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Device SEE susceptibility from heavy ions (1995-1996)

By: Penzin, S.H.; Crawford, K.B.; Crain, W.R.; Koga, R.; Coss, J.R.; Swift, G.M.; Schwartz, H.R.; Miyahira, T.F.; Nichols, D.K.;

1997 / IEEE / 0-7803-4061-2


This item was taken from the IEEE Conference ' Device SEE susceptibility from heavy ions (1995-1996) ' A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs.