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Data Acquisition and Virtual Instrumentation system for the study of Peltier and Seebeck effects
By: Sandu, V.; Sandu, F.; Dumitru, A.I.; Nan, S.;
2010 / IEEE / 978-1-4244-7020-4
Description
This item was taken from the IEEE Conference ' Data Acquisition and Virtual Instrumentation system for the study of Peltier and Seebeck effects ' The paper presents the development of a data acquisition system dedicated to the study of Peltier and Seebeck effect and to the performance parameters of a commercial thermoelectric semiconductor element. It was used a National Instruments NI USB-6008 Data Acquisition System (connected to National Semiconductor LM35 temperature sensors) to build a Virtual Instrumentation system programmed in NI LabView. There are presented computational models and experimental data interpretations.
Related Topics
Seebeck Effect
Semiconductor Devices
National Instruments
Data Acquisition System
Virtual Instrumentation System
Seebeck Effect
Thermoelectric Semiconductor Element
Ni Usb-6008
Ni Labview
Data Acquisition
Instruments
Thermoelectricity
Temperature Sensors
Voltage
Thermal Conductivity
Circuit Testing
Heat Pumps
Probes
Temperature Measurement
Peltier Effect
Electrical Engineering Computing
Data Acquisition
Virtual Instrumentation
Engineering
Peltier Effect
