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Topic: 4.6 Micron
Results
2001 / IEEE / 1-55752-662-1
By: Felix, C.L.; Bewley, W.W.; Jurkovic, M.J.; Bartolo, R.E.; Vurgaftman, I.; Meyer, J.R.; Manfra, M.J.; Turner, G.W.; Martinelli, R.U.; Lee, H.;
By: Felix, C.L.; Bewley, W.W.; Jurkovic, M.J.; Bartolo, R.E.; Vurgaftman, I.; Meyer, J.R.; Manfra, M.J.; Turner, G.W.; Martinelli, R.U.; Lee, H.;
2002 / IEEE / 1-55752-706-7
By: Marinelli, R.U.; Lee, H.; Meyer, A.R.; Lindle, T.; Bewley, W.W.; Vurgaftman, I.; Felix, C.L.; Bartolo, R.E.;
By: Marinelli, R.U.; Lee, H.; Meyer, A.R.; Lindle, T.; Bewley, W.W.; Vurgaftman, I.; Felix, C.L.; Bartolo, R.E.;
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