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A Nanowire Transistor for High Performance Logic and Terabit Non-Volatile Memory Devices

By: Hyunjin Lee; Seong-Wan Ryu; Yang-Kyu Choi; Hee Mok Lee; Jim Mo Yang; Jung Jae Yoo; Woo Ho Bae; Yun Chang Park; Jae Sub Oh; Gi Sung Lee; Kwang Hee Kim; Sang Cheol Jeon; Dong-il Bae; Ju-Hyun Kim; Kuk-Hwan Kim; Eujime Lee; Sungho Kim; Chimgjin Kim; Maesoon lm; Lee-Eim Yu; Jin-Woo Han;

2007 / IEEE / 978-4-900784-03-1

Description

This item was taken from the IEEE Conference ' A Nanowire Transistor for High Performance Logic and Terabit Non-Volatile Memory Devices ' A silicon nanowire-FET (SiNAWI-FET) for high performance logic device with consideration of current direction effects and terabit non-volatile memory (NVM) device using an 8nm SiNAWI-NVM with oxide/nitride/oxide (ONO) and omega-gate structure is reported for the first time. N- and P-channel SiNAWI-FET showed the highest driving current on (110)/j110k crystal orientation without device rotation, whereas most 3-dimensional NMOS report higher driving current on 45° device rotation rather than 0°. Utilizing an 7nm spherical nanowire on the 8nm SiNAWI-NVM with ONO structure, 1.7V VT-window was achieved from 12V/80¿sec program conditions with retention enhancement.