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Topic: Absorption
Results
Properties of a He-Ne laser at � = 612 nm, stabilized by means of an external iodine absorption cell
1987 / IEEEBy: Glaser, Michael;
2011 / IEEE
By: Qi Wang; Hui Huang; Wei Wang; Xiaomin Ren; Yongqing Huang; Xiaofeng Duan; Shiwei Cai;
By: Qi Wang; Hui Huang; Wei Wang; Xiaomin Ren; Yongqing Huang; Xiaofeng Duan; Shiwei Cai;
2011 / IEEE
By: Xiao-Mei Cai; Bao-Ping Zhang; Shao-Xiong Wu; Wen-Jie Liu; Ming Chen; An-Kai Lin; Shuo Lin; Jiang-Yong Zhang; Xin Li; Sheng-Wei Zeng;
By: Xiao-Mei Cai; Bao-Ping Zhang; Shao-Xiong Wu; Wen-Jie Liu; Ming Chen; An-Kai Lin; Shuo Lin; Jiang-Yong Zhang; Xin Li; Sheng-Wei Zeng;
2011 / IEEE
By: Satoh, Y.S.; Ueda, M.U.; Matsuda, T.M.; Miura, M.M.; Hara, M.H.; Matsuda, S.M.; Hashimoto, K.H.;
By: Satoh, Y.S.; Ueda, M.U.; Matsuda, T.M.; Miura, M.M.; Hara, M.H.; Matsuda, S.M.; Hashimoto, K.H.;
2011 / IEEE
By: Brown, E.R.; Hubschman, J.-P.; Hua Lee; Stojadinovic, A.; Culjat, M.O.; Bajwa, N.; Grundfest, W.S.; Tewari, P.; Bennett, D.B.; Singh, R.S.; Taylor, Z.D.; Kealey, C.P.;
By: Brown, E.R.; Hubschman, J.-P.; Hua Lee; Stojadinovic, A.; Culjat, M.O.; Bajwa, N.; Grundfest, W.S.; Tewari, P.; Bennett, D.B.; Singh, R.S.; Taylor, Z.D.; Kealey, C.P.;
2011 / IEEE
By: Eun Jong Cha; Taeyong Kim; Sungil Kim; Muhan Choi; Min Hwan Kwak; Seung Beom Kang; Kwang Yong Kang;
By: Eun Jong Cha; Taeyong Kim; Sungil Kim; Muhan Choi; Min Hwan Kwak; Seung Beom Kang; Kwang Yong Kang;
Organic Deep Ultraviolet Photodetector With Response Peak Focusing on 270 nm Using the Acceptor BAlq
2011 / IEEEBy: Yong-sheng Wang; Xi-qing Zhang; Zuo-fu Hu; Qian Dai; Lu Zhu;
2011 / IEEE
By: Panina, L.V.; Peng, H.X.; Qin, F.X.; Gonzalez, J.; Zhukov, A.; Zhukova, V.; Ipatov, M.;
By: Panina, L.V.; Peng, H.X.; Qin, F.X.; Gonzalez, J.; Zhukov, A.; Zhukova, V.; Ipatov, M.;
2011 / IEEE
By: Youngjoo Chung; Sailing He; Jooeun Im; Bongkyun Kim; Guofeng Yan; Binhao Wang; Guiying Ma; Zhang, A.P.;
By: Youngjoo Chung; Sailing He; Jooeun Im; Bongkyun Kim; Guofeng Yan; Binhao Wang; Guiying Ma; Zhang, A.P.;
2012 / IEEE
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;
2012 / IEEE
By: Shuhui Bu; Asao, Y.; Someda, Y.; Fukutani, K.; Yamakawa, M.; Kondo, K.; Shiina, T.; Zhenbao Liu;
By: Shuhui Bu; Asao, Y.; Someda, Y.; Fukutani, K.; Yamakawa, M.; Kondo, K.; Shiina, T.; Zhenbao Liu;
2012 / IEEE
By: Harris, J.S.; Kamins, T.I.; Wahl, P.; Rong, Y.; Miller, D.A.B.; Fei, E.T.; Roth, J.E.; Edwards, E.H.; Schaevitz, R.K.;
By: Harris, J.S.; Kamins, T.I.; Wahl, P.; Rong, Y.; Miller, D.A.B.; Fei, E.T.; Roth, J.E.; Edwards, E.H.; Schaevitz, R.K.;
2012 / IEEE
By: Jordan, M.H.; Moffatt, L.T.; Shupp, J.W.; Nguyen, T.T.A.; Ramella-Roman, J.C.; Leto, E.J.;
By: Jordan, M.H.; Moffatt, L.T.; Shupp, J.W.; Nguyen, T.T.A.; Ramella-Roman, J.C.; Leto, E.J.;
2012 / IEEE
By: Chang, R.; Tokumasu, F.; Allen, D.W.; Lesoine, J.F.; Litorja, M.; Clarke, M.L.; Ji Youn Lee; Jeeseong Hwang;
By: Chang, R.; Tokumasu, F.; Allen, D.W.; Lesoine, J.F.; Litorja, M.; Clarke, M.L.; Ji Youn Lee; Jeeseong Hwang;
2012 / IEEE
By: Simanovskii, D.M.; Mackanos, M.A.; Jansen, E.D.; Kozub, J.A.; Contag, C.H.; Hutson, M.M.; Schriver, K.E.;
By: Simanovskii, D.M.; Mackanos, M.A.; Jansen, E.D.; Kozub, J.A.; Contag, C.H.; Hutson, M.M.; Schriver, K.E.;
2012 / IEEE
By: Hai-Yu Wang; Bing-Rong Gao; Hong-Bo Sun; Qi-Dai Chen; Ya-Wei Hao; Ying Jiang; Lei Wang; Zhi-Yong Yang; Hai Wang;
By: Hai-Yu Wang; Bing-Rong Gao; Hong-Bo Sun; Qi-Dai Chen; Ya-Wei Hao; Ying Jiang; Lei Wang; Zhi-Yong Yang; Hai Wang;
2012 / IEEE
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
2012 / IEEE
By: Baoxi Xu; Chengwu An; Kaidong Ye; Jing Zhang; Jianming Li; Cheow Wee Chia; Yeow Teck Toh;
By: Baoxi Xu; Chengwu An; Kaidong Ye; Jing Zhang; Jianming Li; Cheow Wee Chia; Yeow Teck Toh;
2012 / IEEE
By: Peloso, R.; Fiorini, C.; Beverina, L.; Giussani, M.; Sampietro, M.; Binda, M.; Natali, D.; Iacchetti, A.;
By: Peloso, R.; Fiorini, C.; Beverina, L.; Giussani, M.; Sampietro, M.; Binda, M.; Natali, D.; Iacchetti, A.;
2012 / IEEE
By: Byeonghoon Cho; Kyung Sook Jeon; Sang Youn Han; Hyang-Shik Kong; Junho Song; Mi Seon Seo;
By: Byeonghoon Cho; Kyung Sook Jeon; Sang Youn Han; Hyang-Shik Kong; Junho Song; Mi Seon Seo;
2012 / IEEE
By: Studart, N.; Farinas, P. F.; Degani, M. H.; Maialle, M. Z.; Villas-Boas, J. M.; Vieira, G. S.; Pires, M. P.; Unterrainer, K.; Guimaraes, P. S. S.; Kawabata, R. M. S.; Parra-Murillo, C. A.; Alvarenga, D. R.; Souza, P. L.;
By: Studart, N.; Farinas, P. F.; Degani, M. H.; Maialle, M. Z.; Villas-Boas, J. M.; Vieira, G. S.; Pires, M. P.; Unterrainer, K.; Guimaraes, P. S. S.; Kawabata, R. M. S.; Parra-Murillo, C. A.; Alvarenga, D. R.; Souza, P. L.;
Investigation on Back-Reflected Pumping Light in High-Power Quasi-End-Pumped Yb:YAG Thin-Disk Lasers
2012 / IEEEBy: Radmard, S.; Kazemi, S.; Shayganmanesh, M.; Arabgari, S.;
Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
2012 / IEEEBy: Lorfevre, E.; Pouget, V.; Azzopardi, S.; Mbaye, N.; Darracq, F.; Lewis, D.; Bezerra, F.;
2012 / IEEE
By: Vaccaro, L.; Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.;
By: Vaccaro, L.; Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.;
2012 / IEEE
By: Daumard, F.; Goulas, Y.; Champagne, S.; Fournier, A.; Ounis, A.; Olioso, A.; Moya, I.;
By: Daumard, F.; Goulas, Y.; Champagne, S.; Fournier, A.; Ounis, A.; Olioso, A.; Moya, I.;
2012 / IEEE
By: Winter, J.; Reuter, S.; Weltmann, K.-D.; Hammer, M.U.; Tresp, H.; Schmidt-Bleker, A.;
By: Winter, J.; Reuter, S.; Weltmann, K.-D.; Hammer, M.U.; Tresp, H.; Schmidt-Bleker, A.;
2012 / IEEE
By: Perez-Landazabal, J.I.; Labrador, A.; Gomez-Polo, C.; Ederra, I.; Liberal, I.; Gonzalo, R.;
By: Perez-Landazabal, J.I.; Labrador, A.; Gomez-Polo, C.; Ederra, I.; Liberal, I.; Gonzalo, R.;
2012 / IEEE
By: Harun, S.W.; Ahmad, H.; Zarei, A.; Mirnia, S.E.; Fatehi, H.; Zahedi, F.Z.; Zarifi, A.; Emami, S.D.;
By: Harun, S.W.; Ahmad, H.; Zarei, A.; Mirnia, S.E.; Fatehi, H.; Zahedi, F.Z.; Zarifi, A.; Emami, S.D.;
2012 / IEEE
By: Hanson, G.W.; Forati, E.; Patch, S.; Maksimenko, S.A.; Shuba, M.V.; Dongxiao Li; Geller, D.A.; Junda Chen; Hong Koo Kim; Yun Suk Jung;
By: Hanson, G.W.; Forati, E.; Patch, S.; Maksimenko, S.A.; Shuba, M.V.; Dongxiao Li; Geller, D.A.; Junda Chen; Hong Koo Kim; Yun Suk Jung;
Non-Proportionality of Electron Response and Energy Resolution of Compton Electrons in Scintillators
2012 / IEEEBy: Szczesniak, T.; Syntfeld-Kazuch, A.; Czarnacki, W.; Moszynski, M.; Szawlowski, M.; Pausch, G.; Swiderski, L.; Roemer, K.; Marcinkowski, R.; Plettner, C.;
2012 / IEEE
By: Nielsen, J.O.; Plets, D.; Vermeeren, G.; Tanghe, E.; Martens, L.; Joseph, W.; Andersen, J.B.; Bamba, A.;
By: Nielsen, J.O.; Plets, D.; Vermeeren, G.; Tanghe, E.; Martens, L.; Joseph, W.; Andersen, J.B.; Bamba, A.;