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Surface impedance of thin high temperature superconducting films with a sapphire dielectric resonator

By: Baker-Jarvis, J.; Abramowicz, A.; Derzakowski, K.; Krupka, J.; Geyer, R.; Ono, R.;

2002 / IEEE / 83-906662-5-1

Description

This item was taken from the IEEE Conference ' Surface impedance of thin high temperature superconducting films with a sapphire dielectric resonator ' The dielectric resonator technique is frequently used for surface resistance measurements of superconducting films. Generally, an effective surface resistance has been measured which neglects the finite thickness of superconducting films. The thickness dependence of the surface impedance of superconducting films, whose thickness is comparable to the London penetration depth, is presented.