Your Search Results

Use this resource - and many more! - in your textbook!

AcademicPub holds over eight million pieces of educational content for you to mix-and-match your way.

Experience the freedom of customizing your course pack with AcademicPub!
Not an educator but still interested in using this content? No problem! Visit our provider's page to contact the publisher and get permission directly.

Mesurements of thin resistive films employing split post dielectric resonator technique

By: Krupka, J.; Derzakowski, K.; Givot, B.L.; Jacob, M.;

2008 / IEEE / 978-83-906662-8-0

Description

This item was taken from the IEEE Conference ' Mesurements of thin resistive films employing split post dielectric resonator technique ' Split post dielectric resonators have been used for measurements of the surface resistance of thin cermet and patterened metal films deposited on a thin low loss dielectric substrate. It has been proved that