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Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor
By: Crain, W.R.; Miller, S.W.; La Lumondiere, S.D.; Crain, S.H.; Crawford, K.B.; Moss, S.C.; Koga, R.; Hansel, S.J.;
2000 / IEEE / 0-7803-6474-0
This item was taken from the IEEE Conference ' Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor ' It has been observed that the 68302 microprocessor, which is being flown on several space vehicles, has not shown signs of experiencing either single event latchup (SEL) or single event snapback (SES) as would have been predicted using ground-based test data. This study presents the comparison of the flight to ground data.
Single Event Upset
Kirk Field Collapse Effect
Single Event Snapback
Single Event Latchup
High Current State
Heavy Ion Irradiation
Space Vehicle Electronics
Ion Beam Effects