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Topic: Calibration Curve
Results
2011 / IEEE / 978-1-4577-1664-5
By: Heidemann, B.R.; Fabris, J.L.; Muller, M.; Yamamoto, C.I.; Cocco, L.C.; Possetti, G.R.C.;
By: Heidemann, B.R.; Fabris, J.L.; Muller, M.; Yamamoto, C.I.; Cocco, L.C.; Possetti, G.R.C.;
1995 / IEEE
By: Scannavini, M.G.; Querzola, E.; Guidi, G.; Baldazzi, G.; Rossi, M.; Casali, F.; Zanarini, M.; Festinesi, A.; Chirco, P.; Garagnani, A.;
By: Scannavini, M.G.; Querzola, E.; Guidi, G.; Baldazzi, G.; Rossi, M.; Casali, F.; Zanarini, M.; Festinesi, A.; Chirco, P.; Garagnani, A.;
1994 / IEEE / 0-7803-2544-3
By: Garagnani, A.; Rossi, M.; Chirco, P.; Zanarini, M.; Festinesi, A.; Baldazzi, G.; Casali, F.; Scannavini, M.G.; Querzola, E.; Guidi, G.;
By: Garagnani, A.; Rossi, M.; Chirco, P.; Zanarini, M.; Festinesi, A.; Baldazzi, G.; Casali, F.; Scannavini, M.G.; Querzola, E.; Guidi, G.;
1996 / IEEE / 0-7803-3289-X
By: Rathmell, R.D.; Kamenitsa, D.E.; Simonton, R.B.; King, M.L.; Lillian, P.K.; McCoy, W.R.;
By: Rathmell, R.D.; Kamenitsa, D.E.; Simonton, R.B.; King, M.L.; Lillian, P.K.; McCoy, W.R.;
1997 / IEEE / 0-7803-3583-X
By: Chan, B.C.B.; Wang, H.; Lam, F.K.; Poon, W.F.; Lui, P.W.; Chan, F.H.Y.;
By: Chan, B.C.B.; Wang, H.; Lam, F.K.; Poon, W.F.; Lui, P.W.; Chan, F.H.Y.;
1999 / IEEE / 0-7803-5722-1
By: Anisimkin, I.V.; Penza, M.; Verona, E.; Caliendo, C.; Anisimkin, V.I.;
By: Anisimkin, I.V.; Penza, M.; Verona, E.; Caliendo, C.; Anisimkin, V.I.;
2003 / IEEE / 0-7803-7789-3
By: Piccini, L.; Di Rienzo, M.; Andreoni, G.; Zanetti, L.; Usce, L.; Castiglioni, P.;
By: Piccini, L.; Di Rienzo, M.; Andreoni, G.; Zanetti, L.; Usce, L.; Castiglioni, P.;
2004 / IEEE / 0-7803-8700-7
By: Limpa-Amara, N.; Moore, S.C.; Park, M.-A.; Makrigiorgos, G.M.; Mahmood, A.; Zimmerman, R.E.;
By: Limpa-Amara, N.; Moore, S.C.; Park, M.-A.; Makrigiorgos, G.M.; Mahmood, A.; Zimmerman, R.E.;
2007 / IEEE / 1-4244-0711-7
By: Baugh, K.E.; Elvidge, C.D.; Erwin, E.H.; Turtle, B.T.; Sutton, P.C.; Howard, A.T.;
By: Baugh, K.E.; Elvidge, C.D.; Erwin, E.H.; Turtle, B.T.; Sutton, P.C.; Howard, A.T.;
2009 / IEEE / 978-1-4244-2977-6
By: Akiyama, S.; Kim, B.J.; Bergaud, C.; Low, P.; Takama, N.; Fattaccioli, J.; Cheng, Y.T.;
By: Akiyama, S.; Kim, B.J.; Bergaud, C.; Low, P.; Takama, N.; Fattaccioli, J.; Cheng, Y.T.;
2009 / IEEE / 978-1-4244-2902-8
By: Xiaoliang Cheng; Yuanna Zhu; Shenguang Ge; Ai Gao; Jinghua Yu; Ping Dai;
By: Xiaoliang Cheng; Yuanna Zhu; Shenguang Ge; Ai Gao; Jinghua Yu; Ping Dai;
2010 / IEEE / 978-1-4244-4731-2
By: Bergstrom, D.E.; Alam, M.A.; Nair, P.R.; Elibol, O.H.; Dorvel, B.R.; Reddy, B.; Bashir, R.;
By: Bergstrom, D.E.; Alam, M.A.; Nair, P.R.; Elibol, O.H.; Dorvel, B.R.; Reddy, B.; Bashir, R.;
2010 / IEEE / 978-4-88552-246-8
By: Yin-Lin Lu; Ting-Qian Lin; Cheng-chih Hsu; Wen-Chen Chang; Chia-yi Yeh;
By: Yin-Lin Lu; Ting-Qian Lin; Cheng-chih Hsu; Wen-Chen Chang; Chia-yi Yeh;