Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: 2d Simulation
Results
1992 / IEEE / 000-0-0000-0000-0
By: Weber, B.V.; Stephanakis, S.J.; Ottinger, P.F.; Grossmann, J.M.; Swanekamp, S.B.; Cooperstein, G.; Kellogg, J.C.;
By: Weber, B.V.; Stephanakis, S.J.; Ottinger, P.F.; Grossmann, J.M.; Swanekamp, S.B.; Cooperstein, G.; Kellogg, J.C.;
2011 / IEEE / 978-1-61284-329-2
By: Jamroz, B.; Sessions, W.; Verboncoeur, J.; Freund, H.P.; Bui, T.; Ives, L.; Jhurani, C.;
By: Jamroz, B.; Sessions, W.; Verboncoeur, J.; Freund, H.P.; Bui, T.; Ives, L.; Jhurani, C.;
2011 / IEEE / 978-1-4577-1348-4
By: Ghaboosi, K.; Yunxing Ye; Askarzadeh, F.; Pahlavan, K.; Makarov, S.;
By: Ghaboosi, K.; Yunxing Ye; Askarzadeh, F.; Pahlavan, K.; Makarov, S.;
2011 / IEEE / 978-1-4577-0255-6
By: Rekha, R.; Srinivas, T.; Malathi, S.; Jayanthi, C.; Rashmi, C.; Shushma, M.R.; Sudarshan, S.M.;
By: Rekha, R.; Srinivas, T.; Malathi, S.; Jayanthi, C.; Rashmi, C.; Shushma, M.R.; Sudarshan, S.M.;
1989 / IEEE
By: Serra-Mestres, F.; Millan, J.; Rebollo, J.; Berta, F.; Paredes, J.; Hidalgo, S.; Fernandez, J.;
By: Serra-Mestres, F.; Millan, J.; Rebollo, J.; Berta, F.; Paredes, J.; Hidalgo, S.; Fernandez, J.;
1992 / IEEE
By: Bordelon, T.J.; Agostinelli, V.M., Jr.; Maziar, C.M.; Tasch, A.F.; Yeap, C.F.; Wang, X.L.;
By: Bordelon, T.J.; Agostinelli, V.M., Jr.; Maziar, C.M.; Tasch, A.F.; Yeap, C.F.; Wang, X.L.;
1993 / IEEE / 0-7803-0782-8
By: Campbell, A.B.; Curtice, W.R.; McMorrow, D.; Weatherford, T.R.; Knudson, A.R.;
By: Campbell, A.B.; Curtice, W.R.; McMorrow, D.; Weatherford, T.R.; Knudson, A.R.;
1995 / IEEE / 0-7803-2031-X
By: Chen, T.; Tahui Wang; Chimoon Huang; Shone, F.C.; Chang, A.; Peng, N.C.;
By: Chen, T.; Tahui Wang; Chimoon Huang; Shone, F.C.; Chang, A.; Peng, N.C.;
1995 / IEEE / 0-7803-2040-9
By: Seung-Ik Jeon; Min-Koo Han; Key-Man Han; Do-Hong Yun; Doe-Sung Shin;
By: Seung-Ik Jeon; Min-Koo Han; Key-Man Han; Do-Hong Yun; Doe-Sung Shin;
1996 / IEEE
By: Daumann, W.; Ellrodt, P.; Brockerhoff, W.; Bertenburg, R.; Reuter, R.; Auer, U.; Molls, W.; Tegude, F.-J.;
By: Daumann, W.; Ellrodt, P.; Brockerhoff, W.; Bertenburg, R.; Reuter, R.; Auer, U.; Molls, W.; Tegude, F.-J.;
1997 / IEEE
By: Ferlet-Cavrois, V.; Musseau, O.; Raynaud, C.; Pelloie, J.L.; McDonald, P.T.; Stapor, W.J.; Knudson, A.R.; Campbell, A.B.;
By: Ferlet-Cavrois, V.; Musseau, O.; Raynaud, C.; Pelloie, J.L.; McDonald, P.T.; Stapor, W.J.; Knudson, A.R.; Campbell, A.B.;
1997 / IEEE
By: Detcheverry, C.; Dachs, C.; Lorfevre, E.; Ecoffet, R.; Palau, J.-M.; Calvet, M.-C.; Roubaud, F.; Gasiot, J.;
By: Detcheverry, C.; Dachs, C.; Lorfevre, E.; Ecoffet, R.; Palau, J.-M.; Calvet, M.-C.; Roubaud, F.; Gasiot, J.;
1998 / IEEE
By: Palau, J.-M.; Detcheverry, C.; Dachs, C.; Sudre, C.; Gasiot, J.; Ecoffet, R.; Lorfevre, E.; Garnie, J.; Calvet, M.-C.;
By: Palau, J.-M.; Detcheverry, C.; Dachs, C.; Sudre, C.; Gasiot, J.; Ecoffet, R.; Lorfevre, E.; Garnie, J.; Calvet, M.-C.;
1997 / IEEE / 0-7803-4071-X
By: Lorfevre, E.; Ecoffets, R.; Calvet, M.-C.; Gasiot, J.; Detcheverry, C.; Palau, J.-M.; Roubaud, F.; Sudre, C.; Dachs, E.;
By: Lorfevre, E.; Ecoffets, R.; Calvet, M.-C.; Gasiot, J.; Detcheverry, C.; Palau, J.-M.; Roubaud, F.; Sudre, C.; Dachs, E.;
1997 / IEEE / 0-7803-4071-X
By: Lorfevre, E.; Ecoffet, R.; Garnier, J.; Calvet, M.-C.; Dachs, C.; Gasiot, J.; Palau, J.-M.; Detcheverry, C.; Sudre, C.;
By: Lorfevre, E.; Ecoffet, R.; Garnier, J.; Calvet, M.-C.; Dachs, C.; Gasiot, J.; Palau, J.-M.; Detcheverry, C.; Sudre, C.;
2000 / IEEE / 0-7803-6305-1
By: Weidong Liu; Jia-Jiunn Ou; Kanyu Cao; Xiaodong Jin; Chenming Hu; Matloubian, M.; Yuhua Cheng;
By: Weidong Liu; Jia-Jiunn Ou; Kanyu Cao; Xiaodong Jin; Chenming Hu; Matloubian, M.; Yuhua Cheng;
2000 / IEEE / 0-7803-6269-1
By: Bafleur, M.; Suquet, M.; Stefanov, E.; Lance, P.; Mauran, N.; Gonnard, O.; Charitat, G.; Peyre-Lavigne, A.;
By: Bafleur, M.; Suquet, M.; Stefanov, E.; Lance, P.; Mauran, N.; Gonnard, O.; Charitat, G.; Peyre-Lavigne, A.;