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Electrical material properties from a free-space time-domain RF absorber reflectivity measurement system
By: Ondrejka, A.; Johnk, R.T.;
1997 / IEEE / 0-7803-4140-6
This item was taken from the IEEE Conference ' Electrical material properties from a free-space time-domain RF absorber reflectivity measurement system ' The scattering information obtained from the measurements of selected test structures is used to extract the relative permittivities of the various dielectric layers. Tests have been successfully conducted on single and multiple-layer dielectric panels, from which good estimates of material properties have been obtained. Results have been obtained in tests performed at both normal and oblique incidence. In addition, an edge-effect removal algorithm that significantly improves the estimated dielectric constant for small panels has recently been developed.
Field Strength Measurement
Dielectric Constant Estimation
Free-space Time-domain Rf Absorber Reflectivity Measurement System
Electrical Material Properties
Edge-effect Removal Algorithm
Time Domain Analysis
Electric Variables Measurement
Electromagnetic Wave Reflection