Use this resource - and many more! - in your textbook!
AcademicPub holds over eight million pieces of educational content for you to mix-and-match your way.

Mesurements of Thin Polymer Films Employing Split Post Dielectric Resonator Technique
By: Mazierska, J.; Derzakowski, K.; Krupka, J.; Jacob, M.;
2006 / IEEE / 978-83-906662-7-3
Description
This item was taken from the IEEE Conference ' Mesurements of Thin Polymer Films Employing Split Post Dielectric Resonator Technique ' Split post dielectric resonator (SPDR) operating at frequency about 10 GHz has been used for measurements of permittivity and dielectric loss tangent of thin polymer films deposited on a thin low loss polymer substrate. Uncertainty analysis and experiments have shown that it is possible to measure real permittivity and dielectric loss tangent of thin polymer films deposited on thin low loss dielectric substrates. Appropriate sensitivity of measurements can be achieved by stacking several substrates with deposited film together and thus creating multilayered dielectric structure.
Related Topics
Split Post Dielectric Resonator
Thin Polymer Films Mesurements
Spdr
Permittivity Measurements
Dielectric Substrates
Polymer Films
Dielectric Substrates
Dielectric Loss Measurement
Dielectric Measurements
Permittivity Measurement
Dielectric Thin Films
Frequency Measurement
Resonant Frequency
Dielectric Losses
Loss Measurement
Thin Polymer Films
Dielectric Properties
Multilayered Dielectric Structure
Dielectric Thin Films
Dielectric Resonators
Polymer Films
Engineering
Dielectric Loss Tangent