Use this resource - and many more! - in your textbook!
AcademicPub holds over eight million pieces of educational content for you to mix-and-match your way.
Data Acquisition and Virtual Instrumentation system for the study of Peltier and Seebeck effects
By: Sandu, V.; Sandu, F.; Dumitru, A.I.; Nan, S.;
2010 / IEEE / 978-1-4244-7020-4
This item was taken from the IEEE Conference ' Data Acquisition and Virtual Instrumentation system for the study of Peltier and Seebeck effects ' The paper presents the development of a data acquisition system dedicated to the study of Peltier and Seebeck effect and to the performance parameters of a commercial thermoelectric semiconductor element. It was used a National Instruments NI USB-6008 Data Acquisition System (connected to National Semiconductor LM35 temperature sensors) to build a Virtual Instrumentation system programmed in NI LabView. There are presented computational models and experimental data interpretations.
Data Acquisition System
Virtual Instrumentation System
Thermoelectric Semiconductor Element
Electrical Engineering Computing