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Measurement of dielectric permittivity tensor, main directions and optical axises in single-axis and bi-axis crystals

By: Zvyagintsev, A.A.; Chizhov, V.V.; Strizhachenko, A.V.;

2002 / IEEE / 966-7968-12-X

Description

This item was taken from the IEEE Conference ' Measurement of dielectric permittivity tensor, main directions and optical axises in single-axis and bi-axis crystals ' We have designed a method of measuring the permittivity tensor components, permittivity ellipsoid axes and optical axes of uniaxial crystals with tetragonal, hexagonal, trigonal symmetry, as well as biaxial crystals with rhombic symmetry.