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Topic: Circuit Testing
Results
2011 / IEEE / 978-1-61284-137-3
By: Todri, A.; Virazel, A.; Pravossoudovitch, S.; Girard, P.; Dilillo, L.; Bosio, A.;
By: Todri, A.; Virazel, A.; Pravossoudovitch, S.; Girard, P.; Dilillo, L.; Bosio, A.;
2011 / IEEE / 978-1-4577-1236-4
By: Romero, E.A.; Laprovitta, A.M.; Peretti, G.M.; Peralta, J.M.; Marques, C.;
By: Romero, E.A.; Laprovitta, A.M.; Peretti, G.M.; Peralta, J.M.; Marques, C.;
2011 / IEEE / 978-1-4577-0223-5
By: Chia-Lung Ni; Jen-Chieh Tsai; Yi-Ting Chen; Chi-Lin Chen; Chun-Yen Chen; Heng-Lin Pan; Chih-Jen Chen; Ke-Horng Chen;
By: Chia-Lung Ni; Jen-Chieh Tsai; Yi-Ting Chen; Chi-Lin Chen; Chun-Yen Chen; Heng-Lin Pan; Chih-Jen Chen; Ke-Horng Chen;
2011 / IEEE / 978-89-88678-61-9
By: Ji-Hye Jang; Liyan Jin; Dong-Hoon Lee; In-Hwa Choi; Young-Bae Park; Young-Hee Kim; Pan-Bong Ha;
By: Ji-Hye Jang; Liyan Jin; Dong-Hoon Lee; In-Hwa Choi; Young-Bae Park; Young-Hee Kim; Pan-Bong Ha;
Accurate signature driven power conscious tuning of RF systems using hierarchical performance models
2011 / IEEE / 978-1-4577-0152-8By: Devarakond, S.; Sen, S.; Banerjee, A.; Chatterjee, A.;
2011 / IEEE / 978-1-4577-0586-1
By: Thomson, E.T.; Hood, R.; Pearce, L.G.; van Vonno, N.W.; Chesley, P.J.; Bernard, T.M.;
By: Thomson, E.T.; Hood, R.; Pearce, L.G.; van Vonno, N.W.; Chesley, P.J.; Bernard, T.M.;
2011 / IEEE / 978-1-4577-0152-8
By: Min-Hsiu Tsai; Ming-Tung Chang; Li, J.C.-M.; Kuan-Yu Liao; Chih-Mou Tseng; Yu-Chuan Huang; Jen-Yang Wen; Min-Hong Tsai; Hung-Chun Li;
By: Min-Hsiu Tsai; Ming-Tung Chang; Li, J.C.-M.; Kuan-Yu Liao; Chih-Mou Tseng; Yu-Chuan Huang; Jen-Yang Wen; Min-Hong Tsai; Hung-Chun Li;
2011 / IEEE / 978-1-4577-0152-8
By: Ichiyama, K.; Ishida, M.; Okayasu, T.; Kawabata, M.; Watanabe, D.;
By: Ichiyama, K.; Ishida, M.; Okayasu, T.; Kawabata, M.; Watanabe, D.;
2011 / IEEE / 978-1-4577-0128-3
By: Abdelhalim, M.B.; Khalil, A.H.; Hamed, S.M.; Madian, A.H.; Amer, H.H.;
By: Abdelhalim, M.B.; Khalil, A.H.; Hamed, S.M.; Madian, A.H.; Amer, H.H.;
2011 / IEEE / 978-1-4577-0255-6
By: Manikandan, V.; Kavithamani, A.; Ramakrishnan, K.; Devarajan, N.;
By: Manikandan, V.; Kavithamani, A.; Ramakrishnan, K.; Devarajan, N.;
2011 / IEEE / 978-1-4577-1984-4
By: Nan-Hsin Tseng; Li, J.C.-M.; Wei-Li Hsu; Po-Juei Chen; Liu, C.C.C.; Wei-pin Changchien; Kuo-Yin Chen;
By: Nan-Hsin Tseng; Li, J.C.-M.; Wei-Li Hsu; Po-Juei Chen; Liu, C.C.C.; Wei-pin Changchien; Kuo-Yin Chen;
2011 / IEEE / 978-1-4673-0120-6
By: Chen Shao-min; Xue Tao; Gong Guanghua; Gong Hui; Wang Xi; Shao Bei-bei;
By: Chen Shao-min; Xue Tao; Gong Guanghua; Gong Hui; Wang Xi; Shao Bei-bei;
2011 / IEEE / 978-0-7695-4479-3
By: Miyashita, H.; Wakabayashi, K.; Gake, T.; Yano, Y.; Rikino, K.; Kishigami, S.; Yamada, T.; Niitsu, K.; Kobayashi, H.; Kato, K.; Kobayashi, O.; Uemori, S.;
By: Miyashita, H.; Wakabayashi, K.; Gake, T.; Yano, Y.; Rikino, K.; Kishigami, S.; Yamada, T.; Niitsu, K.; Kobayashi, H.; Kato, K.; Kobayashi, O.; Uemori, S.;