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Topic: Bubbles
Results
2011 / IEEE
By: McBride, R.D.; Serrano, J.D.; Rogers, T.J.; Cuneo, M.E.; Jennings, C.A.; Cleveland, M.; Suzuki-Vidal, F.; Hall, G.N.; Chittenden, J.P.; Lebedev, S.V.; Bland, S.N.; Ampleford, D.J.; Jones, M.C.; Peyton, B.;
By: McBride, R.D.; Serrano, J.D.; Rogers, T.J.; Cuneo, M.E.; Jennings, C.A.; Cleveland, M.; Suzuki-Vidal, F.; Hall, G.N.; Chittenden, J.P.; Lebedev, S.V.; Bland, S.N.; Ampleford, D.J.; Jones, M.C.; Peyton, B.;
2012 / IEEE
By: Oshita, D.; Akiyama, H.; Katsuki, S.; Sakugawa, T.; Miyamoto, Y.; Okuda, Y.; Hosseini, S.H.R.;
By: Oshita, D.; Akiyama, H.; Katsuki, S.; Sakugawa, T.; Miyamoto, Y.; Okuda, Y.; Hosseini, S.H.R.;
2012 / IEEE
By: Radeva, P.; Azpiroz, F.; Malagelada, C.; Vilarino, F.; Drozdzal, M.; Segui, S.; Vitria, J.;
By: Radeva, P.; Azpiroz, F.; Malagelada, C.; Vilarino, F.; Drozdzal, M.; Segui, S.; Vitria, J.;
2012 / IEEE
By: Macgregor, S.J.; Timoshkin, I.V.; Vorob'ev, V.S.; Atrazhev, V.M.; Wang, T.; Wilson, M.P.; Given, M.J.;
By: Macgregor, S.J.; Timoshkin, I.V.; Vorob'ev, V.S.; Atrazhev, V.M.; Wang, T.; Wilson, M.P.; Given, M.J.;
2010 / IEEE / 978-1-60558-719-6
By: Cheung, W.; Karumuri, S.; Zeleznik, R.; Reiss, S.P.; Kaplan, J.; LaViola, J.J.; Bragdon, A.; Adeputra, F.; Coleman, C.;
By: Cheung, W.; Karumuri, S.; Zeleznik, R.; Reiss, S.P.; Kaplan, J.; LaViola, J.J.; Bragdon, A.; Adeputra, F.; Coleman, C.;
2010 / IEEE / 978-1-60558-719-6
By: Coleman, C.; Kaplan, J.; Cheung, W.; Karumuri, S.; Adeputra, F.; Reiss, S.P.; Bragdon, A.; Zeleznik, R.; LaViola, J.J.;
By: Coleman, C.; Kaplan, J.; Cheung, W.; Karumuri, S.; Adeputra, F.; Reiss, S.P.; Bragdon, A.; Zeleznik, R.; LaViola, J.J.;
Fluid analysis of gas-liquid two-phase flow based on semiconductor laser measurement and s transform
2010 / IEEE / 978-1-4244-8598-7By: Weixin Liu; Mingzhe Liu; Ningde Jin; Guozhi Song;
2011 / IEEE / 978-1-4244-9949-6
By: Ichiyanagi, M.; Ohigashi, R.; Kitada, H.; Kim, Y.S.; Nakatsuka, J.; Ohba, T.; Matsumoto, Y.; Kinefuchi, I.;
By: Ichiyanagi, M.; Ohigashi, R.; Kitada, H.; Kim, Y.S.; Nakatsuka, J.; Ohba, T.; Matsumoto, Y.; Kinefuchi, I.;
The study on the Effect of virtual current distribution in an electromagnetic flow meter with bubble
2011 / IEEE / 978-1-4244-9439-2By: Wang Yue-ming; Kong Ling-fu;
2011 / IEEE / 978-1-61284-722-1
By: Wangxing Li; Zhiming Liu; Xinping Tang; Yueyong Wang; Jianhong Yang;
By: Wangxing Li; Zhiming Liu; Xinping Tang; Yueyong Wang; Jianhong Yang;
2011 / IEEE / 978-1-4577-1589-1
By: Turner, T.; Chinn, D.; Dabling, J.G.; Wheeler, J.W.; Rohrer, B.; Anderson, L.; Filatov, A.;
By: Turner, T.; Chinn, D.; Dabling, J.G.; Wheeler, J.W.; Rohrer, B.; Anderson, L.; Filatov, A.;
2011 / IEEE / 978-1-4577-1589-1
By: Si Cheol Noh; Heung Ho; Hong Ki Min; Jung Hun Kang; Jin Su Kim; Ju Young Kim;
By: Si Cheol Noh; Heung Ho; Hong Ki Min; Jung Hun Kang; Jin Su Kim; Ju Young Kim;
2011 / IEEE / 978-1-4244-9306-7
By: Jin Su Kim; Ju Young Kim; Si Cheol Noh; Heung Ho Choi; Jung Hoon Kang;
By: Jin Su Kim; Ju Young Kim; Si Cheol Noh; Heung Ho Choi; Jung Hoon Kang;
2011 / IEEE / 978-1-4244-9352-4
By: Lifu Zhao; Yang Yu; Guoliang Lv; Yimin Zhang; Anye Zhang; Jianzhou Li; Pengcheng Zhou; Xiaoping Pan; Yuemei Chen; Xiaopeng Yu; Chengbo Yu; Wei Xu; Ying Yang; Lanjuan Li; Jiansheng Xu; Tao Song;
By: Lifu Zhao; Yang Yu; Guoliang Lv; Yimin Zhang; Anye Zhang; Jianzhou Li; Pengcheng Zhou; Xiaoping Pan; Yuemei Chen; Xiaopeng Yu; Chengbo Yu; Wei Xu; Ying Yang; Lanjuan Li; Jiansheng Xu; Tao Song;
2011 / IEEE / 978-1-4577-0631-8
By: Miyamoto, Y.; Okuka, Y.; Hosseini, S.H.R.; Oshita, D.; Akiyama, H.; Iwasaki, S.;
By: Miyamoto, Y.; Okuka, Y.; Hosseini, S.H.R.; Oshita, D.; Akiyama, H.; Iwasaki, S.;
2011 / IEEE / 978-1-4577-0631-8
By: Teranishi, K.; Yazawa, Y.; Sakai, Y.; Rokkaku, K.; Shimomura, N.; Itoh, H.; Fukawa, F.; Suzuki, S.;
By: Teranishi, K.; Yazawa, Y.; Sakai, Y.; Rokkaku, K.; Shimomura, N.; Itoh, H.; Fukawa, F.; Suzuki, S.;
2012 / IEEE / 978-1-4673-0325-5
By: Kyung Ho Lee; Jeong Hyun Lee; Sang Kug Chung; Kyehan Rhee; Jeong Byung Chae;
By: Kyung Ho Lee; Jeong Hyun Lee; Sang Kug Chung; Kyehan Rhee; Jeong Byung Chae;
2011 / IEEE / 978-1-4577-1982-0
By: Xing, X.Q.; Pinjala, D.; Gao, S.; Zhang, X.; Hoe, Y.Y.; Lee, Y.J.;
By: Xing, X.Q.; Pinjala, D.; Gao, S.; Zhang, X.; Hoe, Y.Y.; Lee, Y.J.;
2012 / IEEE / 978-1-4673-0862-5
By: Cazzola, D.; Previdi, F.; Cologni, A.; Savaresi, S.M.; Belloli, D.;
By: Cazzola, D.; Previdi, F.; Cologni, A.; Savaresi, S.M.; Belloli, D.;
2012 / IEEE / 978-2-35500-021-8
By: Bailey, C.; Patel, M.K.; Kay, R.W.; Flynn, D.; Strusevich, N.; Price, D.; Desmulliez, M.P.Y.; Costello, S.; Jones, A.C.; Bennet, M.;
By: Bailey, C.; Patel, M.K.; Kay, R.W.; Flynn, D.; Strusevich, N.; Price, D.; Desmulliez, M.P.Y.; Costello, S.; Jones, A.C.; Bennet, M.;
2012 / IEEE / 978-1-4577-1837-3
By: Gustafsson, T.; Wenger, F.; Bohlin, P.; Sivencrona, H.; Sjostrand, M.;
By: Gustafsson, T.; Wenger, F.; Bohlin, P.; Sivencrona, H.; Sjostrand, M.;
2011 / IEEE
By: Schultz, L.; Bogdanov, A.N.; Kiselev, N.S.; Wolff, U.; Rhein, F.; Hellwig, O.; Sasvari, Z.; Vock, S.; Bran, C.; Neu, V.;
By: Schultz, L.; Bogdanov, A.N.; Kiselev, N.S.; Wolff, U.; Rhein, F.; Hellwig, O.; Sasvari, Z.; Vock, S.; Bran, C.; Neu, V.;
2012 / American Institute of Physics
By: Tetsuo Kishi; Tsutaru Kumagai; Tetsuji Yano; Shuichi Shibata;
By: Tetsuo Kishi; Tsutaru Kumagai; Tetsuji Yano; Shuichi Shibata;
2012 / American Institute of Physics
By: Long Meng; Feiyan Cai; Juanjuan Chen; Lili Niu; Yanming Li; Junru Wu; Hairong Zheng;
By: Long Meng; Feiyan Cai; Juanjuan Chen; Lili Niu; Yanming Li; Junru Wu; Hairong Zheng;