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Generation of raw stepped-frequency waveform echoes using RCS chamber measurements

By: Temple, M.A.; Hale, T.B.; Luminati, J.E.; Oxley, M.E.; Harvrilla, M.J.;

2005 / IEEE / 0-7803-8881-X

Description

This item was taken from the IEEE Conference ' Generation of raw stepped-frequency waveform echoes using RCS chamber measurements ' Complicated microwave scattering characteristics of non-point targets are often examined using radar cross section (RCS) chamber measurements. These measurements are designed to be waveform independent. Attempting to gather waveform dependent data on complex target responses typically requires a robust (and expensive) waveform generation and sampling capability beyond that of most RCS chambers. This paper introduces a technique to convert standard RCS chamber measurements into raw stepped-frequency waveform echoes. By controlling the construction and processing of these echoes, many waveformdependent target effects can be examined. After demonstrating the validity of the proposed technique using both 1-D range profiles and 2-D inverse synthetic aperture radar (ISAR) images, the paper examines the effects of linear frequency modulation (LFM) waveform filtering mismatches on an RCS chamber target.