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Topic: Aerospace
Results
2011 / IEEE
By: Permann, R.; Kumpusch, R.; Blochberger, T.; Guertlschmid, W.; Conte, F.V.; Fleig, J.; Einhorn, M.; Kral, C.;
By: Permann, R.; Kumpusch, R.; Blochberger, T.; Guertlschmid, W.; Conte, F.V.; Fleig, J.; Einhorn, M.; Kral, C.;
2011 / IEEE
By: Stavroulaki, V.; Filo, M.; Gebert, J.; Demestichas, P.; Georgakopoulos, A.; Logothetis, M.; Tsagkaris, K.;
By: Stavroulaki, V.; Filo, M.; Gebert, J.; Demestichas, P.; Georgakopoulos, A.; Logothetis, M.; Tsagkaris, K.;
2011 / IEEE
By: Smith, P.J.; Borgman, A.; Spencer, A.; Wiley, E.; Evans, M.; Billings, C.; Durham, K.; Beatty, R.;
By: Smith, P.J.; Borgman, A.; Spencer, A.; Wiley, E.; Evans, M.; Billings, C.; Durham, K.; Beatty, R.;
2011 / IEEE
2011 / IEEE
2011 / IEEE
By: Dreuillet, P.; Bonin, G.; Baque, R.; Nouvel, J.; Ruault du Plessis, O.; Oriot, H.; Coulombeix, C.;
By: Dreuillet, P.; Bonin, G.; Baque, R.; Nouvel, J.; Ruault du Plessis, O.; Oriot, H.; Coulombeix, C.;
2011 / IEEE
2011 / IEEE
2011 / IEEE
By: Kelley, R.; Crain, G.; Yeary, M.; Doviak, R.; Curtis, C.; Meier, J.; Ivic, I.; Zahrai, A.; Yu, T.-Y.; Palmer, R.; Zhang, Y.;
By: Kelley, R.; Crain, G.; Yeary, M.; Doviak, R.; Curtis, C.; Meier, J.; Ivic, I.; Zahrai, A.; Yu, T.-Y.; Palmer, R.; Zhang, Y.;
2011 / IEEE
By: Clausen, L.B.N.; Ribeiro, A.J.; Ruohoniemi, J.M.; Baker, J.B.H.; Sterne, K.A.; Frissell, N.A.; Greenwald, R.A.;
By: Clausen, L.B.N.; Ribeiro, A.J.; Ruohoniemi, J.M.; Baker, J.B.H.; Sterne, K.A.; Frissell, N.A.; Greenwald, R.A.;