S.; Hino, Y.; Fukuda, S.; Yamagishi, H.; Kawasaki, K.; Akiyama, Y.; Uno, M.; Komori, K.; Shinke, S.;
By: Takeda, T.; Hajimiri, A.; Ohashi, S.; Hino, Y.; Fukuda, S.; Yamagishi, H.; Kawasaki, K.; Akiyama, Y.; Uno, M.; Komori, K.; Shinke, S.;
2011 / IEEE
By: Gloria, D.; Lepilliet, S.; Tagro, Y.; Danneville, F.; Poulain, L.; Raynaud, C.; Lesecq, M.; Dubois, E.; Lecavelier des Etangs-Levallois, A.; Troadec, D.;
By: Gloria, D.; Lepilliet, S.; Tagro, Y.; Danneville, F.; Poulain, L.; Raynaud, C.; Lesecq, M.; Dubois, E.; Lecavelier des Etangs-Levallois, A.; Troadec, D.;
2011 / IEEE
By: Kruseman, B.; Hora, C.; Eichenberger, S.; Figueras, J.; Rodriguez-Montanes, R.; Arumi, D.;
By: Kruseman, B.; Hora, C.; Eichenberger, S.; Figueras, J.; Rodriguez-Montanes, R.; Arumi, D.;
2011 / IEEE
By: Seong-Hyok Kim; Sungho Beck; Kwanyeob Chae; Jaehyouk Choi; Kim, S.T.; Bien, F.; Laskar, J.; Tentzeris, M.M.; Kyutae Lim; Chang-Ho Lee;
By: Seong-Hyok Kim; Sungho Beck; Kwanyeob Chae; Jaehyouk Choi; Kim, S.T.; Bien, F.; Laskar, J.; Tentzeris, M.M.; Kyutae Lim; Chang-Ho Lee;
2011 / IEEE
By: LaBel, K.A.; Gordon, M.S.; Tang, H.H.K.; Marshall, P.W.; Pellish, J.A.; Heidel, D.F.; Rodbell, K.P.; Seidleck, C.M.; Phan, A.M.; Friendlich, M.R.; Murray, C.E.; Kim, H.S.; Berg, M.D.; Schwank, J.R.; Stawiasz, K.G.;
By: LaBel, K.A.; Gordon, M.S.; Tang, H.H.K.; Marshall, P.W.; Pellish, J.A.; Heidel, D.F.; Rodbell, K.P.; Seidleck, C.M.; Phan, A.M.; Friendlich, M.R.; Murray, C.E.; Kim, H.S.; Berg, M.D.; Schwank, J.R.; Stawiasz, K.G.;
2011 / IEEE
By: Hjalmarson, H.P.; Rax, B.G.; Adell, P.C.; Barnaby, H.J.; Esqueda, I.S.; Pease, R.L.; McLain, M.L.;
By: Hjalmarson, H.P.; Rax, B.G.; Adell, P.C.; Barnaby, H.J.; Esqueda, I.S.; Pease, R.L.; McLain, M.L.;
2012 / IEEE
By: Saxena, A.K.; Manhas, S.K.; Maheshwaram, S.; Rathod, S.S.; Kaushal, G.; Dasgupta, S.;
By: Saxena, A.K.; Manhas, S.K.; Maheshwaram, S.; Rathod, S.S.; Kaushal, G.; Dasgupta, S.;
2012 / IEEE
By: Osipenko, P. N.; Pechenkin, A. A.; Antonov, A. A.; Vasilegin, B. V.; Gorbunov, M. S.; Yanenko, A. V.; Zebrev, G. I.; Chumakov, A. I.; Useinov, R. G.; Ozerov, A. I.; Emeliyanov, V. V.; Anashin, V. S.;
By: Osipenko, P. N.; Pechenkin, A. A.; Antonov, A. A.; Vasilegin, B. V.; Gorbunov, M. S.; Yanenko, A. V.; Zebrev, G. I.; Chumakov, A. I.; Useinov, R. G.; Ozerov, A. I.; Emeliyanov, V. V.; Anashin, V. S.;
2012 / IEEE
By: Bonnin, O.; Sun, X.; Ho, B.; Liu, T.-J. K.; Nguyen, B.-Y.; Xu, N.; Akasaka, Y.; Tomoyasu, M.; Maekawa, K.; Sako, T.;
By: Bonnin, O.; Sun, X.; Ho, B.; Liu, T.-J. K.; Nguyen, B.-Y.; Xu, N.; Akasaka, Y.; Tomoyasu, M.; Maekawa, K.; Sako, T.;
2012 / IEEE
By: Yuanjin Zheng; Shengxi Diao; Chun-Huat Heng; Minkyu Je; Xiaojun Yuan; San-Jeow Cheng; Yuan Gao;
By: Yuanjin Zheng; Shengxi Diao; Chun-Huat Heng; Minkyu Je; Xiaojun Yuan; San-Jeow Cheng; Yuan Gao;
2012 / IEEE
By: Wei-Hung Chou; Hong-Yuan Yang; Jeng-Han Tsai; Wei-Tsung Li; Tian-Wei Huang; Hsin-Chia Lu; Shyh-Buu Gea;
By: Wei-Hung Chou; Hong-Yuan Yang; Jeng-Han Tsai; Wei-Tsung Li; Tian-Wei Huang; Hsin-Chia Lu; Shyh-Buu Gea;
2012 / IEEE
By: Youngchang Yoon; Kenney, J.S.; Chang-Ho Lee; Ockgoo Lee; Kyu Hwan An; Hyungwook Kim; Jihwan Kim;
By: Youngchang Yoon; Kenney, J.S.; Chang-Ho Lee; Ockgoo Lee; Kyu Hwan An; Hyungwook Kim; Jihwan Kim;
2012 / IEEE
By: Kauppila, J.S.; Gaspard, N.J.; Bhuva, B.L.; Jagannathan, S.; Loveless, T.D.; Massengill, L.W.; Kauppila, A.V.; Holman, W.T.; Vaughn, G.L.; Wong, R.; Wen, S.J.;
By: Kauppila, J.S.; Gaspard, N.J.; Bhuva, B.L.; Jagannathan, S.; Loveless, T.D.; Massengill, L.W.; Kauppila, A.V.; Holman, W.T.; Vaughn, G.L.; Wong, R.; Wen, S.J.;
2012 / IEEE
By: LaBel, K.; Wilcox, E.P.; Carts, M.A.; Poongyeub Lee; Nguyen, V.; Rezgui, S.; McCollum, J.; Telecco, N.;
By: LaBel, K.; Wilcox, E.P.; Carts, M.A.; Poongyeub Lee; Nguyen, V.; Rezgui, S.; McCollum, J.; Telecco, N.;
2011 / IEEE
By: Liang-Teck Pang; Zheng Guo; Giraud, B.; Jaehwa Kwak; Ji-Hoon Park; Seng Oon Toh; Nikolic, B.; Spanos, C.; Kun Qian; Jevtic, R.;
By: Liang-Teck Pang; Zheng Guo; Giraud, B.; Jaehwa Kwak; Ji-Hoon Park; Seng Oon Toh; Nikolic, B.; Spanos, C.; Kun Qian; Jevtic, R.;
2012 / IEEE
By: Mirzaei, A.; Hafez, A.A.; Abidi, A.; Darabi, H.; Murphy, D.; Chang, M.-C.F.; Mikhemar, M.;
By: Mirzaei, A.; Hafez, A.A.; Abidi, A.; Darabi, H.; Murphy, D.; Chang, M.-C.F.; Mikhemar, M.;
2012 / IEEE
By: Viktorovitch, P.; Fedeli, J.M.; Letartre, X.; Orobtchouk, R.; Mandorlo, F.; Ferrier, L.; Olivier, N.; Romeo, P.R.;
By: Viktorovitch, P.; Fedeli, J.M.; Letartre, X.; Orobtchouk, R.; Mandorlo, F.; Ferrier, L.; Olivier, N.; Romeo, P.R.;
2012 / IEEE
By: Yan-Yu Huang; Yunseo Park; Hamhee Jeon; Kenney, J.S.; Chang-Ho Lee; Kun-Seok Lee; Jihwan Kim;
By: Yan-Yu Huang; Yunseo Park; Hamhee Jeon; Kenney, J.S.; Chang-Ho Lee; Kun-Seok Lee; Jihwan Kim;
2012 / IEEE
By: Kaiser, A.; Niknejad, A.; Cathelin, A.; Lu Ye; Frappe, A.; Stefanelli, B.; Muller, J.;
By: Kaiser, A.; Niknejad, A.; Cathelin, A.; Lu Ye; Frappe, A.; Stefanelli, B.; Muller, J.;
2012 / IEEE
By: Jungkyu Kim; Megens, M.; Duan, Y.; Skucha, K.; Izyumin, I.I.; Liu, P.P.; Boser, B.; Gambini, S.;
By: Jungkyu Kim; Megens, M.; Duan, Y.; Skucha, K.; Izyumin, I.I.; Liu, P.P.; Boser, B.; Gambini, S.;
2012 / IEEE
By: Kornegay, K.T.; Chang-Ho Lee; Hyungwook Kim; Youngchang Yoon; Jihwan Kim; Hamhee Jeon; Woonyun Kim; Yan-Yu Huang;
By: Kornegay, K.T.; Chang-Ho Lee; Hyungwook Kim; Youngchang Yoon; Jihwan Kim; Hamhee Jeon; Woonyun Kim; Yan-Yu Huang;