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Reliability proving of 980 nm pump lasers for metro applications
By: Harder, C.S.; Mohrdiek, S.; Schmidt, B.; Pliska, T.; Matuschek, N.; Arlt, S.; Jakubowicz, A.; Jung, I.D.; Pfeiffer, H.-U.; Schwarz, M.;
2002 / IEEE / 0-7803-7598-X
This item was taken from the IEEE Conference ' Reliability proving of 980 nm pump lasers for metro applications ' Reliability testing of pump lasers is based on accelerated life tests with different stress conditions. These tests are well established and their underlying principle is the scaling of the device lifetime with different stress conditions. The stress conditions have to be chosen in such a way that the aging of the laser chip is accelerated but no additional aging effects compared to operating conditions are induced. If the scaling factor is known the device lifetime at operating conditions can be calculated.
980 Nm Pump Lasers
Accelerated Life Tests
Laser Chip Aging
Semiconductor Device Testing
Semiconductor Device Reliability
Optical Communication Equipment
Metropolitan Area Networks