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Device SEE susceptibility from heavy ions (1995-1996)
By: Penzin, S.H.; Crawford, K.B.; Crain, W.R.; Koga, R.; Coss, J.R.; Swift, G.M.; Schwartz, H.R.; Miyahira, T.F.; Nichols, D.K.;
1997 / IEEE / 0-7803-4061-2
This item was taken from the IEEE Conference ' Device SEE susceptibility from heavy ions (1995-1996) ' A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs.
Ic Functional Classes
Test Data Set
Single Event Effects
Device See Susceptibility
Ion Beam Effects
Integrated Circuit Testing