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Mesurements of thin resistive films employing split post dielectric resonator technique
By: Krupka, J.; Derzakowski, K.; Givot, B.L.; Jacob, M.;
2008 / IEEE / 978-83-906662-8-0
Description
This item was taken from the IEEE Conference ' Mesurements of thin resistive films employing split post dielectric resonator technique ' Split post dielectric resonators have been used for measurements of the surface resistance of thin cermet and patterened metal films deposited on a thin low loss dielectric substrate. It has been proved that
Related Topics
Surface Resistance
Dielectric Substrates
Thin Resistive Film Measurements
Split Post Dielectric Resonator Technique
Surface Resistance Measurements
Thin Cermet
Metal Film Deposition
Films
Surface Resistance
Resistance
Electrical Resistance Measurement
Dielectric Measurements
Dielectrics
Substrates
Dielectric Resonators
Thin Films
Engineering
Cermet Resistors
Surface Resistance
Thin Metal Films
