Your Search Results

Use this resource - and many more! - in your textbook!

AcademicPub holds over eight million pieces of educational content for you to mix-and-match your way.

Experience the freedom of customizing your course pack with AcademicPub!
Not an educator but still interested in using this content? No problem! Visit our provider's page to contact the publisher and get permission directly.

Device SEE susceptibility from heavy ions (1995-1996)

By: Penzin, S.H.; Crawford, K.B.; Crain, W.R.; Koga, R.; Coss, J.R.; Swift, G.M.; Schwartz, H.R.; Miyahira, T.F.; Nichols, D.K.;

1997 / IEEE / 0-7803-4061-2

Description

This item was taken from the IEEE Conference ' Device SEE susceptibility from heavy ions (1995-1996) ' A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs.