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Topic: Circuit Layout
Results
2011 / IEEE
By: Massengill, L.W.; Bhuva, B.L.; Sternberg, A.L.; Jagannathan, S.; Kauppila, J.S.; Kauppila, A.V.; Ball, D.R.; Haeffner, T.D.; Loveless, T.D.;
By: Massengill, L.W.; Bhuva, B.L.; Sternberg, A.L.; Jagannathan, S.; Kauppila, J.S.; Kauppila, A.V.; Ball, D.R.; Haeffner, T.D.; Loveless, T.D.;
2011 / IEEE
By: Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.L.; Tedesco, J.L.; Yanqing Wu; Dimitrakopoulos, C.; Farmer, D.B.; Yu-Ming Lin; Jenkins, K.A.; Avouris, P.;
By: Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.L.; Tedesco, J.L.; Yanqing Wu; Dimitrakopoulos, C.; Farmer, D.B.; Yu-Ming Lin; Jenkins, K.A.; Avouris, P.;
2012 / IEEE
By: Johnson, W.; Holmes, J.; Xueyang Geng; Mantooth, A.; Cornett, K.; Dai, F.; Blalock, B.; Ulaganathan, C.; Garbos, R.; Berger, R.; England, T.D.; Diestelhorst, R.M.; Cressler, J.D.; Eckert, C.; Frampton, R.; Peltz, L.; Mojarradi, M.; McCluskey, P.; Reed, R.; Alles, M.;
By: Johnson, W.; Holmes, J.; Xueyang Geng; Mantooth, A.; Cornett, K.; Dai, F.; Blalock, B.; Ulaganathan, C.; Garbos, R.; Berger, R.; England, T.D.; Diestelhorst, R.M.; Cressler, J.D.; Eckert, C.; Frampton, R.; Peltz, L.; Mojarradi, M.; McCluskey, P.; Reed, R.; Alles, M.;
2012 / IEEE
By: Barlow, M.; Dai, F.; Blalock, B.; Garbos, R.; Berger, R.; Mantooth, A.; Reed, R.; Alles, M.; Ramachandran, V.; Cressler, J.D.; Kenyon, E.W.; Diestelhorst, R.M.; England, T.D.; Eckert, C.; Frampton, R.; Peltz, L.; Mojarradi, M.; McCluskey, P.; Webber, C.; Holmes, J.; Ellis, C.; Johnson, W.;
By: Barlow, M.; Dai, F.; Blalock, B.; Garbos, R.; Berger, R.; Mantooth, A.; Reed, R.; Alles, M.; Ramachandran, V.; Cressler, J.D.; Kenyon, E.W.; Diestelhorst, R.M.; England, T.D.; Eckert, C.; Frampton, R.; Peltz, L.; Mojarradi, M.; McCluskey, P.; Webber, C.; Holmes, J.; Ellis, C.; Johnson, W.;
2011 / IEEE / 978-1-4577-1400-9
By: Wei-Zen Chen; Chien-Hung Chen; Po-Cheng Pan; Tung-Chieh Chen; Hung-Ming Chen; Yi-Peng Weng;
By: Wei-Zen Chen; Chien-Hung Chen; Po-Cheng Pan; Tung-Chieh Chen; Hung-Ming Chen; Yi-Peng Weng;
2011 / IEEE / 978-1-4577-0115-3
By: Kaczer, B.; da Silva, M.B.; Groeseneken, G.; Wirth, G.I.; Van der Plas, G.;
By: Kaczer, B.; da Silva, M.B.; Groeseneken, G.; Wirth, G.I.; Van der Plas, G.;
2011 / IEEE / 978-1-4577-0152-8
By: Chao, M.C.-T.; Meng-Chen Wu; Tsung-Wei Chang; Kuo-An Chen; Chen, S.; Jing-Yang Jou;
By: Chao, M.C.-T.; Meng-Chen Wu; Tsung-Wei Chang; Kuo-An Chen; Chen, S.; Jing-Yang Jou;
2012 / IEEE / 978-1-4577-2081-9
By: Kuen-Di Lee; Nan-Chun Lien; Wei Hwang; Shyh-Jye Jou; Ching-Te Chuang; Wei-Chiang Shih; Geng-Cing Lin; Hao-I Yang; Ming-Chien Tsai; Yi-Wei Lin; Shao-Cheng Wang;
By: Kuen-Di Lee; Nan-Chun Lien; Wei Hwang; Shyh-Jye Jou; Ching-Te Chuang; Wei-Chiang Shih; Geng-Cing Lin; Hao-I Yang; Ming-Chien Tsai; Yi-Wei Lin; Shao-Cheng Wang;
2012 / IEEE / 978-1-4577-1619-5
By: Jiang Xu; Zhehui Wang; Zhe Wang; Xuan Wang; Xiaowen Wu; Nikdast, M.; Weichen Liu; Wei Zhang; Yaoyao Ye;
By: Jiang Xu; Zhehui Wang; Zhe Wang; Xuan Wang; Xiaowen Wu; Nikdast, M.; Weichen Liu; Wei Zhang; Yaoyao Ye;
2012 / IEEE / 978-1-4503-1199-1
By: Jiang, I.H.-R.; Sinha, S.; Ya-Chung Chan; Yen-Ting Yu; Chiang, C.;
By: Jiang, I.H.-R.; Sinha, S.; Ya-Chung Chan; Yen-Ting Yu; Chiang, C.;