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Resonator measurements of superonductor surface impedance provided oscillations degeneration removal
By: Glamazdin, V.V.; Barannik, A.A.; Cherpak, N.T.; Skresanov, V.N.;
2009 / IEEE / 978-1-4244-4796-1
Description
This item was taken from the IEEE Conference ' Resonator measurements of superonductor surface impedance provided oscillations degeneration removal ' The processing technique of amplitude-frequency response (AFR) of resonators with partial removal of mode of degeneration was developed, which allows calculating of resonance frequency and quality-factor. The approach was used for data processing obtained at AFR measurement of sapphire resonator with HTS film as a key stage of determination of surface impedance.
Related Topics
Oscillations
Sapphire
Superconducting Resonators
Superconducting Thin Films
Al2o3
Superconductor Surface Impedance
Oscillation Degeneration Removal
Afr Measurement
Amplitude-frequency Response
Resonance Frequency
Data Processing
Sapphire Resonator
Hts Film
Impedance Measurement
Surface Impedance
Indium Tin Oxide
Helium
Organizing
Ieee Catalog
High-temperature Superconductors
Frequency Response
Electric Impedance Measurement
Surface Impedance
Engineering
Resonator Measurement
