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Topic: Assembly
Results
2011 / IEEE
By: Koyanagi, M.; Ohara, Y.; Iwata, E.; Fukushima, T.; Murugesan, M.; Tanaka, T.; Kangwook Lee; Jichoel Bea;
By: Koyanagi, M.; Ohara, Y.; Iwata, E.; Fukushima, T.; Murugesan, M.; Tanaka, T.; Kangwook Lee; Jichoel Bea;
2011 / IEEE
By: Threadgold, J.R.; Martin, P.N.; Juniper, P.; Jeffries, G.; Webb, K.; Cooper, G.M.; McLean, J.; Jones, A.;
By: Threadgold, J.R.; Martin, P.N.; Juniper, P.; Jeffries, G.; Webb, K.; Cooper, G.M.; McLean, J.; Jones, A.;
2011 / IEEE
By: Surasit, C.; Drake, K.Y.S.; Beleran, J.; Tan Hua Hong; Wilson, O.P.L.; Zhang, X.R.; Librado, G.; Mehta, G.;
By: Surasit, C.; Drake, K.Y.S.; Beleran, J.; Tan Hua Hong; Wilson, O.P.L.; Zhang, X.R.; Librado, G.; Mehta, G.;
2012 / IEEE
By: Verma, R.; Rawat, R.S.; Lee, P.; Tan, A.T.L.; Shyam, A.; Goh Jia Ying; Springham, S.V.; Talebitaher, A.; Ilyas, U.; Shariff, H.;
By: Verma, R.; Rawat, R.S.; Lee, P.; Tan, A.T.L.; Shyam, A.; Goh Jia Ying; Springham, S.V.; Talebitaher, A.; Ilyas, U.; Shariff, H.;
2012 / IEEE
By: Hyunki Park; Kyoungo Nam; Shaw, R.; Kihak Im; Byungseok Kim; Kyoungkyu Kim; Jooshik Bak; Heejae Ahn; Dongjin Kim;
By: Hyunki Park; Kyoungo Nam; Shaw, R.; Kihak Im; Byungseok Kim; Kyoungkyu Kim; Jooshik Bak; Heejae Ahn; Dongjin Kim;
2012 / IEEE
By: Majewski, P.; Treis, J.; Bahr, A.; De Vita, G.; Gunther, B.; Hermenau, K.; Hilchenbach, M.; Lauf, T.; Lechner, P.; Lutz, G.; Miessner, D.; Porro, M.; Reiffers, J.; Richter, R.; Schaller, G.; Schnecke, M.; Schopper, F.; Soltau, H.; Stefanescu, A.; Strecker, R.; Struder, L.; Andricek, L.;
By: Majewski, P.; Treis, J.; Bahr, A.; De Vita, G.; Gunther, B.; Hermenau, K.; Hilchenbach, M.; Lauf, T.; Lechner, P.; Lutz, G.; Miessner, D.; Porro, M.; Reiffers, J.; Richter, R.; Schaller, G.; Schnecke, M.; Schopper, F.; Soltau, H.; Stefanescu, A.; Strecker, R.; Struder, L.; Andricek, L.;
2012 / IEEE
By: Ji-Young Lee; Do-Kwan Hong; Dae-Suk Joo; Yo-Han Chio; Byoung-Uk Nam; Byung-Chul Woo;
By: Ji-Young Lee; Do-Kwan Hong; Dae-Suk Joo; Yo-Han Chio; Byoung-Uk Nam; Byung-Chul Woo;
2012 / IEEE
By: Wen-Pin Shih; Ming-Dao Wu; Pei-Zen Chang; Shuo-Hung Chang; Yi-Jie Chen; Yao-Chuan Tsai;
By: Wen-Pin Shih; Ming-Dao Wu; Pei-Zen Chang; Shuo-Hung Chang; Yi-Jie Chen; Yao-Chuan Tsai;
2012 / IEEE
By: Theisen, E.; Vogel, M.; Scheller, H.; Salpietro, E.; March, S.; Stepanov, B.; Fernandez-Cano, E.; Croari, G.; Cau, F.; Bruzzone, P.; Baker, W.; Amend, J.; Portone, A.; Wesche, R.;
By: Theisen, E.; Vogel, M.; Scheller, H.; Salpietro, E.; March, S.; Stepanov, B.; Fernandez-Cano, E.; Croari, G.; Cau, F.; Bruzzone, P.; Baker, W.; Amend, J.; Portone, A.; Wesche, R.;
2012 / IEEE
By: Yu-Jiau Huang; Yu-Lan Lu; Lau, J.H.; Tao-Chih Chang; Ching-Kuan Lee; Ming-Jer Kao; Lo, R.; Huan-Chun Fu; Kuo-Shu Kao; Pei-Chen Chang; Ren-Shin Cheng; Cheng-Ta Ko; Zhi-Cheng Hsiao; Jui-Hsiung Huang;
By: Yu-Jiau Huang; Yu-Lan Lu; Lau, J.H.; Tao-Chih Chang; Ching-Kuan Lee; Ming-Jer Kao; Lo, R.; Huan-Chun Fu; Kuo-Shu Kao; Pei-Chen Chang; Ren-Shin Cheng; Cheng-Ta Ko; Zhi-Cheng Hsiao; Jui-Hsiung Huang;
2012 / IEEE
By: Perrin, G.; Lazareff, B.; Maier, D.; Mahieu, S.; Navarrini, A.; Laslaz, F.; Geoffroy, D.; Chalain, J.; Celestin, G.;
By: Perrin, G.; Lazareff, B.; Maier, D.; Mahieu, S.; Navarrini, A.; Laslaz, F.; Geoffroy, D.; Chalain, J.; Celestin, G.;
2012 / IEEE
By: Grote, N.; Steffan, A.; Schubert, C.; Ziyang Zhang; Zawadzki, C.; Keil, N.; Matiss, A.; Theurer, A.; Richter, T.; Kroh, M.; Jin Wang;
By: Grote, N.; Steffan, A.; Schubert, C.; Ziyang Zhang; Zawadzki, C.; Keil, N.; Matiss, A.; Theurer, A.; Richter, T.; Kroh, M.; Jin Wang;
2012 / IEEE
By: Ferrero, F.; Gianesello, F.; Pilard, R.; Titz, D.; Luxey, C.; Gloria, D.; Jacquemod, G.; Brachat, P.;
By: Ferrero, F.; Gianesello, F.; Pilard, R.; Titz, D.; Luxey, C.; Gloria, D.; Jacquemod, G.; Brachat, P.;
2012 / IEEE
By: Soueidan, M.; Mouawad, B.; Martin, C.; Morel, H.; Bley, V.; Allard, B.; Buttay, C.; Fabregue, D.;
By: Soueidan, M.; Mouawad, B.; Martin, C.; Morel, H.; Bley, V.; Allard, B.; Buttay, C.; Fabregue, D.;
2012 / IEEE
By: Zirath, H.; Chee-Way Oh; Chang, E.Y.; Wei-Cheng Wu; Chin-Te Wang; Li-Han Hsu; Yueh-Chin Lin; Wee-Chin Lim; Szu-Ping Tsai;
By: Zirath, H.; Chee-Way Oh; Chang, E.Y.; Wei-Cheng Wu; Chin-Te Wang; Li-Han Hsu; Yueh-Chin Lin; Wee-Chin Lim; Szu-Ping Tsai;
2012 / IEEE
By: Swenson, O.; Marinov, V.; Datta, S.; Semler, M.; Atanasov, Y.; Sarwar, F.; Miller, R.;
By: Swenson, O.; Marinov, V.; Datta, S.; Semler, M.; Atanasov, Y.; Sarwar, F.; Miller, R.;
2012 / IEEE
By: Sumei Liu; Bauer, P.; Tingzhi Zhou; Yong Chen; Xiongyi Huang; Kun Lu; Yuntao Song; Zhongwei Wang; Guang Shen; Mitchell, N.; Chen-yu Gung; Niu, E.; Kaizhong Ding; Devred, A.; Yonghua Chen; Yanfang Bi;
By: Sumei Liu; Bauer, P.; Tingzhi Zhou; Yong Chen; Xiongyi Huang; Kun Lu; Yuntao Song; Zhongwei Wang; Guang Shen; Mitchell, N.; Chen-yu Gung; Niu, E.; Kaizhong Ding; Devred, A.; Yonghua Chen; Yanfang Bi;
2012 / IEEE
By: Oh, Y.K.; Lee, K.S.; Bang, E.N.; Kim, K.M.; Park, K.R.; Kwon, M.; Yang, H.L.; Kim, H.T.; Sa, J.W.; Kim, H.K.; Kim, Y.O.;
By: Oh, Y.K.; Lee, K.S.; Bang, E.N.; Kim, K.M.; Park, K.R.; Kwon, M.; Yang, H.L.; Kim, H.T.; Sa, J.W.; Kim, H.K.; Kim, Y.O.;
2012 / IEEE
By: Jun-Tune Chen; Fu-Yuan Lin; Ching-Shiang Hwang; Jui-Che Huang; Cheng-Hsiang Chang; Cheng-Shin Chang;
By: Jun-Tune Chen; Fu-Yuan Lin; Ching-Shiang Hwang; Jui-Che Huang; Cheng-Hsiang Chang; Cheng-Shin Chang;
1992 / IEEE / 000-0-0000-0000-0
By: Childers, F.K.; Ashby, S.R.; Sincerny, P.S.; Schlitt, L.; Stallings, C.; Deeney, C.; Roth, I.S.; Riordan, J.C.; Goyer, J.R.; Kortbawi, D.;
By: Childers, F.K.; Ashby, S.R.; Sincerny, P.S.; Schlitt, L.; Stallings, C.; Deeney, C.; Roth, I.S.; Riordan, J.C.; Goyer, J.R.; Kortbawi, D.;
2004 / IEEE / 978-5-87911-088-3
By: Reinovsky, R.E.; Lindemuth, I.R.; Sabayev, N.M.; Yakubov, V.B.; Vasyukov, V.A.; Achison, V.L.; Mokhov, V.N.; Chernyshev, V.K.; Petrukhin, A.A.; Fahel, R.I.;
By: Reinovsky, R.E.; Lindemuth, I.R.; Sabayev, N.M.; Yakubov, V.B.; Vasyukov, V.A.; Achison, V.L.; Mokhov, V.N.; Chernyshev, V.K.; Petrukhin, A.A.; Fahel, R.I.;
Equivalent fixed shape robot model of a modular robot configuration based on module characterization
2011 / IEEE / 978-1-61284-385-8By: Baca, J.; Escalera, J.A.; Aracil, R.; Ferre, M.;
2011 / IEEE / 978-1-4244-8115-6
By: Kitaaki, Y.; Matsuno, T.; Kaneko, S.; Fukuda, T.; Shiratsuchi, K.; Haraguchi, R.; Noda, A.; Okuda, H.; Domae, Y.; Sumi, K.;
By: Kitaaki, Y.; Matsuno, T.; Kaneko, S.; Fukuda, T.; Shiratsuchi, K.; Haraguchi, R.; Noda, A.; Okuda, H.; Domae, Y.; Sumi, K.;
2011 / IEEE / 978-1-4577-0365-2
By: Zhao Xibin; Yang Jianxu; Yan Shaomin; Jin Xinchao; Cai Bin; Zou Guowei;
By: Zhao Xibin; Yang Jianxu; Yan Shaomin; Jin Xinchao; Cai Bin; Zou Guowei;