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Topic: Atomic Beams
Results
2012 / IEEE
By: Huayan Lan; Suling Sang; Peiying Li; Haixia Chen; Changbiao Li; Zhiguo Wang; Huaibin Zheng; Yanpeng Zhang;
By: Huayan Lan; Suling Sang; Peiying Li; Haixia Chen; Changbiao Li; Zhiguo Wang; Huaibin Zheng; Yanpeng Zhang;
2012 / IEEE
By: Schneeweiss, P.; Reitz, D.; Mitsch, R.; Dawkins, S.T.; Vetsch, E.; Rauschenbeutel, A.;
By: Schneeweiss, P.; Reitz, D.; Mitsch, R.; Dawkins, S.T.; Vetsch, E.; Rauschenbeutel, A.;
2012 / IEEE
By: Balic, V.; Hofferberth, S.; Bajcsy, M.; Peyronel, T.; Hafezi, M.; Vuletic, V.; Lukin, M.D.; Zibrov, A.; Qiyu Liang;
By: Balic, V.; Hofferberth, S.; Bajcsy, M.; Peyronel, T.; Hafezi, M.; Vuletic, V.; Lukin, M.D.; Zibrov, A.; Qiyu Liang;
2012 / IEEE
By: Bize, S.; Clairon, A.; Gibble, K.; Ruoxin Li; Tobar, M.E.; Rosenbusch, P.; Abgrall, M.; Santarelli, G.; Lours, M.; Chupin, B.; Laurent, P.; Rovera, D.; Guena, J.;
By: Bize, S.; Clairon, A.; Gibble, K.; Ruoxin Li; Tobar, M.E.; Rosenbusch, P.; Abgrall, M.; Santarelli, G.; Lours, M.; Chupin, B.; Laurent, P.; Rovera, D.; Guena, J.;
2012 / IEEE
By: Ye, J.; Rey, A.M.; Blatt, S.; Yige Lin; Swallows, M.D.; Benko, C.; Bishof, M.; Martin, M.J.;
By: Ye, J.; Rey, A.M.; Blatt, S.; Yige Lin; Swallows, M.D.; Benko, C.; Bishof, M.; Martin, M.J.;
2000 / IEEE
By: Markov, A. B.; Proskurovsky, D. I.; Ryzhov, V. V.; Turchanovsky, I. Yu.; Bespalov, V. I.;
By: Markov, A. B.; Proskurovsky, D. I.; Ryzhov, V. V.; Turchanovsky, I. Yu.; Bespalov, V. I.;
2000 / IEEE
By: An, W.; Knyazev, B.; Stoltz, O.; Singer, J.; Meisel, G.; Massier, H.; Hoppe, P.; Buth, L.; Bluhm, H.;
By: An, W.; Knyazev, B.; Stoltz, O.; Singer, J.; Meisel, G.; Massier, H.; Hoppe, P.; Buth, L.; Bluhm, H.;
2006 / IEEE / 978-3-9805741-8-1
By: Holleville, D.; Guerandel, S.; Esnault, F.X.; Tremine, S.; Dimarcq, N.; Delporte, J.;
By: Holleville, D.; Guerandel, S.; Esnault, F.X.; Tremine, S.; Dimarcq, N.; Delporte, J.;
2006 / IEEE / 978-3-9805741-8-1
By: Kopylov, L.N.; Novoselov, A.V.; Elkin, G.A.; Domnin, Y.S.; Pal'chikov, V.G.; Malychev, Y.M.; Baryshev, V.N.;
By: Kopylov, L.N.; Novoselov, A.V.; Elkin, G.A.; Domnin, Y.S.; Pal'chikov, V.G.; Malychev, Y.M.; Baryshev, V.N.;
2006 / IEEE / 978-3-9805741-8-1
By: Gerard, A.; Holleville, D.; Guerandel, S.; Tremine, S.; Dimarcq, N.; Esnault, F.X.; Perrin, S.; Clairon, A.;
By: Gerard, A.; Holleville, D.; Guerandel, S.; Tremine, S.; Dimarcq, N.; Esnault, F.X.; Perrin, S.; Clairon, A.;
2011 / IEEE / 978-1-61284-112-0
By: Kostin, A.; Sluysarev, S.; Pal'chikov, V.; Khabarova, K.; Baryshev, V.;
By: Kostin, A.; Sluysarev, S.; Pal'chikov, V.; Khabarova, K.; Baryshev, V.;
2011 / IEEE / 978-1-4673-0120-6
By: Zambon, P.; Verde, G.; Russotto, P.; Rizzo, F.; Riccio, F.; Porto, F.; Politi, G.; Pirrone, S.; Pagano, A.; Lombardo, I.; La Guidara, E.; Guazzoni, P.; Guazzoni, C.; Grassi, L.; Geraci, E.; De Filippo, E.; Castoldi, A.; Cardella, G.; Boiano, C.; Amorini, F.; Zetta, L.;
By: Zambon, P.; Verde, G.; Russotto, P.; Rizzo, F.; Riccio, F.; Porto, F.; Politi, G.; Pirrone, S.; Pagano, A.; Lombardo, I.; La Guidara, E.; Guazzoni, P.; Guazzoni, C.; Grassi, L.; Geraci, E.; De Filippo, E.; Castoldi, A.; Cardella, G.; Boiano, C.; Amorini, F.; Zetta, L.;
2011 / IEEE / 978-1-4673-0120-6
By: Ghammraoui, B.; Duvauchelle, P.; Verger, L.; Moulin, V.; Paulus, C.; Tabary, J.;
By: Ghammraoui, B.; Duvauchelle, P.; Verger, L.; Moulin, V.; Paulus, C.; Tabary, J.;
2011 / IEEE / 978-1-4673-0120-6
By: Tiernan, T.C.; Rensing, N.M.; Squillante, M.R.; O'Dougherty, P.; Freed, S.; Shirwadkar, U.;
By: Tiernan, T.C.; Rensing, N.M.; Squillante, M.R.; O'Dougherty, P.; Freed, S.; Shirwadkar, U.;
2011 / IEEE / 978-0-9775657-8-8
By: Sang Eon Park; Sang Bum Lee; Ki-Se Lee; Jaewan Kim; Taeg Yong Kwon;
By: Sang Eon Park; Sang Bum Lee; Ki-Se Lee; Jaewan Kim; Taeg Yong Kwon;
2011 / IEEE / 978-0-9775657-8-8
By: Hodgman, S.S.; Dall, R.G.; Truscott, A.G.; Kheruntsyan, K.; Manning, A.G.; Baldwin, K.G.H.; Johnsson, M.; Rugway, W.;
By: Hodgman, S.S.; Dall, R.G.; Truscott, A.G.; Kheruntsyan, K.; Manning, A.G.; Baldwin, K.G.H.; Johnsson, M.; Rugway, W.;
2011 / IEEE / 978-1-4244-9965-6
By: Kessler, J.; Pareige, P.; Barreau, N.; Cadel, E.; Couzinie-Devy, F.;
By: Kessler, J.; Pareige, P.; Barreau, N.; Cadel, E.; Couzinie-Devy, F.;
2011 / IEEE / 978-0-9775657-8-8
By: Andersen, M.F.; Fung, Y.H.; McGovern, M.; Hilliard, A.; Grunzweig, T.;
By: Andersen, M.F.; Fung, Y.H.; McGovern, M.; Hilliard, A.; Grunzweig, T.;
2011 / IEEE / 978-1-4244-9965-6
By: Guthrey, H.; Prosa, T.; Lawrence, D.; Norman, A.G.; Gorman, B.P.; Al-Jassim, M.;
By: Guthrey, H.; Prosa, T.; Lawrence, D.; Norman, A.G.; Gorman, B.P.; Al-Jassim, M.;
2011 / IEEE / 978-0-9775657-8-8
By: Jechow, A.; Streed, E.W.; Kielpinski, D.; Petrasiunas, M.J.; Norton, B.G.;
By: Jechow, A.; Streed, E.W.; Kielpinski, D.; Petrasiunas, M.J.; Norton, B.G.;
2012 / IEEE / 978-1-4673-1124-3
By: Chang, M.N.; Shiao, M.H.; Su, J.; Chen, P.L.; Liu, C.W.; Lee, C.H.;
By: Chang, M.N.; Shiao, M.H.; Su, J.; Chen, P.L.; Liu, C.W.; Lee, C.H.;
2011 / IEEE / 978-0-9775657-8-8
By: Wallace, W.C.; Pullen, M.G.; Kielpinski, D.; Sang, R.T.; Litvinyuk, I.V.; Quiney, H.M.; Kheifets, A.; Ivanov, I.; Weflen, D.; Bartschat, K.; Abeln, B.; Grum-Grzhimailo, A.N.; Hanne, G.F.; Palmer, A.J.; Laban, D.E.;
By: Wallace, W.C.; Pullen, M.G.; Kielpinski, D.; Sang, R.T.; Litvinyuk, I.V.; Quiney, H.M.; Kheifets, A.; Ivanov, I.; Weflen, D.; Bartschat, K.; Abeln, B.; Grum-Grzhimailo, A.N.; Hanne, G.F.; Palmer, A.J.; Laban, D.E.;
2011 / IEEE / 978-0-9775657-8-8
By: McDonald, G.; Dennis, G.R.; Barter, T.H.; Doring, D.; Robins, N.P.; Altin, P.A.; Debs, J.E.; Anderson, R.P.; Close, J.D.;
By: McDonald, G.; Dennis, G.R.; Barter, T.H.; Doring, D.; Robins, N.P.; Altin, P.A.; Debs, J.E.; Anderson, R.P.; Close, J.D.;
2011 / IEEE / 978-0-9775657-8-8
By: Stace, T.M.; Benabid, F.; Light, P.S.; Perrella, C.; Luiten, A.N.;
By: Stace, T.M.; Benabid, F.; Light, P.S.; Perrella, C.; Luiten, A.N.;
2011 / IEEE / 978-0-9775657-8-8
By: Sheludko, D.V.; Putkunz, C.T.; Saliba, S.D.; McCulloch, A.J.; Murphy, D.; Scholten, R.E.;
By: Sheludko, D.V.; Putkunz, C.T.; Saliba, S.D.; McCulloch, A.J.; Murphy, D.; Scholten, R.E.;
2011 / IEEE / 978-0-9775657-8-8
By: Schwartz, S.; Guerlin, C.; Reichel, J.; Pocholle, J.-P.; Huet, L.; Sarazin, N.; Morvan, E.; Ammar, M.;
By: Schwartz, S.; Guerlin, C.; Reichel, J.; Pocholle, J.-P.; Huet, L.; Sarazin, N.; Morvan, E.; Ammar, M.;
2011 / IEEE / 978-0-9775657-8-8
By: Wallace, W.C.; Laban, D.E.; Pullen, M.G.; Kielpinski, D.; Sang, R.T.; Litvinyuk, I.V.; Quiney, H.M.; Kheifets, A.; Ivanov, I.; Weflen, D.; Bartschat, K.; Abeln, B.; Grum-Grzhimailo, A.N.; Hanne, G.F.; Palmer, A.J.;
By: Wallace, W.C.; Laban, D.E.; Pullen, M.G.; Kielpinski, D.; Sang, R.T.; Litvinyuk, I.V.; Quiney, H.M.; Kheifets, A.; Ivanov, I.; Weflen, D.; Bartschat, K.; Abeln, B.; Grum-Grzhimailo, A.N.; Hanne, G.F.; Palmer, A.J.;
2012 / IEEE / 978-1-4673-1257-8
By: Eunha Kim; Wahl, J.A.; Demarest, J.J.; Ronsheim, P.; Paruchuri, V.; Li, J.; Wall, D.R.; Teehan, S.; Berliner, N.C.; Itokawa, H.;
By: Eunha Kim; Wahl, J.A.; Demarest, J.J.; Ronsheim, P.; Paruchuri, V.; Li, J.; Wall, D.R.; Teehan, S.; Berliner, N.C.; Itokawa, H.;
2012 / IEEE / 978-1-4673-1257-8
By: Tang, S.; Han, K.; Salimian, S.; Campbell, C.; Persing, H.; Godet, L.; Rockwell, T.;
By: Tang, S.; Han, K.; Salimian, S.; Campbell, C.; Persing, H.; Godet, L.; Rockwell, T.;
2012 / IEEE / 978-1-4673-0387-3
By: Benischek, V.; Rice, H.F.; Kasevich, M.; Young, B.; Mauser, L.; Brown, D.;
By: Benischek, V.; Rice, H.F.; Kasevich, M.; Young, B.; Mauser, L.; Brown, D.;
2012 / IEEE / 978-1-4673-0442-9
By: Chang Yong Park; Dai-Hyuk Yu; Sang Eon Park; Sang-Bum Lee; Taeg Yong Kwon; Won-Kyu Lee;
By: Chang Yong Park; Dai-Hyuk Yu; Sang Eon Park; Sang-Bum Lee; Taeg Yong Kwon; Won-Kyu Lee;
2012 / IEEE / 978-1-4577-1820-5
By: Yelong Hong; Qinqing Sun; Zhiwen Liu; Jingbiao Chen; Wei Zhuang; Zhiming Tao; Xiaobo Xue;
By: Yelong Hong; Qinqing Sun; Zhiwen Liu; Jingbiao Chen; Wei Zhuang; Zhiming Tao; Xiaobo Xue;
Modeling of the Laser-Heating Induced Ultrafast Demagnetization Dynamics in Ferrimagnetic Thin Films
2013 / IEEEBy: Ren, Y.; Jiao, X.; Liu, Y.; Jin, Q.; Zhang, Z.;
2008 / American Institute of Physics
By: Hiroshi Kinoshita; Shunsuke Yamamoto; Hideaki Yatani; Nobuo Ohmae;
By: Hiroshi Kinoshita; Shunsuke Yamamoto; Hideaki Yatani; Nobuo Ohmae;
2008 / American Institute of Physics
By: Guorong Wu; Weiqing Zhang; Huilin Pan; Quan Shuai; Bo Jiang; Xueming Yang; Dongxu Dai;
By: Guorong Wu; Weiqing Zhang; Huilin Pan; Quan Shuai; Bo Jiang; Xueming Yang; Dongxu Dai;
2009 / American Institute of Physics
By: H. Hedgeland; P. R. Kole; W. Allison; J. Ellis; A. P. Jardine;
By: H. Hedgeland; P. R. Kole; W. Allison; J. Ellis; A. P. Jardine;
2010 / American Institute of Physics
By: C.-F. Cheng; W. Jiang; G.-M. Yang; Y.-R. Sun; H. Pan; S.-M. Hu; Y. Gao; A.-W. Liu;
By: C.-F. Cheng; W. Jiang; G.-M. Yang; Y.-R. Sun; H. Pan; S.-M. Hu; Y. Gao; A.-W. Liu;
2010 / American Institute of Physics
By: V. D. Vaidya; M. Traxler; C. Hempel; R. R. Mhaskar; G. Raithel;
By: V. D. Vaidya; M. Traxler; C. Hempel; R. R. Mhaskar; G. Raithel;
2011 / American Institute of Physics
By: JindYich Mach; Tomáa `amoYil; Stanislav Voborný; Miroslav Kolíbal; Jakub Zlámal; Tomáa `ikola; JiYí Spousta; Libuae Dittrichová;
By: JindYich Mach; Tomáa `amoYil; Stanislav Voborný; Miroslav Kolíbal; Jakub Zlámal; Tomáa `ikola; JiYí Spousta; Libuae Dittrichová;
2014 / IEEE
By: Hartnett, J.G.; Ikegami, T.; Watabe, K.; Hirano, I.; Hagimoto, K.; Tanabe, T.; Yanagimachi, S.; Takamizawa, A.;
By: Hartnett, J.G.; Ikegami, T.; Watabe, K.; Hirano, I.; Hagimoto, K.; Tanabe, T.; Yanagimachi, S.; Takamizawa, A.;
2014 / IEEE
By: Dos Santos, Franck Pereira; Landragin, Arnaud; Farah, Tristan; Cheng, Bing; Gillot, Pierre; Merlet, Sebastien;
By: Dos Santos, Franck Pereira; Landragin, Arnaud; Farah, Tristan; Cheng, Bing; Gillot, Pierre; Merlet, Sebastien;
2014 / IEEE
By: Shi, Chunyan; Lodewyck, Jerome; Le Targat, Rodolphe; Bize, Sebastien; Robyr, Jean-Luc; Eismann, Ulrich;
By: Shi, Chunyan; Lodewyck, Jerome; Le Targat, Rodolphe; Bize, Sebastien; Robyr, Jean-Luc; Eismann, Ulrich;
2014 / IEEE
By: Pechoneri, Rodrigo Duarte; Muller, Stella Torres; Magalhaes, Daniel Varela; Bagnato, Vanderlei Salvador; de Martin, Jair;
By: Pechoneri, Rodrigo Duarte; Muller, Stella Torres; Magalhaes, Daniel Varela; Bagnato, Vanderlei Salvador; de Martin, Jair;
2013 / IEEE
By: Deconihout, B.; Vella, A.; Blavette, D.; Pareige, P.; Houard, J.; Da Costa, G.; Vurpillot, F.;
By: Deconihout, B.; Vella, A.; Blavette, D.; Pareige, P.; Houard, J.; Da Costa, G.; Vurpillot, F.;
2013 / IEEE
By: Ekanayake, N.; Luo, S.; Walker, B. C.; Decamp, M. F.; Stanev, T.; Mancuso, C.; Wells, S. J.; Howard, L. E.; Tramontozzi, A.; Scalzi, R.; Grugan, P.; Crosby, W.; Camilo, A. D.; McCowan, C. V.;
By: Ekanayake, N.; Luo, S.; Walker, B. C.; Decamp, M. F.; Stanev, T.; Mancuso, C.; Wells, S. J.; Howard, L. E.; Tramontozzi, A.; Scalzi, R.; Grugan, P.; Crosby, W.; Camilo, A. D.; McCowan, C. V.;
2013 / IEEE
By: Rohringer, N.; Weninger, C.; Rocca, J. J.; London, R. A.; Bostedt, C.; Bozek, J. D.; Hau-Riege, S.; Graf, A.; Dunn, J.; Albert, F.; Purvis, M.; Ryan, D.; Brown, G.;
By: Rohringer, N.; Weninger, C.; Rocca, J. J.; London, R. A.; Bostedt, C.; Bozek, J. D.; Hau-Riege, S.; Graf, A.; Dunn, J.; Albert, F.; Purvis, M.; Ryan, D.; Brown, G.;