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Topic: Atomic Measurements

Results

Operation of a hydrogen maser with a state-mixed beam

1982 / IEEE
By: Morris, D.;

Remeasurement of a Silicon lattice period

1987 / IEEE
By: Greene, Geoffrey L.; Tanaka, Mitsuru; Deslattes, Richard D.; Kessler, Ernest G.; Henins, Albert;

Quantum mechanics and precision measurements

1987 / IEEE
By: Ramsey, Norman F.;

Error recovery in asynchronous systems

1986 / IEEE
By: Campbell, R.H.; Randell, B.;

Ramsey pattern of cesium beam frequency standards with narrow atomic velocity ranges

1987 / IEEE
By: Chuanyun, Xue; Enxian, Li;

Stable Bipolar Resistive Switching Characteristics and Resistive Switching Mechanisms Observed in Aluminum Nitride-based ReRAM Devices

2011 / IEEE
By: Eui Bok Lee; Ho-Myoung An; Hee-Dong Kim; Tae Geun Kim;

Switching Fields of Individual Co Nanoislands

2011 / IEEE
By: Corbetta, M.; Nahas, Y.; Borme, J.; Ouazi, S.; Oka, H.; Rodary, G.; Wedekind, S.; Kirschner, J.; Sander, D.;

Monte Carlo Model of Positron Transport in Water: Track Structures Based on Atomic and Molecular Scattering Data for Positrons

2011 / IEEE
By: White, R.; Petrovic, Z.L.; Garcia, G.; Buckman, S.;

Voronoi-Based Extraction and Visualization of Molecular Paths

2011 / IEEE
By: Lindow, N.; Baum, D.; Hege, H.-C.;

The evolution of time measurement, part 3: atomic clocks [Recalibration]

2011 / IEEE
By: Lombardi, M.A.;

Nanofiber-Based Optical Trapping of Cold Neutral Atoms

2012 / IEEE
By: Schneeweiss, P.; Reitz, D.; Mitsch, R.; Dawkins, S.T.; Vetsch, E.; Rauschenbeutel, A.;

Switching and Counting With Atomic Vapors in Photonic-Crystal Fibers

2012 / IEEE
By: Balic, V.; Hofferberth, S.; Bajcsy, M.; Peyronel, T.; Hafezi, M.; Vuletic, V.; Lukin, M.D.; Zibrov, A.; Qiyu Liang;

Accelerated Oxidation of Silicon Due to X-ray Irradiation

2012 / IEEE
By: Fleetwood, D. M.; Weiss, S. M.; Zhang, E. X.; Bhandaru, S.; Reed, R. A.; Rogers, B. R.; Harl, R. R.; Weller, R. A.;

Observation of Nonlinear Optical Coupling in the Kiloelectronvolt X-Ray Regime

2012 / IEEE
By: Borisov, A.B.; McCorkindale, J.C.; Poopalasingam, S.; Racz, E.; Khan, S.F.; Rhodes, C.K.; Longworth, J.W.;

Bounds on the Bayes Error Given Moments

2012 / IEEE
By: Gupta, M.R.; Frigyik, B.A.;

Effect of Spatial Homogeneity of Spin Polarization on Magnetic Field Response of an Optically Pumped Atomic Magnetometer Using a Hybrid Cell of K and Rb Atoms

2012 / IEEE
By: Ohnishi, H.; Ito, Y.; Kobayashi, T.; Kamada, K.;

Analysis of Fission Gas Release Kinetics by On-Line Mass Spectrometry

2012 / IEEE
By: Zerega, Y.; Taylor, S.; Ducros, G.; Pontillon, Y.; Andre, J.; Janulyte, A.; Bignan, G.; Lyoussi, A.; Brkic, B.; Carette, M.; Parrat, D.; Reynard-Carette, C.;

On Codecell Convexity of Optimal Multiresolution Scalar Quantizers for Continuous Sources

2012 / IEEE
By: Antos, A.;

Toward Absolute Measurements of Far-Field Microwave Magnetic Field by Atomic Sensor Based on Double Radiooptical Resonance

2012 / IEEE
By: Hamid, R.; C'akir, S.; C'etintas', M.; S'en, O.;

Making new history from old standards

2012 / IEEE
By: Schooley, J.F.;

Atomistic Prediction of Nanomaterials: Introduction to Molecular Dynamics Simulation and a Case Study of Graphene Wettability.

2012 / IEEE
By: Lam, R.H.W.; Lau, D.;

Characterization of an Atmospheric-Pressure Helium Plasma Generated by 2.45-GHz Microwave Power

2012 / IEEE
By: Zihao Ouyang; Ruzic, D.N.; Tae Seung Cho; Surla, V.;

Attosecond Technology and Science

2012 / IEEE
By: Calegari, F.; Sansone, G.; Nisoli, M.;

Diagnostics and Application of an Atmospheric Pressure Plasma Generated With a Hollowneedle-Plate Dielectric Barrier Discharge

2012 / IEEE
By: Junying Chen; Weiyuan Liu; Yafei Ji; Lifang Dong; Yujie Yang;

Joint-Structured-Sparsity-Based Classification for Multiple-Measurement Transient Acoustic Signals

2012 / IEEE
By: Haichao Zhang; Huang, T.S.; Nasrabadi, N.M.; Yanning Zhang;

Sensing of RF Magnetic Fields Using Zeeman Splitting of Double Radiooptical Resonance and a New Approach to Helmholtz Coil Calibrations

2012 / IEEE
By: Hamid, R.; Cakir, S.; Sen, O.; Cakir, G.; Cetintas, M.;

Consider the kilogram

2012 / IEEE
By: Courtland, R.;

Analyzing Atoms Using the Spice Computer Program

2012 / IEEE
By: Vlasak, W.;

LEDs for less

2012 / IEEE
By: Stevenson, R.;

Understanding Compressive Sensing and Sparse Representation-Based Super-Resolution

2012 / IEEE
By: Gowda, R.; Nagesh, P.; Kulkarni, N.; Baoxin Li;

The Relation Between the Bandgap and the Anisotropic Nature of Hydrogenated Amorphous Silicon

2012 / IEEE
By: Wank, M.A.; Smets, A.H.M.; van de Sanden, R.M.C.M.; Wronski, C.R.; Fischer, M.; Bobela, D.C.; Zeman, M.; van Swaaij, R.A.C.M.M.; Vet, B.;

Projection-Based and Look-Ahead Strategies for Atom Selection

2012 / IEEE
By: Skoglund, M.; Vehkapera, M.; Sundman, D.; Chatterjee, S.;

Improvement of the frequency stability below the dick limit with a continuous atomic fountain clock

2012 / IEEE
By: Devenoges, L.; Di Domenico, G.; Thomann, P.; Joyet, A.; Stefanov, A.;

Use of fluorine-doped silicon oxide for temperature compensation of radio frequency surface acoustic wave devices

2012 / IEEE
By: Matsuda, T.; Miura, M.; Hara, M.; Matsuda, S.; Hashimoto, K.; Satoh, Y.; Ueda, U.M.;

Tuning Electronic Structure of Graphene: A First-Principles Study

2012 / IEEE
By: Surya, V.J.; Kawazoe, Y.; Mizuseki, H.; Iyakutti, K.;

Learning Dictionaries With Bounded Self-Coherence

2012 / IEEE
By: Sigg, C.D.; Buhmann, J.M.; Dikk, T.;

Entailment Principle for Measure-Based Uncertainty

2012 / IEEE
By: Yager, R.R.;

Stabilization of a Delayed Quantum System: The Photon Box Case-Study

2012 / IEEE
By: Rouchon, P.; Mirrahimi, M.; Amini, H.;

Particle driven inertial fusion through cluster ion beam

1992 / IEEE / 000-0-0000-0000-0
By: Tahir, N.A.; Deutsch, C.;

Ultra-violate flash lamp on the noble gas dimers exited by an e-beam

1992 / IEEE / 000-0-0000-0000-0
By: Savin, A.A.; Mkheidze, G.P.; Klimov, V.I.;

Innovative bremsstrahlung research at Physics International company

1992 / IEEE / 000-0-0000-0000-0
By: Wong, S.; Meachum, J.; Riordan, J.;

Theoretical spectroscopic analysis of intense ion beam-plasma interaction in the PBFA II gas cell

1992 / IEEE / 000-0-0000-0000-0
By: Wang, P.; MacFarlane, J.J.; Moses, G.A.; Bailey, J.E.;

Influence of particle fluxes from target on characteristics of intense electron beams

2000 / IEEE
By: Bluhm, H.; Mueller, G.; Engelko, V.;

Control of x-ray emission from the shotgun z-pinch plasma

2000 / IEEE
By: Takasugi, K.; Miyamoto, T.; Tatsumi, K.; Igusa, T.;

Measurement of local electric fields in high power ion diodes with resonantly excited probe beam atoms

2000 / IEEE
By: An, W.; Knyazev, B.; Stoltz, O.; Singer, J.; Meisel, G.; Massier, H.; Hoppe, P.; Buth, L.; Bluhm, H.;

Fast Z-pinch study in Russia and related problems

2002 / IEEE / 978-0-7354-0107-5
By: Grabovskii, E. V.;

Spatial structure of x-ray emission of a gas-puff z-pinch plasma

2002 / IEEE / 978-0-7354-0107-5
By: Akiyama, Hisashi; Narisawa, Satoru; Takasugi, Keiichi;

Status of particle beam and pulsed power research in the US

2002 / IEEE / 978-0-7354-0107-5
By: Cooperstein, Gerald;

Improved neon L-shell physics in MHD modeling of hawk gas-puff Z-pinch implosions

2002 / IEEE / 978-0-7354-0107-5
By: Schumer, Joseph; Mosher, David; Starobinets, Alexander; Fisher, Vladimir; Maron, Yitzhak;

A comparison of radiation transport models for a Ti Z-pinch

2002 / IEEE / 978-0-7354-0107-5
By: Giuliani, John L.; Clark, Robert W.; Thornhill, J. Ward; Davis, Jack;

Measurement of angular distribution of beam electrons at GESA facilities

2002 / IEEE / 978-0-7354-0107-5
By: Engelko, Vladimir; Mueller, Georg; Kavaljov, Vladimir; Komarov, Oleg;

Investigation of the initial stage of electrical explosion of fine metal wires

2002 / IEEE / 978-0-7354-0107-5
By: Sasorov, P.V.; Waisman, E.M.; McDaniel, D.H.; Struve, K.W.; Rosenthal, S.E.; Sarkisov, G.S.;

Pitfalls in radiation modeling of Z-pinch plasmas

2002 / IEEE / 978-0-7354-0107-5
By: Davis, J.; Giuliani, J.L.; LePell, P.O.; Deeney, C.; Coverdale, C.A.; Chong, Y. K.; Apruzese, J.P.; Clark, R.W.; Thornhill, J.W.; Whitney, K.G.; Velikovich, A.;

Efficiency of radiation energy confinement in Double Liner/Dynamic Hohlraum

2004 / IEEE / 978-5-87911-088-3
By: Smirnov, V.P.; Novikov, V.G.; Zakharov, S.V.;

Use of A 12 cm Dia. Nozzle for argon Z-pinches

2004 / IEEE / 978-5-87911-088-3
By: Krishnan, M.; Gerhan, A.; Bixler, A.; Coleman, P.L.; Wilson, K.; Thompson, J.; Parks, D.;

Estimation of the compact cold atom clock HORACE frequency stability

2006 / IEEE / 978-3-9805741-8-1
By: Holleville, D.; Guerandel, S.; Esnault, F.X.; Tremine, S.; Dimarcq, N.; Delporte, J.;

Recent results on a pulsed CPT frequency standard

2006 / IEEE / 978-3-9805741-8-1
By: Guerandel, S.; Zanon, T.; Dahes, F.; Dimarcq, N.; de Clerc, E.;

Optical frequency standard with ultra-cold strontium atoms

2006 / IEEE / 978-3-9805741-8-1
By: Prevedelli, M.; Tino, G.M.; Sorrentino, F.; Ferrari, G.; Drullinger, R.E.; Poli, N.;

Quantum interference spectroscopy in the vacuum ultraviolet

2006 / IEEE / 978-3-9805741-8-1
By: Eikema, K.S.E.; Zinkstok, R.T.; Witte, S.; Hogervorst, W.; Ubachs, W.;

A compact high stability optical clock based on laser-cooled Ca

2006 / IEEE / 978-3-9805741-8-1
By: Oates, C.W.; Hollberg, L.; Wilpers, G.; Le Coq, Y.;

Towards a high-stability Rb fountain frequency standard

2006 / IEEE / 978-3-9805741-8-1
By: Szymaniec, K.; Chalupczak, W.; Ovchinnikov, Y.B.; Marra, G.;

Using a Cs fountain to Test Lorentz invariance

2006 / IEEE / 978-3-9805741-8-1
By: Chapelet, F.; Wolf, P.; Clairon, A.; Bize, S.;

Vibration-insensitive mounting of a reference cavity for an optical clock

2006 / IEEE / 978-3-9805741-8-1
By: Riehle, F.; Nazarova, T.; Sterr, U.;

Information fusion for object & situation assessment in sensor networks

2011 / IEEE / 978-1-4577-0081-1
By: Hendrick, E.; Yicheng Wen; Srivastav, A.; Phoha, S.; Ray, A.; Chattopadhyay, I.;

Valence-band offset in ultra-thin HfO2 film on GaAs

2011 / IEEE / 978-1-61284-774-0
By: Li, J.L.; Hou, B.-Y.; Ting, H.-W.; Hung, K.-M.; Nin, C.; Hsue, Z.-W.; Shieh, T.-H.; Tsai, Y.-C.;

Protein Packing Quality Using Delaunay Complexes

2011 / IEEE / 978-0-7695-4483-0
By: Fonseca, R.; Karplus, K.; Winter, P.;

An Algorithm for the Calculation of Volume and Surface of Unions of Spheres. Application for Solvation Shells

2011 / IEEE / 978-0-7695-4483-0
By: Medvedev, N.N.; Anikeenko, A.V.; Voloshin, V.P.; Geiger, A.;

Diffusion behavior and mechanism of co-sputtering metals as bonding materials for 3D IC interconnects during annealing treatment

2011 / IEEE / 978-1-4577-0378-2
By: Shih, J.Y.; Hsu, S.Y.; Chen, K.N.;

BetaMol: Molecular Modeling, Analysis, and Visualization Software Based on the Beta-Complex Derived from the Voronoi Diagram

2011 / IEEE / 978-0-7695-4483-0
By: Deok-Soo Kim; Chong-Min Kim; Joonghyun Ryu; Chung-In Won; Jae-Kwan Kim; Youngsong Cho;

Evidence of a fermionic collisional shift

2011 / IEEE / 978-1-61284-112-0
By: Gibble, K.; Reichel, J.; Deutsch, C.; Rosenbusch, P.; Maineult, W.;

Ultrasonic atomizers of nanomaterials

2011 / IEEE / 978-1-61284-795-5
By: Khmelev, M.V.; Shalunov, A.V.; Khmelev, V.N.; Genne, D.V.; Shalunova, A.V.;

Modification and properties study of thermo-responsive PVDF flat membrane

2011 / IEEE / 978-1-4244-9439-2
By: Rui Zhang; Jinmei Wang; Qingsong Zhang; Li Chen; Yiping Zhao; Haiyang Zhao;

Increase in phytotoxicity of N-phosphonomethyl-glycine during ultrasonic atomization with ultralow doses of organic acids

2011 / IEEE / 978-1-61284-795-5
By: Verestchagin, A.L.; Khmelev, V.N.; Zakharieva, J.I.;

Formalized Description of Workflow Exception Handlings Based on Automaton

2011 / IEEE / 978-1-4577-0856-5
By: Song Yanwei; Zeng Guangzhou;

Landscape for semiconductor analysis: Issues and challenges

2011 / IEEE / 978-1-4577-0158-0
By: Kinam Kim; Gyeong-Su Park;

Purification of substances contaminated with mycotoxins using functionalyzed microparticles

2011 / IEEE / 978-1-4577-0624-0
By: Erokhin, V.; Mustafa, M.K.; Nabok, A.V.; Szekacs, A.; Erokhina, S.;

Private random number generation through remote atom entanglement

2011 / IEEE / 978-1-4244-5731-1
By: Pironio, S.; Olmschenk, S.; Monroe, C.; Manning, T.A.; Luo, L.; Acin, A.; Hayes, D.; Maunz, P.; Matsukevich, D.N.; de la Giroday, A.B.; Massar, S.;

Hydrofluoric acid modifications of graphene films

2011 / IEEE / 978-1-61284-795-5
By: Nebogatikova, N.A.; Prinz, V.Ya.; Antonova, I.V.;

Measurement of D-T branching ratio based on cross-calibration to D-3He

2011 / IEEE / 978-1-61284-329-2
By: Young, C.S.; Rinderknecht, H.; Mack, J.; Herrmann, H.W.; Kim, Y.; Petrasso, R.; Zylstra, A.; Langenbrunner, J.R.; Miller, E.K.; Grafil, E.; Stoeffl, W.; Rubery, M.; Horsfield, C.; Sedillo, T.J.; Evans, S.C.;

Protein surface analysis. Part 1: Hydrophobicity densities

2011 / IEEE / 978-1-61284-943-0
By: Arsene, O.; Cristea, P.D.; Nicolau, D.V.; Tuduce, R.;

AFM study of atomic-flat terraces on ZnWO4 (010) cleaved surface

2011 / IEEE / 978-1-61284-795-5
By: Galashov, E.N.; Atuchin, V.V.; Kozhukhov, A.S.; Shlegel, V.N.;

Application of fault tree analysis for fault diagnosis in screw pump

2011 / IEEE / 978-1-4244-9439-2
By: Yuesheng Wang; Junwei Wang;

Annealing-induced structural changes in TlInGaAsN heterostructures studied by X-ray photoelectron spectroscopy

2011 / IEEE / 978-3-8007-3356-9
By: Kim, W.B.; Kim, K.M.; Asahi, H.; Hasegawa, S.; Kobayashi, H.; Ishimaru, M.; Krishnamurthy, D.;

Study of automated point layout of radiological environment monitoring

2011 / IEEE / 978-1-4244-9439-2
By: Xuyuan Li; Guoqing Wang; Shengping He;

AHP study on energy indicators system for sustainable development of Henan province

2011 / IEEE / 978-1-61284-486-2
By: Wei Ran;

Architectural Constraints to Attain 1 Exaflop/s for Three Scientific Application Classes

2011 / IEEE / 978-1-61284-372-8
By: Gahvari, H.; Jetley, P.; Bhatele, A.; Kale, L.; Gropp, W.D.; Wesolowski, L.;

Using Hardware Transactional Memory for High-Performance Computing

2011 / IEEE / 978-1-61284-425-1
By: Larsson, E.; Karlsson, M.; Holmgren, S.; Black-Schaffer, D.; Tillenius, M.; Ljungkvist, K.;

Interdiffusion at the substrate-film interface of BiFeO3-PbTiO3 thin films on Pt/Si substrates

2011 / IEEE / 978-1-4577-1163-3
By: Comyn, T.P.; Bygrave, F.; Bell, A.J.;

Carbon natnotubes and graphene saturable absorber for ultrafast laser mode locking

2011 / IEEE / 978-986-02-8974-9
By: Shau-Ching Lin; Lain-Jong Li; Chao-Yung Yeh; Wood-Hi Cheng;

Spectra emitted by helium excited by corona discharge

2011 / IEEE / 978-1-4244-7355-7
By: Atrazhev, V.M.; Denat, A.; Bonifaci, N.; Eloranta, J.; von Haeften, K.; Shakhatov, V.A.;

Precision delay signal generation theory and technology in the test of navigation receiver

2011 / IEEE / 978-1-4244-8161-3
By: Zhong Xiaopen; Chen Jianyun; Ming Dexian;

Reduced dimensional analysis on dynamic characteristics of microcantilever beams in the fluid environment and application to atomic force microscopy

2011 / IEEE / 978-1-61284-777-1
By: Chao, S.D.; Jeng-Shian Chang; Zhan-Yi Liao; Kuan-Rong Huang; Shyh-Haur Chen; Kuang-Chong Wu;

Timing and synchronization of wireless base stations over packet networks

2011 / IEEE / 978-1-61284-857-0
By: Al-Araji, S.; Aweya, J.; Majeed, B.;

A digital time scale at the National Institute for Standards and Technology

2011 / IEEE / 978-1-4244-6051-9
By: Romisch, S.; Parker, T.E.; Jefferts, S.R.;

The role of the ITU-R in time scale definition

2011 / IEEE / 978-1-4244-6051-9
By: Beard, R.L.;

Applicable analysis & research on generic passive pressure safety system

2011 / IEEE / 978-1-4244-8165-1
By: Wenwei Han; Weishi Han; Qing Guo;

An light measurement and control system of Hollow cathode lamp, based in MCU C8051F021

2011 / IEEE / 978-1-4244-8165-1
By: Qian Ren; Baichen Yan; Weifeng Qiang;

A new type of atomic force microscope with multi-scanners

2011 / IEEE / 978-1-4244-8165-1
By: Dongxian Zhang; Qing Sang; Haijun Zhang;

First-principles investigation of the leakage current through strained SiO2 gate dielectrics in MOSFETs

2011 / IEEE / 978-1-4577-0430-7
By: Radehaus, C.; Schreiber, M.; Ottking, R.; Planitz, P.; Nadimi, E.;

The Power Efficiency of GPUs in Multi Nodes Environment with Molecular Dynamics

2011 / IEEE / 978-1-4577-1337-8
By: Udagawa, T.; Sekijima, M.;

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Topic: Atomic Measurements

Results

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