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Topic: Beal/sub 2/o/sub 4/:cr
Results
1998 / IEEE / 1-55752-339-0
By: Walling, J.C.; Heller, D.P.; Okorogu, A.; Mirov, S.B.; Lee, W.; Crouthamel, D.I.; Yan, W.-B.;
By: Walling, J.C.; Heller, D.P.; Okorogu, A.; Mirov, S.B.; Lee, W.; Crouthamel, D.I.; Yan, W.-B.;
1996 / IEEE / 1-55752-443-2
By: Dunn, B.; Fuqua, P.D.; Birnbaum, M.; Man-Fang Huang; Sanggeon Lee; Unlu, F.; Yen-Kuang Kuo;
By: Dunn, B.; Fuqua, P.D.; Birnbaum, M.; Man-Fang Huang; Sanggeon Lee; Unlu, F.; Yen-Kuang Kuo;
2002 / IEEE / 1-55752-706-7
By: Frost, R.; Mirov, S.B.; Boczar, B.; Fedorov, V.V.; Kramer, N.; Walling, J.C.; Thevar, T.; Pryor, B.;
By: Frost, R.; Mirov, S.B.; Boczar, B.; Fedorov, V.V.; Kramer, N.; Walling, J.C.; Thevar, T.; Pryor, B.;
2003 / IEEE / 0-7803-7734-6
By: Doroschenko, M.; Cerny, P.; Jelinkova, H.; Sulc, J.; Skornyakov, V.V.; Basiev, T.T.; Zverev, P.G.;
By: Doroschenko, M.; Cerny, P.; Jelinkova, H.; Sulc, J.; Skornyakov, V.V.; Basiev, T.T.; Zverev, P.G.;