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Topic: Anechoic Chambers (electromagnetic)
Results
2012 / IEEE
By: Ayestaran, R.G.; Alvarez, J.; Las-Heras, F.; Lopez-Fernandez, J.A.; Loredo, S.; Leon, G.;
By: Ayestaran, R.G.; Alvarez, J.; Las-Heras, F.; Lopez-Fernandez, J.A.; Loredo, S.; Leon, G.;
2012 / IEEE
By: Fernandes, T.R.; Sanchez, M.G.; Cuinas, I.; Al-Nuaimi, M.O.; Caldeirinha, R.F.S.; Morgadinho, S.; Richter, J.;
By: Fernandes, T.R.; Sanchez, M.G.; Cuinas, I.; Al-Nuaimi, M.O.; Caldeirinha, R.F.S.; Morgadinho, S.; Richter, J.;
2012 / IEEE
By: Smart, K.W.; Timms, G.P.; Archer, J.W.; Smith, S.L.; Granet, C.; Hay, S.G.; Barker, S.J.;
By: Smart, K.W.; Timms, G.P.; Archer, J.W.; Smith, S.L.; Granet, C.; Hay, S.G.; Barker, S.J.;
2011 / IEEE / 978-1-4244-9563-4
By: Aubin, J.; Soerens, R.; Miller, J.J.; Foged, L.J.; Winebrand, M.;
By: Aubin, J.; Soerens, R.; Miller, J.J.; Foged, L.J.; Winebrand, M.;
2011 / IEEE / 978-1-4244-9563-4
By: Latrach, M.; Alaeldine, A.; Dakdouki, A.; Sayegh, Z.; Raggad, H.;
By: Latrach, M.; Alaeldine, A.; Dakdouki, A.; Sayegh, Z.; Raggad, H.;
2011 / IEEE / 978-1-61284-697-2
By: Chee Wee Kim; Jeng Wai Kwan; Tat Meng Chiam; Yu Ge; See, T.S.P.;
By: Chee Wee Kim; Jeng Wai Kwan; Tat Meng Chiam; Yu Ge; See, T.S.P.;
2011 / IEEE / 978-0-9541146-3-3
By: Camarda, F.; Bencivinni, M.; Maffucci, A.; Chiariello, A.G.; Girardi, A.; Martines, I.; Capriglione, D.; Izzi, R.; Fusillo, G.;
By: Camarda, F.; Bencivinni, M.; Maffucci, A.; Chiariello, A.G.; Girardi, A.; Martines, I.; Capriglione, D.; Izzi, R.; Fusillo, G.;
2011 / IEEE / 978-1-4244-6051-9
By: Yigit, E.; Tekbas, M.; Cetinkaya, H.; Demirci, S.; Vertiy, A.; Ozdemir, C.;
By: Yigit, E.; Tekbas, M.; Cetinkaya, H.; Demirci, S.; Vertiy, A.; Ozdemir, C.;
2011 / IEEE / 978-0-9541146-3-3
By: Hasumi, R.; Yamaguchi, M.; Watanabe, I.; Kurokawa, S.; Ameya, M.;
By: Hasumi, R.; Yamaguchi, M.; Watanabe, I.; Kurokawa, S.; Ameya, M.;
2011 / IEEE / 978-1-4577-1497-9
By: Sian Meng Se; Husain, M.N.; Yaakob, N.M.; Ibrahim, I.M.; Shaaban, A.;
By: Sian Meng Se; Husain, M.N.; Yaakob, N.M.; Ibrahim, I.M.; Shaaban, A.;
2011 / IEEE / 978-1-4577-1348-4
By: Anzai, D.; Hara, S.; Hamaguchi, K.; Takizawa, K.; Yanagihara, K.;
By: Anzai, D.; Hara, S.; Hamaguchi, K.; Takizawa, K.; Yanagihara, K.;
2011 / IEEE / 978-1-4577-0631-8
By: Carter, W.; Kovac, M.; Ashby, S.; Norgard, P.; Kinsey, N.G.; Druce, R.L.; Clements, K.R.; Curry, R.D.; Benford, J.;
By: Carter, W.; Kovac, M.; Ashby, S.; Norgard, P.; Kinsey, N.G.; Druce, R.L.; Clements, K.R.; Curry, R.D.; Benford, J.;
2011 / IEEE / 978-1-4577-0101-6
By: Huang Guan-long; Cai Run-nan; Lin Shu; Wang Li-na; Zhang Wen-bin;
By: Huang Guan-long; Cai Run-nan; Lin Shu; Wang Li-na; Zhang Wen-bin;
2012 / IEEE / 978-1-4673-0961-5
By: Zanal, A.; Rosli, A.D.; Sharif, J.M.; Taib, M.N.; Idris, H.A.; Noordin, I.R.M.; Abdullah, A.T.;
By: Zanal, A.; Rosli, A.D.; Sharif, J.M.; Taib, M.N.; Idris, H.A.; Noordin, I.R.M.; Abdullah, A.T.;
2012 / IEEE / 978-1-4673-0658-4
By: Colburn, J.S.; Geary, K.; Litkouhi, B.; Shuqing Zeng; Bekaryan, A.;
By: Colburn, J.S.; Geary, K.; Litkouhi, B.; Shuqing Zeng; Bekaryan, A.;
2012 / IEEE / 978-1-4577-0920-3
By: Tarot, A.; de Cos, M.E.; Mantash, M.; Las-Heras, F.; Mahdjoubi, K.; Collardey, S.;
By: Tarot, A.; de Cos, M.E.; Mantash, M.; Las-Heras, F.; Mahdjoubi, K.; Collardey, S.;
2012 / IEEE / 978-1-4673-0990-5
By: Li Ming; Zhang Xing-qi; Yang Ming-chuan; Cai Run-nan; Liu Xiao-feng;
By: Li Ming; Zhang Xing-qi; Yang Ming-chuan; Cai Run-nan; Liu Xiao-feng;
2012 / IEEE / 978-92-9092-266-7
By: Loos, S.E.; Rasek, G.A.; Pascual-Gil, E.; Schroder, A.; Junqua, I.; Neubauer, M.;
By: Loos, S.E.; Rasek, G.A.; Pascual-Gil, E.; Schroder, A.; Junqua, I.; Neubauer, M.;
2012 / IEEE / 978-1-4673-2185-3
By: Cheng Chun-Yue; Chen Jin-Long; Chen Yun-Mei; Wu Chun-Bai; Zhai Hong;
By: Cheng Chun-Yue; Chen Jin-Long; Chen Yun-Mei; Wu Chun-Bai; Zhai Hong;
Assessment of field uniformity in a GTEM cell using a novel non-invasive scanning positioning system
1998 / IEEE / 0-7803-5018-9By: Rycroft, R.J.;