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Implementation and covering analysis for the T-way combinatorial testing strategy

By: Varvara, G.; Sandu, V.;

2011 / IEEE / 978-973-621-321-2

Description

This item was taken from the IEEE Conference ' Implementation and covering analysis for the T-way combinatorial testing strategy ' The paper stands from the general concepts of combinatorial testing in order to point out the benefits of the automatically generated tests based on the t-way combinatorial techniques. Then it implements an optimal strategy that reduce the necessary number of test cases and analysis its effectiveness on practical examples that involves a reduce number of correlated input parameters. Some remarks on the proposed implementations cost and test covering advantages conclude this work.