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Topic: Argon
Results
2011 / IEEE
By: Lamenta, A.; Jodzis, S.; Krawczyk, K.; Schmidt-Szalowski, K.; Ulejczyk, B.; Kostka, K.;
By: Lamenta, A.; Jodzis, S.; Krawczyk, K.; Schmidt-Szalowski, K.; Ulejczyk, B.; Kostka, K.;
2011 / IEEE
By: Sin Ming Loo; Lee, C.; Shawver, S.; Plumlee, D.; Yates, M.; Browning, J.; Taff, J.; McCrink, M.;
By: Sin Ming Loo; Lee, C.; Shawver, S.; Plumlee, D.; Yates, M.; Browning, J.; Taff, J.; McCrink, M.;
2011 / IEEE
By: Garcia-Garcia, J.; Nieto-Perez, M.; Gonzalez, J.J.; Pacheco-Pacheco, M.; Rivera-Rodriguez, C.; Valdivia-Barrientos, R.; Pacheco-Sotelo, J.;
By: Garcia-Garcia, J.; Nieto-Perez, M.; Gonzalez, J.J.; Pacheco-Pacheco, M.; Rivera-Rodriguez, C.; Valdivia-Barrientos, R.; Pacheco-Sotelo, J.;
2011 / IEEE
By: Kuschel, T.; Petrovic, Z.L.; Winter, J.; Malovic, G.; Maric, D.; Skoro, N.; Stefanovic, I.;
By: Kuschel, T.; Petrovic, Z.L.; Winter, J.; Malovic, G.; Maric, D.; Skoro, N.; Stefanovic, I.;
2012 / IEEE
By: von Woedtke, T.; Weltmann, K.-D.; Schroder, K.; Nebe, B.; Quade, A.; Duske, K.; Fricke, K.;
By: von Woedtke, T.; Weltmann, K.-D.; Schroder, K.; Nebe, B.; Quade, A.; Duske, K.; Fricke, K.;
2012 / IEEE
By: Reuter, S.; Tresp, H.; Wende, K.; Weltmann, K.; Winter, J.; Masur, K.; Schmidt-Bleker, A.; Hammer, M.U.;
By: Reuter, S.; Tresp, H.; Wende, K.; Weltmann, K.; Winter, J.; Masur, K.; Schmidt-Bleker, A.; Hammer, M.U.;
2012 / IEEE
By: Chung-Chih Wu; Chih-Wei Chien; Hsing-Hung Hsieh; Cheng-Han Wu; Yung-Hui Yeh; Chang-Yu Lin; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng;
By: Chung-Chih Wu; Chih-Wei Chien; Hsing-Hung Hsieh; Cheng-Han Wu; Yung-Hui Yeh; Chang-Yu Lin; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng;
2012 / IEEE
By: Niemier, M.; Hu, X.S.; Csaba, G.; Sankar, V.K.; Peng Li; Bernstein, G.H.; Porod, W.;
By: Niemier, M.; Hu, X.S.; Csaba, G.; Sankar, V.K.; Peng Li; Bernstein, G.H.; Porod, W.;
Generation of Homogeneous Atmospheric-Pressure Dielectric Barrier Discharge in a Large-Gap Argon Gas
2012 / IEEEBy: Zhi Fang; Cheng Zhang; Jun Pan; Shengchang Ji; Tao Shao;
2012 / IEEE
By: Winter, J.; Reuter, S.; Weltmann, K.-D.; Hammer, M.U.; Tresp, H.; Schmidt-Bleker, A.;
By: Winter, J.; Reuter, S.; Weltmann, K.-D.; Hammer, M.U.; Tresp, H.; Schmidt-Bleker, A.;
2012 / IEEE
By: Schroder, D.; Reuter, S.; Fricke, K.; von Woedtke, T.; Weltmann, K.; Schulz-von der Gathen, V.;
By: Schroder, D.; Reuter, S.; Fricke, K.; von Woedtke, T.; Weltmann, K.; Schulz-von der Gathen, V.;
2012 / IEEE
By: Chun-Sheng Ren; Mu-Yang Qian; Jia-Liang Zhang; Xiao-Qiong Wen; Qiu-Yue Nie; Qian-Qian Fan; De-Zhen Wang;
By: Chun-Sheng Ren; Mu-Yang Qian; Jia-Liang Zhang; Xiao-Qiong Wen; Qiu-Yue Nie; Qian-Qian Fan; De-Zhen Wang;
2012 / IEEE
By: Shih-Ching Chen; Jyun-Bao Yang; Ting-Chang Chang; Jheng-Jie Huang; Ming-Jinn Tsai; Po-Chun Yang; Ann-Kuo Chu; Sze, S.M.; Hsueh-Chih Tseng; Yu-Ting Chen;
By: Shih-Ching Chen; Jyun-Bao Yang; Ting-Chang Chang; Jheng-Jie Huang; Ming-Jinn Tsai; Po-Chun Yang; Ann-Kuo Chu; Sze, S.M.; Hsueh-Chih Tseng; Yu-Ting Chen;
2012 / IEEE
By: Ievlev, A.V.; Alikin, D.O.; Shur, V.Y.S.; Gavrilov, N.V.; Sarmanova, M.F.; Dolbilov, M.A.;
By: Ievlev, A.V.; Alikin, D.O.; Shur, V.Y.S.; Gavrilov, N.V.; Sarmanova, M.F.; Dolbilov, M.A.;
1992 / IEEE / 000-0-0000-0000-0
By: Ni, A.L.; Lomonosov, I.V.; Kostin, V.V.; Vorobjev, O.Yu.; Hofmann, I.; Skvortsov, V.A.; Fortov, V.E.; Goel, B.P.;
By: Ni, A.L.; Lomonosov, I.V.; Kostin, V.V.; Vorobjev, O.Yu.; Hofmann, I.; Skvortsov, V.A.; Fortov, V.E.; Goel, B.P.;
1992 / IEEE / 000-0-0000-0000-0
By: Coulter, M.C.; LePell, P.D.; Deeney, C.; Thornhill, J.W.; Whitney, K.G.;
By: Coulter, M.C.; LePell, P.D.; Deeney, C.; Thornhill, J.W.; Whitney, K.G.;
2000 / IEEE
By: Hinshelwood, D. D.; Black, D. C.; Ware, K.; Vitkovitsky, I.; Harper-Slaboszewicz, V.; Ushakov, I.; Tsepilov, G.; Solovyov, V.; Frolov, A.; Dubina, V.; Cooperstein, G.; Ottinger, P. F.; Rose, D. V.; Schumer, J. W.; Stephanakis, S. J.; Weber, B. V.; Chorny, V.; Chorny, A.;
By: Hinshelwood, D. D.; Black, D. C.; Ware, K.; Vitkovitsky, I.; Harper-Slaboszewicz, V.; Ushakov, I.; Tsepilov, G.; Solovyov, V.; Frolov, A.; Dubina, V.; Cooperstein, G.; Ottinger, P. F.; Rose, D. V.; Schumer, J. W.; Stephanakis, S. J.; Weber, B. V.; Chorny, V.; Chorny, A.;
2002 / IEEE / 978-0-7354-0107-5
By: Ottinger, Paul F.; Schumer, Joseph W.; Strasburg, Scan D.; Swanekamp, Stephen B.; Oliver, Bryan V.;
By: Ottinger, Paul F.; Schumer, Joseph W.; Strasburg, Scan D.; Swanekamp, Stephen B.; Oliver, Bryan V.;
2002 / IEEE / 978-0-7354-0107-5
By: Tauschwitz, Andreas; Niemann, Christoph; Yu, Simon; Rosmej, Frank; Ponce, Dave; Presura, Radu; Nef, Stefan; Kobloch, Renate; Penache, Dan; Birkner, Richard; Hoffmann, Dieter H.H.;
By: Tauschwitz, Andreas; Niemann, Christoph; Yu, Simon; Rosmej, Frank; Ponce, Dave; Presura, Radu; Nef, Stefan; Kobloch, Renate; Penache, Dan; Birkner, Richard; Hoffmann, Dieter H.H.;
2004 / IEEE / 978-5-87911-088-3
By: Lazutkin, M.N.; Karlik, K.V.; Popov, S.A.; Proskurovsky, D.I.; Ozur, G.E.;
By: Lazutkin, M.N.; Karlik, K.V.; Popov, S.A.; Proskurovsky, D.I.; Ozur, G.E.;
2004 / IEEE / 978-5-87911-088-3
By: Kauffmann, K.; Favre, M.; Bhuyan, H.; Wyndham, E.; Mitchell, I.; Chuaqui, H.;
By: Kauffmann, K.; Favre, M.; Bhuyan, H.; Wyndham, E.; Mitchell, I.; Chuaqui, H.;
2004 / IEEE / 978-5-87911-088-3
By: Krishnan, M.; Gerhan, A.; Bixler, A.; Coleman, P.L.; Wilson, K.; Thompson, J.; Parks, D.;
By: Krishnan, M.; Gerhan, A.; Bixler, A.; Coleman, P.L.; Wilson, K.; Thompson, J.; Parks, D.;
2004 / IEEE / 978-5-87911-088-3
By: Gafarov, A.M.; Panikovskaya, V.N.; Vagina, N.M.; Komissarov, A.V.; Safronov, A.A.; Ostashev, V.I.;
By: Gafarov, A.M.; Panikovskaya, V.N.; Vagina, N.M.; Komissarov, A.V.; Safronov, A.A.; Ostashev, V.I.;
Influence of a radial electrical field on the electrical breakdown along the exploding tungsten wire
2004 / IEEE / 978-5-87911-088-3By: Shishlov, A.V.; Oreshkin, V.I.; Labetsky, A.Yu.; Baksht, R.B.; Rousskikh, A.G.;