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Topic: Charge Pumps
Results
2011 / IEEE
By: Phillips, S.D.; Horst, S.J.; LaBel, K.; Wilcox, E.; Benyong Zhang; O'Farrell, P.; Aude, A.; Eddy, R.; Kruckmeyer, K.; Cressler, J.D.;
By: Phillips, S.D.; Horst, S.J.; LaBel, K.; Wilcox, E.; Benyong Zhang; O'Farrell, P.; Aude, A.; Eddy, R.; Kruckmeyer, K.; Cressler, J.D.;
2012 / IEEE
By: Blalock, B.J.; Nambiar, N.; Ulaganathan, C.; Tham, K.V.; Greenwell, R.L.; Holleman, J.; Ericson, M.N.; Britton, C.L.;
By: Blalock, B.J.; Nambiar, N.; Ulaganathan, C.; Tham, K.V.; Greenwell, R.L.; Holleman, J.; Ericson, M.N.; Britton, C.L.;
Charge Pumping Measurements of Radiation-Induced Interface-Trap Density in Floating-Body SOI FinFETs
2012 / IEEEBy: Schrimpf, R.D.; Francis, S.A.; Zhang, C.X.; Duan, G.X.; Fleetwood, D.M.; Zhang, E.X.;
2012 / IEEE
By: Chhabra, M.; Cox, C.E.; Blanco, R.; Seongwon Kim; Bucossi, W.L.; Iadanza, J.A.; LeBlanc, C.D.; Toprak-Deniz, Z.; Bulzacchelli, J.F.; Friedman, D.J.; Rasmus, T.M.; Trudeau, C.L.;
By: Chhabra, M.; Cox, C.E.; Blanco, R.; Seongwon Kim; Bucossi, W.L.; Iadanza, J.A.; LeBlanc, C.D.; Toprak-Deniz, Z.; Bulzacchelli, J.F.; Friedman, D.J.; Rasmus, T.M.; Trudeau, C.L.;
2009 / IEEE / 978-1-4577-0493-2
By: Bhuva, B.L.; Vaughn, G.L.; Loveless, T.D.; Kauppila, A.V.; Holman, W.T.; Massengill, L.W.;
By: Bhuva, B.L.; Vaughn, G.L.; Loveless, T.D.; Kauppila, A.V.; Holman, W.T.; Massengill, L.W.;
2011 / IEEE / 978-1-4244-9312-8
By: Emira, A.; Mohieldin, A.; AbdElFattah, M.; Sanchez-Sinencio, E.;
By: Emira, A.; Mohieldin, A.; AbdElFattah, M.; Sanchez-Sinencio, E.;
2011 / IEEE / 978-1-61284-175-5
By: Minsheng Wang; Jungwoo Song; Xicheng Jiang; Brooks, T.L.; Jianlong Chen; Abdelfattah, K.; Galal, S.; Hui Zheng;
By: Minsheng Wang; Jungwoo Song; Xicheng Jiang; Brooks, T.L.; Jianlong Chen; Abdelfattah, K.; Galal, S.; Hui Zheng;
2011 / IEEE / 978-1-4244-9312-8
By: Emira, A.; Abdelaziz, S.; Soliman, A.M.; Mohieldin, A.N.; Radwan, A.G.;
By: Emira, A.; Abdelaziz, S.; Soliman, A.M.; Mohieldin, A.N.; Radwan, A.G.;
2011 / IEEE / 978-1-4244-9312-8
By: Erdogan, A.T.; Haridas, N.; El-Rayis, A.O.; Noordin, N.H.; Yan Chiew Wong; Arslan, T.;
By: Erdogan, A.T.; Haridas, N.; El-Rayis, A.O.; Noordin, N.H.; Yan Chiew Wong; Arslan, T.;
Miniaturized SiP supply board based on TPVD charge pump ICs for high-voltage biomedical applications
2011 / IEEE / 978-1-61284-137-3By: Miribel-Catala, P.; Mounaim, F.; Saiz-Vela, A.; Samitier, J.; Sawan, M.;
2011 / IEEE / 978-1-4577-0618-9
By: Yan Chiew Wong; Arslan, T.; Erdogan, A.T.; Haridas, N.; El-Rayis, A.O.; Wei Zhou;
By: Yan Chiew Wong; Arslan, T.; Erdogan, A.T.; Haridas, N.; El-Rayis, A.O.; Wei Zhou;
2011 / IEEE / 978-1-4577-0618-9
By: Lacaita, A.L.; Samori, C.; Levantino, S.; Maffezzoni, P.; Santomauro, M.; D'Amore, D.;
By: Lacaita, A.L.; Samori, C.; Levantino, S.; Maffezzoni, P.; Santomauro, M.; D'Amore, D.;
2011 / IEEE / 978-1-4244-9477-4
By: Raja Paul Perinbam, J.; Sridhar, R.; Shankar, M.; Meganathan, D.; Moorthi, S.;
By: Raja Paul Perinbam, J.; Sridhar, R.; Shankar, M.; Meganathan, D.; Moorthi, S.;
2011 / IEEE / 978-1-4577-1400-9
By: Yaldiz, S.; Althoff, M.; Pileggi, L.; Krogh, B.H.; Xin Li; Rajhans, A.;
By: Yaldiz, S.; Althoff, M.; Pileggi, L.; Krogh, B.H.; Xin Li; Rajhans, A.;
2011 / IEEE / 978-1-4577-0586-1
By: Galloway, K.F.; Schrimpf, R.D.; Fleetwood, D.M.; En Xia Zhang; Simoen, E.; Francis, S.A.; Claeys, C.; Cher Xuan Zhang; Mitard, J.;
By: Galloway, K.F.; Schrimpf, R.D.; Fleetwood, D.M.; En Xia Zhang; Simoen, E.; Francis, S.A.; Claeys, C.; Cher Xuan Zhang; Mitard, J.;
2011 / IEEE / 978-1-4577-1785-7
By: Junseop Chung; Duckju Kim; Sungdae Choi; Jeil Ryu; Sungwook Choi; Bongseok Han; Hyunchul Cho; Yujong Noh; Sam-Kyu Won; Eui-Young Chung;
By: Junseop Chung; Duckju Kim; Sungdae Choi; Jeil Ryu; Sungwook Choi; Bongseok Han; Hyunchul Cho; Yujong Noh; Sam-Kyu Won; Eui-Young Chung;
2011 / IEEE / 978-1-4577-1785-7
By: Okuma, Y.; Xin Zhang; Ishida, K.; Po-Hung Chen; Sakurai, T.; Takamiya, M.; Ryu, Y.;
By: Okuma, Y.; Xin Zhang; Ishida, K.; Po-Hung Chen; Sakurai, T.; Takamiya, M.; Ryu, Y.;
2011 / IEEE / 978-1-4577-0115-3
By: Campbell, J.P.; Southwick, R.G.; Ryan, J.T.; Suehle, J.S.; Young, C.D.; Cheung, K.P.;
By: Campbell, J.P.; Southwick, R.G.; Ryan, J.T.; Suehle, J.S.; Young, C.D.; Cheung, K.P.;
2011 / IEEE / 978-1-4577-0115-3
By: Lelis, A.J.; Fronheiser, J.; Ryan, J.T.; Lenahan, P.M.; Bittel, B.C.;
By: Lelis, A.J.; Fronheiser, J.; Ryan, J.T.; Lenahan, P.M.; Bittel, B.C.;
2011 / IEEE / 978-1-4577-1756-7
By: Zhang, C.X.; Francis, S.A.; Fleetwood, D.M.; Zhang, E.X.; Schrimpf, R.D.; El-Mamouni, F.;
By: Zhang, C.X.; Francis, S.A.; Fleetwood, D.M.; Zhang, E.X.; Schrimpf, R.D.; El-Mamouni, F.;
2011 / IEEE / 978-1-4577-0796-4
By: Fu Qiang; Chen Weiping; Liu Xiaowei; Li Yaoguang; Song Ran; Yuan Yuan;
By: Fu Qiang; Chen Weiping; Liu Xiaowei; Li Yaoguang; Song Ran; Yuan Yuan;
2012 / IEEE / 978-1-4673-0772-7
By: Takamiya, M.; Ryu, Y.; Okuma, Y.; Xin Zhang; Ishida, K.; Po-Hung Chen; Sakurai, T.;
By: Takamiya, M.; Ryu, Y.; Okuma, Y.; Xin Zhang; Ishida, K.; Po-Hung Chen; Sakurai, T.;