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Topic: Circuit Architecture
Results
2009 / IEEE / 978-1-4577-0493-2
By: Tavernier, C.; Roche, P.; Gasiot, G.; Uznanski, S.; Autran, J.-L.;
By: Tavernier, C.; Roche, P.; Gasiot, G.; Uznanski, S.; Autran, J.-L.;
2011 / IEEE / 978-1-61284-857-0
By: Seng-Pan U; Sai-Weng Sin; Yang Jiang; Chen-Yan Cai; Martins, R.P.;
By: Seng-Pan U; Sai-Weng Sin; Yang Jiang; Chen-Yan Cai; Martins, R.P.;
2011 / IEEE / 978-1-4577-0001-9
By: Gwo-Jen Chiou; Tsung-Cheng Chen; Chen-Chih Yang; Hsien-Te Chiu; Jeng-Yue Chen;
By: Gwo-Jen Chiou; Tsung-Cheng Chen; Chen-Chih Yang; Hsien-Te Chiu; Jeng-Yue Chen;
2014 / IEEE
By: Putcha, Vamsi; Groeseneken, Guido; Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Bury, Erik;
By: Putcha, Vamsi; Groeseneken, Guido; Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Bury, Erik;
1993 / IEEE / 0-7803-1203-1
By: Hawkins, S.A.; Cravey, W.R.; Newton, M.A.; Ollis, C.W.; Kirbie, H.C.;
By: Hawkins, S.A.; Cravey, W.R.; Newton, M.A.; Ollis, C.W.; Kirbie, H.C.;
1993 / IEEE / 0-8186-3560-6
By: Pennington, T.; DiBitonto, D.; Subhani, K.F.; Stronczer, J.; Baier, S.;
By: Pennington, T.; DiBitonto, D.; Subhani, K.F.; Stronczer, J.; Baier, S.;
1995 / IEEE / 0-7803-2495-1
By: Frary, K.; Gullard, T.; Fackenthal, R.; Bashir, A.; Bauer, M.; Mills, D.; Tsang, J.; Sweha, S.; Sambandan, S.; Rozman, R.; Rashid, M.; Pudar, S.; Leak, D.; Kwong, P.; Javanifard, J.; Haid, C.;
By: Frary, K.; Gullard, T.; Fackenthal, R.; Bashir, A.; Bauer, M.; Mills, D.; Tsang, J.; Sweha, S.; Sambandan, S.; Rozman, R.; Rashid, M.; Pudar, S.; Leak, D.; Kwong, P.; Javanifard, J.; Haid, C.;
1996 / IEEE / 0-7803-3259-8
By: Montes, M.; Lopez, O.; Gomez, J.M.; Herms, A.; Juvells, I.; Bota, S.A.;
By: Montes, M.; Lopez, O.; Gomez, J.M.; Herms, A.; Juvells, I.; Bota, S.A.;
1998 / IEEE / 0-7803-4997-0
By: Walke, R.; McCanny, J.; Woods, R.; Lightbody, G.; Trainor, D.; Hu, Y.;
By: Walke, R.; McCanny, J.; Woods, R.; Lightbody, G.; Trainor, D.; Hu, Y.;
1998 / IEEE / 0-7803-4900-8
By: Bertenburg, R.M.; Janssen, G.; Brennemann, A.; Pacha, C.; Auer, U.; Brockerhoff, W.; Tegude, F.-J.; Prost, W.; Goser, K.F.; Bushehri, E.;
By: Bertenburg, R.M.; Janssen, G.; Brennemann, A.; Pacha, C.; Auer, U.; Brockerhoff, W.; Tegude, F.-J.; Prost, W.; Goser, K.F.; Bushehri, E.;
2000 / IEEE / 0-7803-6475-9
By: Xia, B.; Moon, S.T.; Sanchez-Sinencio, E.; Gunhee Han; Spencer, R.G.;
By: Xia, B.; Moon, S.T.; Sanchez-Sinencio, E.; Gunhee Han; Spencer, R.G.;
2006 / IEEE
By: Baze, M.P.; McMorrow, D.; Massengill, L.; Amusan, O.A.; Wert, J.; Witulski, A.; Hubert, M.G.; Clement, J.W.;
By: Baze, M.P.; McMorrow, D.; Massengill, L.; Amusan, O.A.; Wert, J.; Witulski, A.; Hubert, M.G.; Clement, J.W.;
2007 / IEEE / 1-4244-0687-0
By: Kim, H.; Bien, F.; Chandramouli, S.; Laskar, J.; Scholz, C.; Gebara, E.;
By: Kim, H.; Bien, F.; Chandramouli, S.; Laskar, J.; Scholz, C.; Gebara, E.;