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Single event functional interrupt (SEFI) sensitivity in microcircuits
1997 / IEEE / 0-7803-4071-X
This item was taken from the IEEE Conference ' Single event functional interrupt (SEFI) sensitivity in microcircuits ' The single event functional interrupt (SEFI) sensitivity of several types of microcircuits is measured with heavy ions. While simple microcircuits have not been affected by SEFI, many complex microcircuits are vulnerable to it in varying degrees. Although there are many causes for SEFIs, ion irradiation testing in conjunction with an understanding of device architecture helps refine techniques which can be used to lessen the ill effects caused by SEFI.
Random Access Memory
Digital Signal Processing
Single Event Transient
Single Event Upset
Single Event Functional Interrupt Sensitivity
Ion Beam Effects
Integrated Circuit Testing
Heavy Ion Irradiation